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An Analysis of Infrared Spectroscopic Geometries

Published online by Cambridge University Press:  10 February 2011

Gregory T. Merklin ,
Huihong Luo  and
Christopher E. D. Chidsey
Gregory T. Merklin
Affiliation:
Department of Chemistry, Stanford Univeristy, Stanford, CA 94305–5080
Huihong Luo
Affiliation:
Department of Chemistry, Stanford Univeristy, Stanford, CA 94305–5080
Christopher E. D. Chidsey
Affiliation:
Department of Chemistry, Stanford Univeristy, Stanford, CA 94305–5080
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Abstract

The influence of experimental geometry on the signal strength and signal-to-noise ratio of infrared spectrometry has been investigated. In general, it was found that the choice of optimum experimental geometry depended on the orientation of the vibrational mode being investigated. In particular, it has been calculated that internal reflection spectrometry is relatively insensitive to vibrational modes perpendicular to the surface relative to transmission spectroscopy at Brewster's angle, and this has been confirmed by experiment.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 477 , 1997 , 353
Copyright
Copyright © Materials Research Society 1997

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References

REFERENCES

[1] Chabal, Y. J., Vibrational Properties at Semiconductor Surfaces and Interfaces, in Semiconductor Interfaces: Formation and Properties, edited by LeLay, G., Derrien, J., and Boccara, N., volume 22 of Springer Proc., page 301, Springer-Verlag, 1987.CrossRefGoogle Scholar
[2] Chabal, Y., Surf. Sci. Rep. 8, 211 (1988).CrossRefGoogle Scholar
[3] Chabal, Y. J., Harris, A. L., Raghavachari, K., and Tully, J. C., Int. J. Mod. Phys. B 7, 1031 (1993).CrossRefGoogle Scholar
[4] Chabal, Y. J., Hines, M. A., and Feijóo, D., J. Vac. Sci. Tech. A 13, 1719 (1995).CrossRefGoogle Scholar
[5] Brunner, H., Mayer, U., and Hoffmann, H., Appl. Spectrosc. 51, 209 (1997).CrossRefGoogle Scholar