Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Rendakova, S.
Kuznetsov, N.
Savkina, N.
Rastegaeva, M.
Andreev, A.
Minbaeva, M.
Morozov, A.
and
Dmitriev, V.
1998.
Silicon Carbide Epitaxial Layers Grown ON SiC Wafers With Reduced Micropipe Density.
MRS Proceedings,
Vol. 512,
Issue. ,
Rottner, K
Frischholz, M
Myrtveit, T
Mou, D
Nordgren, K
Henry, A
Hallin, C
Gustafsson, U
and
Schöner, A
1999.
SiC power devices for high voltage applications.
Materials Science and Engineering: B,
Vol. 61-62,
Issue. ,
p.
330.
Huang, Alex Q.
and
Zhang, Bo
2000.
Comparing SiC switching power devices: MOSFET, NPN transistor and GTO thyristor.
Solid-State Electronics,
Vol. 44,
Issue. 2,
p.
325.
Pearton, S.J.
Ren, F.
Zhang, A.P.
and
Lee, K.P.
2000.
Fabrication and performance of GaN electronic devices.
Materials Science and Engineering: R: Reports,
Vol. 30,
Issue. 3-6,
p.
55.
Huang, A.Q.
and
Bo Zhang
2001.
The future of bipolar power transistors.
IEEE Transactions on Electron Devices,
Vol. 48,
Issue. 11,
p.
2535.
Mehandru, R.
Kim, S.
Kim, J.
Ren, F.
Lothian, J.R.
Pearton, S.J.
Park, S.S.
and
Park, Y.J.
2003.
Thermal simulations of high power, bulk GaN rectifiers.
Solid-State Electronics,
Vol. 47,
Issue. 6,
p.
1037.
Baliga, B. Jayant
2008.
Fundamentals of Power Semiconductor Devices.
p.
276.
Baliga, B. Jayant
2019.
Fundamentals of Power Semiconductor Devices.
p.
283.
Baliga, B. Jayant
2023.
Springer Handbook of Semiconductor Devices.
p.
491.
Luo, Lan
Zhong, Yu
Cheong, Kuan Yew
Zhang, Rui
Wang, Tianlu
Yuan, Dengwen
Linewih, Handoko
Li, Shuqiang
Cui, Yingxin
Xu, Mingsheng
Xu, Xiangang
and
Han, Jisheng
2025.
The Principles and Applications of Electrical Characterization Techniques for Electrically Active Defects in 4H‐SiC Devices.
physica status solidi (a),