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Anisotropy of NH4Ap Crystal X-Ray Susceptibility for Bragg Reflection Near Ck Absorption Edge

Published online by Cambridge University Press:  10 February 2011

A. V. Okotrub ,
G. S. Belikova ,
T. N. Turskaya  and
L. N. Mazalov
A. V. Okotrub
Affiliation:
Institute of Inorganic Chemistry SB RAS, Novosibirsk, Russia, [email protected]
G. S. Belikova
Affiliation:
Institute of Crystallography RAS, Moscow, Russia
T. N. Turskaya
Affiliation:
Institute of Crystallography RAS, Moscow, Russia
L. N. Mazalov
Affiliation:
Institute of Inorganic Chemistry SB RAS, Novosibirsk, Russia
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Abstract

Bragg reflection (001) of high-quality crystal of ammonium acid phthalate (2d = 52.28 A˚) is investigated in the region of CK absorption edge. First order reflection for this crystal is forbidden. Due to anisotropic additions, it appears only near CK edge. Two-crystal optical scheme was used for the measurement of the crystal reflectivity. As shown, the change of crystal azimuth in X-ray spectrometer leads to ability to control the resolution. Rotation effects of X-ray beam polarization on 90° angle is considered for the forbidden reflection.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 524: Symposium V – Application of Synchrotron Radiation Techniques…IV , 1998 , 161
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1. Dmitrienko, V. E., Acta Cryst. A40, pp.89–95 (1984).Google Scholar
2. Dmitrienko, V. E., Acta. Cryst. A39, pp.29–35 (1983).Google Scholar
3. Borie, B., Acta Cryst. A37, pp.238–241 (1980).Google Scholar
4. Templeton, D. H., Templeton, L. K., Acta. Cryst. A41, pp. 133–142 (1985).Google Scholar
5. Blake, R. L., in Advances X-Ray Analysis, edited Henke, B. L., Newkirk, J. B., Mallett, G. R., 13, pp.352–360 (1970)Google Scholar
6. Barrus, D. M., Blake, R. L., Burek, A. J. et al., Phys.Rev. B 22, pp. 4022–4037 (1980).Google Scholar
7. Yumatov, V. D., Okotrub, A. V., Mazalov, L. N. et al, Zh. Strukt.Khimii 26, N4, pp. 59–64 (1985)Google Scholar
8. Okotrub, A. V., Yumatov, V. D., Mazalov, L. N. et al, Zh. Strukt.Khimii 29, N2, pp. 167–170 (1988)Google Scholar
9. Belikova, G. S., Turskaya, T. N., Kraeva, L. E., Patent USSR, No 1515787 (1989)Google Scholar
10. Okaya, Y., Pepinsky, R., Acta. Cryst. 10, pp. 324–328 (1957).Google Scholar
11. Smith, I. R. A., Acta Cryst. B 31, pp.2508–2509 (1975).Google Scholar
12. Templeton, D. H., Templeton, L. K., Acta. Cryst. A43, pp.573–574 (1987).Google Scholar