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Application of Z-Contrast Imaging to Obtain Column-by-Column Spectroscopic Analysis of Materials

Published online by Cambridge University Press:  15 February 2011

Nigel D. Browning  and
Stephen J. Pennycook
Nigel D. Browning
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030
Stephen J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030
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Abstract

Z-contrast imaging has been shown to be an effective method for obtaining a highresolution image from a scanning transmission electron microscope (STEM). The incoherent nature of the high-angle scattering makes image interpretation straightforward and intuitive with the resolution limited only by the 2.2 Å electron probe. The optimum experimental conditions for Z-contrast imaging also coincide with those used for analytical microscopy, enabling microanalysis to be performed with the same spatial resolution as the image. The detection limits afforded by a parallel detection system for electron energy loss spectroscopy (EELS) allows column-by-column core-loss spectroscopy to be performed using the Z-contrast image to position the electron probe. Preliminary results from the study of Yba2Cu3O7-δ illustrate the spatial resolution available with this technique and the potential applications for materials science.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 295: Symposium W – Atomic-Scale Imaging of Surfaces and Interfaces , 1992 , 279
Copyright
Copyright © Materials Research Society 1993

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