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Atomic Structure of Gold and Copper Boundaries

Published online by Cambridge University Press:  10 February 2011

C.J.D. Hetherington
C.J.D. Hetherington*
Affiliation:
University of Sheffield, Department of Electronic and Electrical Engineering, Mappin Street, Sheffield, S1 3JD, UK
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Abstract

A very thin bicrystal film, prepared by depositing gold onto a {111} germanium substrate, then annealing and removing it, has been studied by HREM. The crystals grow predominantly in the orientations {111} and (111) which are related by a 60° rotation (Σ3 CSL) and bounded by {121} facets. In contrast to the boundaries studied in thicker films, these {112} facets extend through the depth of the film. Another crystal within the film also had a {111} orientation, but rotated by around 20° from the other crystals. A short length of boundary was found that was edge-on, symmetrical, facetted on (213) planes, and corresponding to Σ;7 (or Σ;21). A copper 1111 film did not show edge-on boundaries

The rigid body translation across the facets were measured and found to vary depending on the proximity to facet junctions. An expansion at the boundary was the general case

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 359
Copyright
Copyright © Materials Research Society 2001

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References

1.Dahmen, U., Douin, J., Hetherington, C.J.D. and Westmacott, K.H., Mat. Res. Soc. Symp. Proc. 139, pp. 87–96 (1989).Google Scholar
2.Westmacott, K.H., Hinderberger, S. and Dahmen, U., to be submitted (1999).Google Scholar
3.Hetherington, C.J.D., Dahmen, U. and Penisson, J-M., Mat. Res. Soc. Symp. Proc. 466, pp. 215–226 (1997)Google Scholar
4.Phillipp, F., Höschen, R., Osaki, M., Möbus, G. and Rühle, M., Ultramicrosc. 56, 1–10 (1994).Google Scholar
5.Medlin, D.L., private communication (1999).Google Scholar
6.Hÿtch, M.J., in Scanning Microscopy Supplement 10: Signal and Image Processing in Microscopy and Microanalysis, ed. Hawkes, P. (Scanning Microscopy Int., Chicago, 1996).Google Scholar
7.Dahmen, U. and Westamacott, K.H., Mat. Res. Soc. Symp. Proc. 229 pp. 167–172 (1991).Google Scholar
8.Medlin, D, priv. comm. (1999) and J-M Penisson priv. comm. (1999).Google Scholar
9.Ernst, F., Hofmann, D., Nadarzinski, K., Schmidt, C., Stemmer, S. and Streiffer, S.K., Mat. Sci. Forum Vols. 207–209, pp 23–34 (1996).Google Scholar