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Analysis of Superconducting Oxide by 7 MeV Alpha Particle Backscattering Analysis

Published online by Cambridge University Press:  21 February 2011

Hiroki Yonezawa
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319-11 (Japan)
Yoshikazu Hidaka
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319-11 (Japan)
Minoru Suzuki
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319-11 (Japan)
Toshio Shigematsu
Affiliation:
NTT Opto-electronics Laboratories, Tokai, Ibaraki, 319-11 (Japan)
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Abstract

High energy Ion backscattering analysis in combination with recently-developed resonance scattering analysis Is described, with a stress on precise and quantitative oxygen analysis and its successful application to the characterization and quality estimation of high Tc oxide superconductors. Particularly, the present status of high energy ion backscattering analysis, the review of analytical results for YBa2Cu3O7−x, the estimation of composition and crystalline quality of (La1−xSrx)2CuO4 by 7 MeV alpha particle backscattering analysis are described.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

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