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Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope

Published online by Cambridge University Press:  17 June 2011

Sergei Rouvimov ,
Peter Moeck ,
Ines Häusler ,
Wolfgang Neumann  and
Stavros Nicolopoulos
Sergei Rouvimov
Affiliation:
Department of Physics, Portland State University, Portland, OR 97207-0751, U.S.A. & Oregon Nanoscience and Microtechnologies Institute, www.onami.us Department of Chemistry, University of Oregon, Eugene, OR 97401-3753, U.S.A. & Oregon Nanoscience and Microtechnologies Institute
Peter Moeck
Affiliation:
Department of Physics, Portland State University, Portland, OR 97207-0751, U.S.A. & Oregon Nanoscience and Microtechnologies Institute, www.onami.us
Ines Häusler
Affiliation:
Institute of Physics, Humboldt University of Berlin, Newtonstreet 15, 12489 Berlin, Germany
Wolfgang Neumann
Affiliation:
Department of Chemistry, University of Oregon, Eugene, OR 97401-3753, U.S.A. & Oregon Nanoscience and Microtechnologies Institute Institute of Physics, Humboldt University of Berlin, Newtonstreet 15, 12489 Berlin, Germany
Stavros Nicolopoulos
Affiliation:
NanoMEGAS SPRL, Boulevard Edmond Machterns No 79, Saint Jean Molenbeek, Brussels, B-1080, Belgium, nanomegas.com
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Abstract

An automated technique for the mapping of nanocrystal phases and orientations in a transmission electron microscope (TEM) is briefly described. It is primarily based on the projected reciprocal lattice geometry that is extracted automatically from precession electron diffraction (PED) enhanced spot patterns. The required hardware allows for a scanning-precession movement of the primary electron beam on the crystalline sample and can be interfaced to any newer or older mid-voltage TEM. Comprehensive open-access crystallographic databases that may be used in support of this technique are mentioned.

Keywords

crystallinemicrostructuretransmission electron microscopy (TEM)
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1318: Symposium SS/TT/UU/VV – Advances in Spectroscopy and Imaging of Surfaces and Nanostructures , 2011 , mrsf10-1318-ss07-09
Copyright
Copyright © Materials Research Society 2011

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References

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