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Atomic-Resolution Electron Microscopy of TiB2 Precipitates in an Industrial TiAl Alloy

Published online by Cambridge University Press:  10 February 2011

B. J. Inkson ,
G. Möbus  and
M. Rühle
B. J. Inkson
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany.
G. Möbus
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany.
M. Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Seestrasse 92, D-70174 Stuttgart, Germany.
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Abstract

TiB2 nano-lamellae, grown in-situ within a TiAl intermetallic melt, have been examined by high resolution electron microscopy. The use of the Stuttgart ARM enables Ti and B columns to be distinguished in the HREM images. Examination of the internal structure of the T1B2 platelets reveals extensive prismatic faulting on {1010}TiB2, {0110}TiB2 and {1100}TiB2 planes. Externally, the TiB2 platelets exhibit an orientational relationship {1010}TiB2 // {001}B2 and [0001]TiB2 // <010>B2 with interleaving platelets of B2-phase, with the predominating interface planes being {1010}TiB2 // {001}B2. The minor facets of the TiB2 platelets are [0001]TiB2 // <010>B2. {0110}TiB2 and {1100}TiB2, with the latter two facets showing no relationship with the interleaving B2-phase. No preferred orientation relationship of the TiB2 with the surrounding γ-TiAl and α2-Ti3Al phases is observed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 466: Symposium G – Atomic Resolution Microscopy of Surfaces and Interfaces , 1996 , 151
Copyright
Copyright © Materials Research Society 1997

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References

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