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Application of Advanced Microstructural and Microchemical Microscopy Techniques to Chalcopyrite Solar Cells.

Published online by Cambridge University Press:  01 February 2011

Changhui Lei ,
Chun-Ming Li ,
Angus Rockett ,
I. M. Robertson  and
W. Shafarman
Changhui Lei
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana IL 61801
Chun-Ming Li
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana IL 61801
Angus Rockett
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana IL 61801
I. M. Robertson
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana IL 61801
W. Shafarman
Affiliation:
Department of Materials Science and Engineering, University of Illinois, Urbana IL 61801
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Abstract

Analytical TEM techniques have been used to characterize the structure and chemistry of chalcopyrite solar cell devices produced by elemental evaporation using a bi-layer process at Ts=400°C and Ts=550°C. Dislocations, stacking faults, twins and voids exist in both materials but at a reduced density at the higher deposition temperature. The higher processing temperature also improved the density and structure of the grain boundaries and created a less rough surface. The CdS layer coats the surface conformally, although the roughness impacts the structure. CdS fills the grooves in the surface and infiltrates lower density grain boundaries to significant depths. The chemistry of the grain boundaries does not appear to be significantly impacted by the presence of the Cd and S.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 865: Symposium F – Thin-Film Compound Semiconductor Photovoltaics , 2005 , F4.3
Copyright
Copyright © Materials Research Society 2005

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