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Biaxial Zero Creep Measurements of Interface Energies in Ni/Ag Multilayers

Published online by Cambridge University Press:  10 February 2011

A. C. Lewis ,
A. B. Mann ,
D. Josell ,
J. Tapson  and
T. P. Weihs
A. C. Lewis
Affiliation:
The Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD, USA
A. B. Mann
Affiliation:
The Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD, USA
D. Josell
Affiliation:
National Institute of Standards and Technology, Metallurgy Division, Gaithersburg, MD, USA
J. Tapson
Affiliation:
University of Cape Town, Department of Electrical Engineering, Rondebosch, South Africa
T. P. Weihs
Affiliation:
The Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD, USA
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Abstract

Biaxial zero creep experiments were performed on Ni/Ag multilayer films on sapphire substrates. The equilibrium curvature was measured using a scanning laser and position sensitive photodetector. The experiments were designed to measure the free energy of Ni/Ag interfaces and to investigate their effect on the structural stability of multilayered materials. For the Ni/Ag multilayers studied, significant plastic straining occurs at temperatures above 400°C, enabling the growth stresses and thermal stresses in the multilayers to decay to zero. After a long time at elevated temperatures, the equilibrium curvature is reached for the film/substrate couple. This curvature is determined by the number and the energy of the Ni/Ag interfaces. Using this equilibrium technique, a free energy of 0.44 ± 0.03 N/m was measured for Ni/Ag interfaces at an equilibrium temperature of 550°C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 586: Symposium M – Interfacial Engineering for Optimized Properties II , 1999 , 249
Copyright
Copyright © Materials Research Society 2000

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References

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