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Analysis of the Dimerized Sb/Si(001)-(2×l) Surface by X Ray Standing Waves

Published online by Cambridge University Press:  15 February 2011

P. F. Lyman
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208
Y. Qian
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
M. J. Bedzyk
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, Evanston, Illinois 60208 Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
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Abstract

X ray standing wave measurements were undertaken to study the bonding position of Sb adatoms on the Sb-saturated Si(001)−(2×1) surface. Using the (004) and (022) Bragg reflections, we find that the Sb atoms form dimers, and that the center of the Sb ad-dimers lies 1.64 Å above the bulk-like Si(004) surface atomic plane. This work describes the extraction of structural parameters for a dimerized surface from in-plane measurements. Our results are compared to two structural models consisting of dimers whose bonds are parallel to the surface plane and whose centers are either shifted or unshifted (parallel to the dimer bond direction) relative to the underlying substrate planes. We thus find two special cases consistent with our data: one with symmetric (unshifted) dimers having a dimer bond length of 2.81 Å, and the other with midpointshifted dimers, having a bond length of 2.88 Å and a lateral shift of 0.21 Å.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

[1] Richter, M., Woicik, J. C., Nogami, J., Pianetta, P., Miyano, K. E., Baski, A. A., Kendelewicz, T., Bouldin, C. E., Spicer, W. E., Quate, C. F., and Lindau, I., Phys. Rev. Lett. 65, 3417 (1990).Google Scholar
[2] Nogami, J., Baski, A. A., and Quate, C. F., Appl. Phys. Lett. 58, 475 (1991).Google Scholar
[3] Slijkerman, W. F. J., Zagwijn, P. M., van der Veen, J. F., Gravesteijn, D. J., and van de Walle, G. F. A., Surf. Sci. 262, 25 (1992).Google Scholar
[4] Grant, M. W., Lyman, P. F., Hoogenraad, J. H. and Seiberling, L. E., Surf. Sci. 279, L180 (1992); private communication.Google Scholar
[5] Rich, D. H., Miller, T., Franklin, G. E., and Chiang, T.-C., Phys. Rev. B 39, 1438 (1989).Google Scholar
[6] Rich, D. H., Leibsle, F. M., Samsavar, A., Hirschorn, E. S., Miller, T., and Chiang, T.-C., Phys. Rev. B 39, 12758 (1989).Google Scholar
[7] Tang, S. and Freeman, A. J., Phys. Rev. B 47, 1460 (1993); S. Tang and A. J. Freeman, Phys. Rev. B 48, 8068 (1993); private communnication.Google Scholar
[8] Urhberg, R. I., Bringans, R. D., Bachrach, R. Z., and Northrup, J. E., Phys. Rev. Lett. 56, 520 (1986).Google Scholar
[9] Bringans, R. D., Biegelsen, D. K., Northrup, J. E. and Swartz, L.-E., Jpn. J. Appl. Phys. 32, 1484 (1993).Google Scholar
[10] Wolkow, R. A., Phys. Rev. Lett. 68, 2636 (1992), and references therein.Google Scholar
[11] Lohmeier, M., van der Vegt, H. A., Silfhout, R. G. van, Vlieg, E., Thornton, J. M. C., Macdonald, J. E. and Scholte, P. M. L. O., Surf. Sci. 275, 190 (1992).Google Scholar
[12] Lyman, P.F., Qian, Y., and Bedzyk, M.J., Surf. Sci. Lett. (in press).Google Scholar
[13] Zegenhagen, J., Surf. Sci. Rep. 18, 199 (1993).Google Scholar
[14] Batterman, B. W. and Cole, H., Rev. Mod. Phys. 36, 681 (1964).Google Scholar
[15] Bedzyk, M. J. and Materlik, G., Phys. Rev. B 31,4110 (1985).Google Scholar
[16] 0. Alerhand, L., Joannopoulos, J. D., and Mele, E. J., Phys. Rev. B 39, 12622 (1989).Google Scholar
[17] Franklin, G. E., Fontes, E., Qian, Y., Bedzyk, M. J., Golovchenko, J. A., and Patel, J. R., Phys. Rev. B 50, 7483 (1994).Google Scholar