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Aberration-corrected HRTEM of the Incommensurate Misfit Layer Compound (PbS)1.14NbS2

Published online by Cambridge University Press:  01 February 2011

Magnus Garbrecht ,
Erdmann Spiecker ,
Wolfgang Jäger  and
Karsten Tillmann
Magnus Garbrecht
Affiliation:
[email protected], Institut für Materialwissenschaft, Mikrostrukturanalytik, Kaiserstrasse 2, Kiel, 24143, Germany, ++49 431 880 6182, +49 431 880 6178
Erdmann Spiecker
Affiliation:
[email protected], Institut für Materialwissenschaft, Mikrostrukturanalytik, Kaiserstrasse 2, Kiel, 24143, Germany
Wolfgang Jäger
Affiliation:
[email protected], Institut für Materialwissenschaft, Mikrostrukturanalytik, Kaiserstrasse 2, Kiel, 24143, Germany
Karsten Tillmann
Affiliation:
[email protected], Ernst Ruska-Centrum und Institut für Festkörperforschung, Helmholtz-Zentrum Jülich GmbH, Jülich, 52425, Germany
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Abstract

The development of tunable spherical aberration (Cs) imaging correctors for medium-voltage transmission electron microscopes (TEM) offers new opportunities for atomic-scale in-vestigations of materials. A very interesting class of microstructures regarding a variety of dif-ferent physical properties are the transition metal dichalcogenide misfit layer compounds exhibit-ing a high density of incommensurate interfaces due to their stacked nature. In the present study, the benefits coming along with the set-up of negative CS imaging (NCSI) conditions (in TEM) are demonstrated by means of different examples regarding local inhomogeneities in (PbS)1.14NbS2 crystals that can not be dissected in such detail by averaging x-ray techniques.

Keywords

transmission electron microscopy (TEM)layeredstructural
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1026: Symposium C – Quantitative Electron Microscopy for Materials Science , 2007 , 1026-C10-01
Copyright
Copyright © Materials Research Society 2008

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