Hostname: page-component-78c5997874-s2hrs Total loading time: 0 Render date: 2024-11-20T02:43:32.042Z Has data issue: false hasContentIssue false

2.2 eV Luminescence in GaN

Published online by Cambridge University Press:  21 February 2011

D. M. Hofinann
Affiliation:
Physik Department E 16, Technische Universität München, D-85747 Garching, Germany
D. Kovalev
Affiliation:
Physik Department E 16, Technische Universität München, D-85747 Garching, Germany
G. Steude
Affiliation:
Physik Department E 16, Technische Universität München, D-85747 Garching, Germany
D. Volm
Affiliation:
Physik Department E 16, Technische Universität München, D-85747 Garching, Germany
B. K. Meyer
Affiliation:
Physik Department E 16, Technische Universität München, D-85747 Garching, Germany
C. Xavier
Affiliation:
Departimento de Fisica, Universidade de Aveiro, Portugal
T. Monteiro
Affiliation:
Departimento de Fisica, Universidade de Aveiro, Portugal
E. Pereira
Affiliation:
Departimento de Fisica, Universidade de Aveiro, Portugal
E. N. Mokov
Affiliation:
Ioffe Physico-Technical Insitute, St. Petersburg, Russia
H. Amano
Affiliation:
Department of Electrical and Electronic Engineering, Meiji University, 1-501Shiogamaguchi, Tempaku-ku, Nagoya 468, Japan
I. Akasaki
Affiliation:
Department of Electrical and Electronic Engineering, Meiji University, 1-501Shiogamaguchi, Tempaku-ku, Nagoya 468, Japan
Get access

Abstract

The yellow Luminescence in GaN centered at 2.2 eV has been studied in various epitaxial layers grown by MOVPE on sapphire and by the sandwich sublimation methode on 6H-SiC substrates. The photoluminescence and optically detected magnetic resonance results can be consistently explained by a recombination model involving shallow donors and deep donors.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Ogino, T. and Aoki, M., Jpn. J. Appl. Phys. 19, 2395 (1980)Google Scholar
2 Thomas, D. G., Hopfield, J.J., Augustyniak, W. M., Phys. Rev. 140, A202 (1965)Google Scholar
3 Glaser, E. R., Kennedy, T. A., Doverspike, K., Rowland, L. B., Gaskill, D. K., Freitas, J. A. jr., Asif Khan, M., Olson, D. T., Kuznia, J. N., and Wickenden, D. K., Phys. Rev. B 51, 13326 (1995).Google Scholar
4 Hofmann, D. M., Kovalev, D., Sreude, G., Meyer, B. K., Hoffmann, A. Eckey, L., Phys. Rev. B, in pressGoogle Scholar
5 Carlos, W. E., Freitas, J. A., Asif Kahn, M., Olson, D. T., and Kuznia, , Phys. Rev. B48, 17878 (1993)Google Scholar
6 Pake, G. E. and Estle, T. L., The Physical Principles of Electron Paramagnetic Resonance (Benjamin, Reading, MA, 1973)Google Scholar
7 Davies, J. J., J. Crystal Growth 72, 317 (1985)Google Scholar
8 Weber, E.R., Ennen, H., Kaufmann, U., Windscheif, J., Schneider, J. and Wosinski, T., J. Appl. Phys. 53, 6140 (1982)Google Scholar