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The Application of Glancing Angle Exafs to Study the Structure of Platinum-Nickel Multilayers

Published online by Cambridge University Press:  25 February 2011

G.M. Lamble
Affiliation:
North Carolina State University, Box 8202, NC 27695-8202
S.M. Heald
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973
B.M. Clemens
Affiliation:
Dept. of Material Science and Engineering, Stanford University, Stanford, CA 94305-2205
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Abstract

Recent reports have correlated the mechanical properties of multilayers with a structural expansion of the constituents. Whether this expansion is an interface or bulk effect remains in dispute. We apply the technique of glancing angle EXAFS to obtain information about the local structure and multilayer composition and use these results to shed light on certain aspects of this controversy. The experiments were performed on platinum-nickel multilayers of varying bilayer thickness. Measurements were made by fluorescence detection of EXAFS beyond both the Pt LIII and the Ni K edges. Considerable interlayer mixing is evident, as is the presence of order within the interface. We additionally find that the bulk metallic character is retained within the layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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References

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