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An in-situ TEM Nanoindenter System with 3-axis Inertial Positioner
Published online by Cambridge University Press: 10 February 2011
Abstract
To quantify the mechanical properties and deformation behaviour of sub-micron wires, an in-situ nanoindenter system is being developed for a TEM. The miniaturized displacement controlled nanoindenter fits inside a side entry specimen holder. For coarse positioning, a novel 3-axis inertial positioner has been developed. This positioner has a range of 5mm with a 300 nm resolution. The fine displacements are generated by means of a tube piezo and the force is measured using a fibre optic interferometer.
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- Copyright © Materials Research Society 2002
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