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Ab-Initio Molecular Dynamics Approach to the Study of Grain Boundaries in Semiconductors
Published online by Cambridge University Press: 28 February 2011
Abstract
Using an ab-initio molecular dynamics approach based on the Car-Parrinello method, the detailed atomic and electronic structure of a high-angle grain boundary in germanium is determined by investigating its energy-translation surface. Information concerning the coordination of the lowest energy configuration, its translation state, volume change, structure factor and local density of states is obtained.
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- Research Article
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- Copyright © Materials Research Society 1989
References
1. See papers in “Structure and Properties of Grain Boundaries”, ed. by Hagege, S. and Nouet, G., J. de Physique
43, Colloque C-6 (1982).Google Scholar
2. See papers in “Structure and Properties of Internal Interfaces”, ed. by Ruhle, M., Balluffi, R. W., H. Fischmeister and S. L. Sass, J. de Physique
46, C–4 (1985).Google Scholar
3. See papers in “Grain Boundary Structure and Related Phenomena”, ed. by Ishida, Y., Supple. to Trans.Japan Inst. of Metals
27 (1986).Google Scholar
4. See papers in “Grain Boundaries in Semiconductors”, ed. by Leamy, H. J., Pike, G. E. and Seager, C. H.. MRS Symposium Proceedings, Vol. 5 (1982).Google Scholar
9.
Payne, M. C., Joannopoulos, J. D., Allen, D. C., Teter, M. P. and Vanderbilt, D. H., Phys. Rev. Lett.
56, 2656 (1986).Google Scholar
12.
Payne, M. C., Bristowe, P. D. and Joannopoulos, J. D., Phys. Rev. Lett.
58, 1348 (1987).Google Scholar
13.
Tarnow, E., Bristowe, P. D., Joannopoulos, J. D. and Payne, M. C., J. Phys. C. to be published.Google Scholar
14.
Hohl, D., Jones, R. O., Car, R. and Parrinello, M., Chem. Phys. Lett.
139, 540 (1987).Google Scholar
16.
Needels, M., Payne, M. C. and Joannopoulos, J. D., Phys. Rev. Lett.
58, 1765 (1987).Google Scholar
17.
Needels, M., Payne, M. C., and Joannopoulos, J. D., Phys. Rev. B, 38, 5543 (1988).Google Scholar
18.
Car, R. and Parrinello, M., Proc. 18th ICPS, Stockholm, ed. by Engstrom, O. (World Scientific) Vol. 2, 1165 (1986).Google Scholar
20.
Bacmann, J. J., Silvestre, G., Petit, M. and Bollmann, W., Phil. Nag.
A43, 189 (1981).Google Scholar
23.
Bollmamnn, W., “Crystal Defects and Crystalline Interfaces”, Springer-Verlag, Berlin, 1970.Google Scholar
24.
Taylor, M. S., Majid, I., Bristowe, P. D. and Balluffi, R. W., Phys. Rev. B, to be published.Google Scholar
25.
Payne, M. C., Bristowe, P. D. and Joannopoulos, J. D., MRS Proc., Vol. 77 (1987). p. 205.CrossRefGoogle Scholar