Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-25T18:30:33.121Z Has data issue: false hasContentIssue false

1.54 μm Electroluminescence from Erbium Doped Gallium Phosphide Diodes

Published online by Cambridge University Press:  10 February 2011

G. M. Ford
Affiliation:
Department of Materials Science and Engineering and the Materials Research Center, Northwestern University, Evanston, Illinois 60208
B. W. Wessels
Affiliation:
Department of Materials Science and Engineering and the Materials Research Center, Northwestern University, Evanston, Illinois 60208
Get access

Abstract

Er-doped GaP diodes that exhibit strong room temperature characteristic 4f-shell luminescence under forward bias have been fabricated. The output of the diode increases linearly with current for low current densities but eventually saturates. The radiative decay lifetime is 2.6 msec and is independent of current. It is proposed that the observed intensity dependence on excitation power results from saturation of the optically active Er3+ centers. Some diodes showed a superlinear dependence, with a threshold of about 2 A/cm2.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Whitney, P., Uwai, K., Nakagome, H., and Takahei, K., IEEE Trans. Elect. Dev. 35, 2454 (1988).Google Scholar
2 Isshiki, H., Kobayashi, H., Yugo, S., Kimura, T., and Ikoma, T., Jpn. J. Appl. Phys. 30, L225 (1991).Google Scholar
3 Franzo, G., Priolo, F., Coffa, S., Polman, A., and Camera, A., Appl. Phys. Lett. 64, 2235 (1994).Google Scholar
4 Wang, X. Z. and Wessels, B. W., Appl. Phys. Lett. 65, 584 (1994).Google Scholar
5 Ford, G. M. and Wessels, B. W., Appl. Phys. Lett. 68, 1126 (1996).Google Scholar
6 Langer, M., J. Luminescence 40&41, 589 (1988).Google Scholar
7 Takahei, K. and Taguchi, A., Mat. Science Forum, 83–87, 641 (1992)Google Scholar
8 Zheng, B., Michel, J., Ren, F. Y. G., Kimerling, L. C., Jacobson, D. C., and Poate, J. M., Appl.Phys. Lett. 64, 28422844 (1994).Google Scholar
9 Serna, R., Shin, J. H., Lohmeier, M., Vlieg, E., Polman, A., and Alkemade, P. F. A., J. Appl.Phys. 79, 2658 (1996).Google Scholar
10 Klein, P. B. and Pomrenke, G. S., Elec. Lett. 24, 15021503 (1988).Google Scholar