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785 nm Raman Spectroscopy of CVD Diamond Films

Published online by Cambridge University Press:  01 February 2011

Paul William May ,
James A Smith  and
Keith N Rosser
Paul William May
Affiliation:
[email protected], University of Bristol, School of Chemistry, Cantock's Close, Bristol, BS8 1TS, United Kingdom, +44 (0)117 9289927, +44 (0)117 9251295
James A Smith
Affiliation:
[email protected], University of Bristol, School of Chemistry, Cantock's Close, Bristol, BS8 1TS, United Kingdom
Keith N Rosser
Affiliation:
[email protected], University of Bristol, School of Chemistry, Cantock's Close, Bristol, BS8 1TS, United Kingdom
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Abstract

Raman spectroscopy is a powerful technique often used to study CVD diamond films, however, very little work has been reported for the Raman study of CVD diamond films using near infrared (785 nm) excitation. Here, we report that when using 785 nm excitation, the Raman spectra from thin polycrystalline diamond films exhibit a multitude of peaks (over 30) ranging from 400-3000 cm−1. These features are too sharp to be photoluminescence, and are a function of film thickness. For films >30 μm thick, freestanding films, and for films grown in diamond substrates the Raman peaks disappear, suggesting that the laser is probing the disordered small-grained interface between the diamond and substrate. Some of the peaks change in relative intensity with time (‘blinking’), and the spectra are very sensitive to position on the substrate – this is reminiscent of the behaviour seen in SERS spectra.

Keywords

diamondRaman spectroscopynanostructure
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1039: Symposium P – Diamond Electronics–Fundamentals to Applications II , 2007 , 1039-P15-02
Copyright
Copyright © Materials Research Society 2008

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