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Application of a Position Sensitive Atom Probe to the Analysis of the Chemistry and Morphology of Multi-Quantum Well Interfaces
Published online by Cambridge University Press: 21 February 2011
Abstract
A position sensitive detector has been added to the Oxford atom probe facility, allowing the microchemistry of field ion specimens to be analysed with excellent chemical specificity and a lateral and depth resolution of better than 0.5nm. This paper presents some recent results obtained with this equipment on the chemistry and morphology of interfaces in multi-quantum well samples, illustrating the power of the technique in obtaining very detailed information on microstructural features with dimensions less than 1nm.
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- Copyright © Materials Research Society 1989