Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-19T04:24:58.187Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration-corrected HRTEM of the Incommensurate Misfit Layer Compound (PbS)1.14NbS2

Published online by Cambridge University Press:  01 February 2011

Magnus Garbrecht ,
Erdmann Spiecker ,
Wolfgang Jäger  and
Karsten Tillmann
Magnus Garbrecht
Affiliation:
[email protected], Institut für Materialwissenschaft, Mikrostrukturanalytik, Kaiserstrasse 2, Kiel, 24143, Germany, ++49 431 880 6182, +49 431 880 6178
Erdmann Spiecker
Affiliation:
[email protected], Institut für Materialwissenschaft, Mikrostrukturanalytik, Kaiserstrasse 2, Kiel, 24143, Germany
Wolfgang Jäger
Affiliation:
[email protected], Institut für Materialwissenschaft, Mikrostrukturanalytik, Kaiserstrasse 2, Kiel, 24143, Germany
Karsten Tillmann
Affiliation:
[email protected], Ernst Ruska-Centrum und Institut für Festkörperforschung, Helmholtz-Zentrum Jülich GmbH, Jülich, 52425, Germany
Get access

Abstract

The development of tunable spherical aberration (Cs) imaging correctors for medium-voltage transmission electron microscopes (TEM) offers new opportunities for atomic-scale in-vestigations of materials. A very interesting class of microstructures regarding a variety of dif-ferent physical properties are the transition metal dichalcogenide misfit layer compounds exhibit-ing a high density of incommensurate interfaces due to their stacked nature. In the present study, the benefits coming along with the set-up of negative CS imaging (NCSI) conditions (in TEM) are demonstrated by means of different examples regarding local inhomogeneities in (PbS)1.14NbS2 crystals that can not be dissected in such detail by averaging x-ray techniques.

Keywords

transmission electron microscopy (TEM)layeredstructural
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1026: Symposium C – Quantitative Electron Microscopy for Materials Science , 2007 , 1026-C10-01
Copyright
Copyright © Materials Research Society 2008

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Dong, Z.F., Peng, L.-M., Duan, X.F., Dong, X.L., Zhao, B.R., Zhao, Z.X., Yuan, J., and Wang, R., Phys. Rev. B 59, 3489 (1999).10.1103/PhysRevB.59.3489Google Scholar
2. Schuster, R., Robinson, I.K., Kuhnke, K., Ferrer, S., Alvarez, J., and Kern, K., Phys. Rev. B 54, 17097 (1996).10.1103/PhysRevB.54.17097Google Scholar
3. Hirano, M., Shinjo, K., Kaneko, R., and Murata, Y., Phys. Rev. Lett. 78, 1448 (1997).Google Scholar
4. Wiegers, G.A. and Meerschaut, A., Mat. Sci. For. 100–101, 101–172 (1992).Google Scholar
5. Jobst, A. and Smaalen, S. van, Acta Cryst. B 58, 179 (2002).10.1107/S0108768101019280Google Scholar
6. Kuypers, S. and Landuyt, J. Van, Mat. Sci. For. 100–101, 223–272 (1992).Google Scholar
7. Jia, C. L., Lentzen, M., Urban, K., Microsc. and Microanal. 299, 174 (2004).10.1017/S1431927604040425Google Scholar
8. Brandt, J., Kanzow, J., Roßnagel, K., Kipp, L., Skibowski, M., Krasovskii, E.E., Schattke, W., Traving, M., Stettner, J., Press, W., Dieker, C., and Jäger, W., J. Electron Spectroscopy 114, 555 (2001).10.1016/S0368-2048(00)00343-1Google Scholar
9. Stadelmann, P., Ultramicroscopy 21, 131 (1987).10.1016/0304-3991(87)90080-5Google Scholar
10. Wiegers, G.A., Meetsma, A., Haange, R.J., Smaalen, S. Van, and Boer, J.L. De, Acta Crystal-lograph. B 46, 324 (1990).Google Scholar
11. Coene, W.M.J., Janssen, G., Beek, M. Op de, and Dyck, D. Van, Phys. Rev. Lett. 69, 3743 (1992).10.1103/PhysRevLett.69.3743Google Scholar
12. Coene, W.M.J., Thust, A., and Beek, M. Op de, Ultramicrosc. 64, 109 (1996).10.1016/0304-3991(96)00010-1Google Scholar
13. Thust, A., Coene, W.M.J., Beeck, M. Op de, and Dyck, D. Van, Ultramicroscopy 64(1-4), 211–30 (1996).Google Scholar
14. Kirkland, A.I., Saxton, W.O., Chau, K.L., Tsuno, K., and Kawasaki, M., Ultramicrosc. 57, 355 (1995).10.1016/0304-3991(94)00191-OGoogle Scholar
15. Kirkland, I., Saxton, W.O., and Chand, G., J. Electron Microsc. 1, 11 (1997).10.1093/oxfordjournals.jmicro.a023486Google Scholar
16. Spiecker, E., Garbrecht, M., Dieker, C., Dahmen, U., and Jäger, W., Microsc. and Micoranal. 13 (Suppl. 3), 424 (2007).Google Scholar