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Anomalous Hall Effect in Gd-implanted Wurtzite AlxGa1-xN High Electron Mobility Transistor Structures

Published online by Cambridge University Press:  01 February 2011

Fang-Yuh Lo ,
Alexander Melnikov ,
Dirk Reuter ,
Yvon Cordier  and
Andreas D. Wieck
Fang-Yuh Lo
Affiliation:
[email protected]@rub.de, National Dong Hwa University, Department of Physics, Hualien, Taiwan
Alexander Melnikov
Affiliation:
[email protected], Ruhr-Universität Bochum, Lehrstuhl für Angewandte Festkörperphysik, Bochum, Germany
Dirk Reuter
Affiliation:
[email protected], Ruhr-Universität Bochum, Lehrstuhl für Angewandte Festkörperphysik, Bochum, Germany
Yvon Cordier
Affiliation:
[email protected], CNRS-UPR10, Centre de Recherche sur l'Hétéro-Epitaxie et ses Applications, Valbonne, France
Andreas D. Wieck
Affiliation:
[email protected], Ruhr-Universität Bochum, Lehrstuhl für Angewandte Festkörperphysik, Bochum, Germany
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Abstract

AlxGa1- xN/GaN high electron mobility transistor (HEMT) structures grown by ammonia-source molecular beam epitaxy (MBE) are focused-ion-beam implanted with 300 keV Gd-ions at room temperature. The two-dimensional electron gas (2DEG) of these HEMT structures is located 27 nm underneath the sample surface. At 4.2 K, current-voltage characteristics across implanted rectangles show that the structures remain conducting up to a Gd-dose of 1×1012 cm-2. Anomalous Hall effect (AHE) is observed at T = 4.2 K for structures implanted with Gd, whose dose is 3×1011 cm-2. Measurements of AHE in the wide temperature range from 2.4 K to 300 K show that the magnetic ordering temperature of these structures is around 100 K. Therefore, these Gd-implanted HEMT structures containing the still conducting 2DEG, which is now embedded in a ferromagnetic semiconductor, open the possibility to polarize the electron spins.

Keywords

ferromagneticHall effectspintronic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1111: Symposium D – Rare-Earth Doping of Advanced Materials for Photonic Applications , 2008 , 1111-D03-03
Copyright
Copyright © Materials Research Society 2009

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