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Carbon Nitride Thin Films Grown by Pulsed Laser Deposition

Published online by Cambridge University Press:  22 February 2011

Randolph E. Treece
Affiliation:
National Research Council Postdoctoral Research Associate
James S. Horwitz
Affiliation:
Naval Research Laboratory, Surface Modification Branch (Code 6673), Washington, D. C. 20375-5345
Douglas B. Chrisey
Affiliation:
Naval Research Laboratory, Surface Modification Branch (Code 6673), Washington, D. C. 20375-5345
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Abstract

Thin films of diamond and diamond-like carbon (DLC) are technologically important materials that serve as hard, scratch resistant and chemically inert coatings for tools and optics. Recent calculations suggest that β-C3N4 should be harder than diamond. We have deposited carbon nitride (CNx) thin films by pulsed laser deposition. The films were grown from a graphite target in a nitrogen background. The nitrogen source was either (a) a N2 gas atmosphere, or (b) a N2+/N+ ion beam generated by a Kaufman ion gun. A wide range of deposition parameters were investigated, such as deposition pressure (0.3-900 mTorr N2), substrate temperature (50 and 600°C), and laser fluence (1-4 J/cm2) and laser repetition rate (1-10 Hz). The films have been characterized by Rutherford Backscattering Spectroscopy, thin-film X-ray diffraction, scanning electron microscopy, and micro-Raman spectroscopy. In general, the films were nitrogen deficient with a maximum nitrogen to carbon ratio (N/C) of 0.45 and a shift in the G band Raman peak consistent with amorphous CNx (a-CNx).

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

1. Liu, A.Y. and Cohen, M. L., Science 245, 841 (1989)Google Scholar
2. Liu, A.Y. and Cohen, M. L., Phys. Rev. B 41, 10727 (1990).Google Scholar
3. Han, H. and Feldman, B.J., Sol. State Comm. 65, 921 (1988).Google Scholar
4. Chen, M.Y., Lin, X., Dravid, V.P., Chung, Y.W., Wong, M.S., and Sproul, W.D., Surf. Coatings Technol. 54/55, 360 (1992).Google Scholar
5. Chen, M.Y., Li, D., Lin, X., Dravid, V.P., Chung, Y.W., Wong, M.S., and Sproul, W.D., J. Vac. Sci. Technol. A 11, 521 (1993).Google Scholar
6. Li, D., Chung, Y.W., Wong, M.S., and Sproul, W.D., J. Appl. Phys. 74, 219 (1993).Google Scholar
7. Ricci, M., Trinquecoste, M., and Delhaes, P., Surf. Coatings Technol. 47, 299 (1991).Google Scholar
8. Ricci, M., Trinquecoste, M., Auguste, F., Canet, R., Delhaes, P., Guimon, C, Pfister-Guillouzo, G., Nysten, B., and Issi, J.P., J. Mater. Res. 8, 480 (1993).Google Scholar
9. Kaufan, J.H., Metin, S., and Saperstein, D.D., Phys. Rev. B 39, 13053 (1989).Google Scholar
10. Xiong, F. and Chang, R.P.H., Mater. Res. Soc. Proc. 285, 587 (1993).Google Scholar
11. Niu, C., Lu, Y.Z., and Lieber, C.M., Science 261, 334 (1993).Google Scholar
12. Grabowski, K.S., Horwitz, J.S., and Chrisey, D.B., Ferroelectrics 116, 19 (1991); and, J.S. Horwitz, K.S. Grabowski, D.B. Chrisey, and R.E. Leuchtner, Appl. Phys. Lett. 59, 1565 (1991).Google Scholar
13. Oaks, D.B., Butler, J.E., Snail, K.A., Carrington, W.A., Hanssen, L.M., J. Appl. Phys. 69, 2602 (1991).Google Scholar
14. Smidt, F.A., Int. Mater. Rev. 35, 61 (1990); and E.P. Donovan, D. VanVechten, A.D.F. Kahn, C.A. Carosella, and G.K. Hubler, Appl. Opt. 55, 2940 (1989).Google Scholar
15. Huong, P.V., Mater. Sci. Eng. B 11, 235 (1992).Google Scholar