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Carbon nanofiber-based photonic crystals – fabrication, diffraction and ellipsometry investigations

Published online by Cambridge University Press:  17 March 2011

Robert Rehammar
Affiliation:
Department of Applied Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden
Roger Magnusson
Affiliation:
Department of Physics, Chemistry and Biology, Linköping University, SE-581 83 Linköping, Sweden
Andreas Lassesson
Affiliation:
Department of Physics, Göteborg University, SE-412 96 Gothenburg, Sweden
Hans Arwin
Affiliation:
Department of Physics, Chemistry and Biology, Linköping University, SE-581 83 Linköping, Sweden
Jari Kinaret
Affiliation:
Department of Applied Physics, Chalmers University of Technology, SE-412 96 Gothenburg, Sweden
Eleanor Campbell
Affiliation:
EaStCHEM, School of Chemistry, Edinburgh University, Edinburgh EH9 3JJ, UK Division of Quantum Phases and Devices, School of Physics, Konkuk University, Seoul 143-701, Korea
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Abstract

Carbon nanofibers were used as building blocks for two-dimensional photonic crystal slabs. Electron beam lithography and chemical vapor deposition were used to fabricate regular arrays and random patterns of nanofibers. The optical properties of the samples were investigated using a diffraction measurement setup, as well as reflection ellipsometry. We find that carbon nanofiber regularity has a strong effect on both diffractive and specular optical properties. This shows that ellipsometry can be a valuable tool to study properties of carbon nanofiber arrays. It also shows that carbon nanofibers provide an interesting candidate as building blocks for nanostructured optical components.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Veselago, V. G, Soviet Physics Uspekhi 10, 509514 (1968)Google Scholar
2. Shelby, R. A., Smith, D. R., Schultz, S., Science 292, 7779 (2001)10.1126/science.1058847Google Scholar
3. Kosaka, H.., et al. ., Phys. Rev. B 58, R10096, 1998 Google Scholar
4. Vlasov, Y. A. et al. ., Nature 438, 6569 (2005)Google Scholar
5. Rehammar, R.., Kinaret, J. M., Opt. Express 16, 2168221691 (2008)Google Scholar
6. Rybczynski, J.. et al. ., Appl. Phys. Lett. 88, 203122 (2006)Google Scholar
7. Paraire, N.. and Benachour, Y., Appl. Phys. B 89 245 (2007)Google Scholar
8. Ong, J. R., Alagappan, G.., Wu, P., and Sun, X. W., J. Opt. Soc. Am. A 26, 1256 (2009)Google Scholar
9. Humlicek, J., Polarized light and ellipsometry. Handbook of Ellipsometry ed Tompkins, H. G and Irene, E. A, Berlin Springer GmbH & Co. KG (2005)Google Scholar
10. Rehammar, R.. et al. ., Nanotechnology 21, 465203 (2010)Google Scholar