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Analysis of Domain-Size Distributions in Epitaxial Growth Using Leed Angular Profiles

Published online by Cambridge University Press:  25 February 2011

D. Saloner  and
M. G. Lagally
D. Saloner
Affiliation:
Department of Metallurgical and Mineral Engineering and Materials Science Center, University of Wisconsin-Madison, WI 53706
M. G. Lagally
Affiliation:
Department of Metallurgical and Mineral Engineering and Materials Science Center, University of Wisconsin-Madison, WI 53706
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Abstract

Angular profiles of diffracted beams in surface-sensitive diffraction techniques can be used to establish the degree of order at the surface of crystals. Results are presented showing the sensitivity of such profiles to the growth mode of overlayer islands. A method is presented to incorporate the two-dimensional nature of the problem into the analysis and to extract finite-size effects from fundamental and superlattice beams.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 179
Copyright
Copyright © Materials Research Society 1985

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