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Anomalous X-Ray Scattering on Chalcogenide Glasses

Published online by Cambridge University Press:  12 February 2015

Shinya Hosokawa ,
Jens Stellhorn  and
Wolf-Christian Pilgrim
Shinya Hosokawa
Affiliation:
Department of Physics, Graduate School of Science and Technology, Kumamoto University, Kumamoto 860-8555, Japan Department of Chemistry, Physical Chemistry, Philipps University of Marburg, D-35032 Marburg, Germany
Jens Stellhorn
Affiliation:
Department of Chemistry, Physical Chemistry, Philipps University of Marburg, D-35032 Marburg, Germany
Wolf-Christian Pilgrim
Affiliation:
Department of Chemistry, Physical Chemistry, Philipps University of Marburg, D-35032 Marburg, Germany
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Abstract

In this article, we review our recent structural studies on chalcogenide glass systems, GexSe1-x and AsxSe1-x, using anomalous X-ray scattering (AXS) in combination with reverse Monte Carlo (RMC) modeling. We show to what extent the present AXS + RMC works are effective to solve the long lasting topics in these chalcogenide glasses, such as the validity of the 8-N bonding rule, the relation to the rigidity percolation theory, the validity of chemical order, and the origin of prepeak.

Keywords

x-ray diffraction (XRD)structuralamorphous
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1757: Symposium UU – Structure-Property Relations in Amorphous Solids , 2015 , mrsf14-1757-uu06-05
Copyright
Copyright © Materials Research Society 2015 

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References

REFERENCES

Mott, N. F., Philos. Mag. 19, 835 (1969).CrossRefGoogle Scholar
Mott, N. F. and Davis, E. A., “Electronic Processes in Non-Crystalline Materials” (Oxford University Press, Oxford, 1971).Google Scholar
Phillips, J. C., J. Non-Cryst. Solids 34, 153 (1979).CrossRefGoogle Scholar
Thorpe, M. F., J. Non-Cryst. Solids 57, 355 (1983).CrossRefGoogle Scholar
Georgiev, D. G., Boolchand, P., and Micoulaut, M., Phys. Rev. B 62, R9228 (2000).CrossRefGoogle Scholar
Petri, I., Salmon, P. S., and Fischer, H. E., Phys. Rev. Lett. 84, 2413 (2000).CrossRefGoogle Scholar
Cobb, M., Drabold, D. A., and Cappelletti, R. L., Phys. Rev. B 54, 12162 (1996).CrossRefGoogle Scholar
Hosokawa, S., Goldbach, A., Boll, M., and Hensel, F., Phys. Stut. Sol. (b) 215, 785 (1999).3.0.CO;2-P>CrossRefGoogle Scholar
Hosokawa, S., Oh, I., Sakurai, M., Pilgrim, W.-C., Boudet, N., Bérar, J.-F., and Kohara, S., Phys. Rev. B 84, 014201 (2011).CrossRefGoogle Scholar
Hosokawa, S., Koura, A., Bérar, J.-F., Pilgrim, W.-C., Kohara, S., and Shimojo, F., Europhys. Lett. 102, 66008 (2013).CrossRefGoogle Scholar
Hosokawa, S., Pilgrim, W.-C., Bérar, J.-F., and Boolchand, P., J. Non-Cryst. Solids, submitted.Google Scholar
Hosokawa, S. and Bérar, J.-F., AIP Conf. Proc. 879, 1743 (2007).CrossRefGoogle Scholar
Hosokawa, S., Wang, Y., Bérar, J.-F., Greif, J., Pilgrim, W.-C., and Murase, K., Z. Phys. Chem. 216, 1219 (2002).CrossRefGoogle Scholar
Wang, Y., Ohata, E., Hosokawa, S., Sakurai, M., and Matsubara, E., J. Non-Cryst. Solids 337, 54 (2004).CrossRefGoogle Scholar
Shatnawi, M. T. M., Farrow, C. L., Chen, P., Boolchand, P., Sarbaeva, A., Thorpe, M. F., and Billinge, S. J. L., Phys. Rev. B 77, 094134 (2008).CrossRefGoogle Scholar
Massobrio, C. and Pasquarello, A., Phys. Rev. B 77, 144207 (2008).CrossRefGoogle Scholar
Bauchy, M., Micoulaut, M., Boero, M., and Massobrio, C., Phys. Rev. Lett. 110, 165501 (2013).CrossRefGoogle Scholar