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Advanced TEM Characterization for Catalyst Nanoparticles Using Local Adaptive Threshold (LAT) Image Processing

Published online by Cambridge University Press:  31 January 2011

Petra Bele  and
Ulrich Stimming
Petra Bele
Affiliation:
[email protected], Technische Universität München TUM, Department of Physics E19, Garching, Germany
Ulrich Stimming
Affiliation:
[email protected], Technische Universität München TUM, Department of Physics E19, Garching, Germany
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Abstract

Metallic and non-metallic nanoparticles, usually supported on non-metallic substrates have attracted much interest concerning their application in the field of electrocatalysis. To characterize catalysts with respect to size, morphology, structure and composition (alloys or core-shell) of nanoparticles and their associated electrocatalytic activity, transmission electron microscopy (TEM) is the state of the art method. This investigation shows the advantages of advanced image processing using the local adaptive threshold (LAT) routine.

Keywords

transmission electron microscopy (TEM)catalyticcore/shell
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1184: Symposium GG – Electron Crystallography for Materials Research and Quantitive Characterization of Nanostructured Materials , 2009 , 1184-HH01-05
Copyright
Copyright © Materials Research Society 2009

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References

1. Reimer, L., “Transmission Electron Microscopy - Physics of Image Formation and Microanalysis” (Springer-Verlag, Germany, 1997).Google Scholar
2. Reetz, M. T., Maase, M., Schilling, T. and Tesche, B., J. Phys. Chem. B 104, 8779–8781 (2000).Google Scholar
3. Russ, J. C., “The Image Processing Handbook”, 2nd Edition, (CNR Press, Boca Raton, USA, 1995).Google Scholar
4. Bele, P., Jäger, F. and Stimming, U., Microscopy and Analysis, 21(6) EU, S5–S7 (2007).Google Scholar
5. Yano, H., Kataoka, M., Yamashita, H., Uchida, U. and Watanabe, M., Langmuir 23, 6438–6445 (2007).Google Scholar
6. Bele, P., Stimming, U., Yano, H., Uchida, H. and Watanabe, M., Imaging and Microscopy (2009, submitted).Google Scholar
7. Trasatti, S. and Petrii, O. A., Pure & Appl. Chem. 63, 711 (1991).Google Scholar
8. Lamy-Pitara, E. and Barbier, J., Appl. Catal. A 149, 49, (1997).Google Scholar