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AC Losses in High-TC Superconductors with Finite Thickness

Published online by Cambridge University Press:  01 February 2011

Maamar Benkraouda  and
M. Mustafa
Maamar Benkraouda
Affiliation:
Physics Department, U.A.E. University P.O. Box: 17551 Al-Ain, United Arab Emirates
M. Mustafa
Affiliation:
Physics Department, U.A.E. University P.O. Box: 17551 Al-Ain, United Arab Emirates
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Abstract

The structure and dynamics of magnetic vortices in high-Tc superconductors are studied. The model we use is applicable to highly anisotropic high-Tc superconductors, such as Bi and Th compounds, where the Josephson coupling is neglected between the superconducting layers. In this paper, we studied the ac losses occurring in a finite number of superconducting layers due to an applied ac current. It is found that the ac losses increase with the frequency and the amplitude of the applied current. By introducing random pinning centers in the layers, the effect of pinning on the reduction of ac losses is also studied.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 868: Symposium C – Recent Advances in Superconductivity - Materials Synthesis, Multiscale Characterization and Functionally Layered Composite Conductors , 2005 , C8.13
Copyright
Copyright © Materials Research Society 2005

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References

[1] John, R. Clem, Phys. Rev. B 43, pp 7837, 1991.Google Scholar
[2] Angst, M., Karpinski, J., Kazakov, S., Schwer, H., Puzniak, R., Wisniewski, A., and Willemin, M., Physica C 341-348, pp 1137, 2000.Google Scholar
[3] Pautrat, A., Goupil, C., Simon, C., Lutke-Entrup, N., Placais, B., Mathieu, P., Simon, Y., Rykov, A., and Tajima, S., Phys. Rev. B 63, pp 054503, 2001.Google Scholar
[4] Drost, R. J., Kes, P. H., Beek, C. J. van der, and Konczykowski, M., Physica C 341-348, pp 1167, 2000.Google Scholar
[5] Reichhardt, C., Olson, C. J., and Gronbech-Jensen, N., Physica C 341-348, pp 1081, 2000.Google Scholar
[6] Fuke, H., Yoshino, H., Yamazaki, M., Thanh, T. D., Nakamura, S., Ando, K., Kobayashi, Y., Appl. Phys. Lett. 60 (21), pp 2686, 1992.Google Scholar
[7] Agassi, D., and Cullen, J. R., Physica C 195, pp 277, 1992.Google Scholar
[8] Nakamura, N., Gu, G. D., Takamuku, K., Muarkami, M., and Koshizuka, N., Appl. Phys. Lett. 61 (25), pp 3044, 1992.Google Scholar
[9] Pe, T., Benkraouda, M., and Clem, J. R., Phys. Rev. B 56 (13), 8289 (1997).Google Scholar
[10] Pe, T., Benkraouda, M., Clem, J. R., Phys. Rev. B 55 (10), 6636 (1997).Google Scholar