No CrossRef data available.
Article contents
Catalytic Oxidation of Silicon Nitride thin films Using Potassium*
Published online by Cambridge University Press: 25 February 2011
Abstract
Thin silicon nitride films on a Si(100) substrate have been oxidized using potassium in a low thermal budget process. The presence of potassium on the SisN4 surface greatly lowers the temperature-time requirements for oxidation as compared with direct thermal oxidation.
- Type
- Research Article
- Information
- Copyright
- Copyright © Materials Research Society 1989
References
REFERENCES
1.
Soukiassian, P., Gentle, T. M., Balshi, M. H., and Hurych, Z., J. Appl. Phys.
60, 4339 (1986).Google Scholar
2.
Franciosi, A., Soukiassian, P., Philip, P., Chang, S., Wall, A., Raisanen, A., and Troullier, N., Phys. Rev. B35, 910 (1987).Google Scholar
3.
Asensio, M. C., Michel, E. G., Oellig, E. M., and Miranda, R., Appl. Phys. Lett.
51, 1714 (1987).Google Scholar
4.
Rogers, J. W., Jr., Blair, D. S., and Peden, C. H. F., AIP Monograph – Proceedings of the Topical Conference on Deposition and Growth, 34th National AVS Symposium, Nov. 2-6, 1987, Anaheim, CA.Google Scholar
5.
Peden, C. H. F., Rogers, J. W. Jr, Blair, D. S., and Nelson, G. C., in Chemical Perspectives of Microelectronic Materials, edited by Gross, M. E., Jasinski, J. M., and Yates, J. T. Jr (Materials Research Society, Pittsburgh, PA, 1989) this volume.Google Scholar
6.
Michel, E. G., Oellig, E. M., Arensio, M. C., and Miranda, R., Surf. Sci. 189/190, 245 (1987).Google Scholar