Hostname: page-component-cd9895bd7-hc48f Total loading time: 0 Render date: 2024-12-27T01:35:18.508Z Has data issue: false hasContentIssue false

1.54μm luminescence of β-FeSi2 grown on Au-coated Si substrates

Published online by Cambridge University Press:  16 January 2012

Kensuke Akiyama
Affiliation:
Kanagawa Industrial Technology Center, 705-1 Shimoimaizumi, Ebina-shi, Kanagawa 243-0435, Japan
Hiroshi Funakubo
Affiliation:
Department of Innovative and Engineered Materials, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, Japan
Masaru Itakura
Affiliation:
Department of Applied Science for Electronics and Materials, Kyushu University, 6-1 Kasuga, Fukuoka 816-8580, Japan
Get access

Abstract

A clear PL spectrum was observed from β-FeSi2 grains on gold (Au)-coated (100)Si substrates, and indicated the formation of crystal with the same high quality level as the β-FeSi2 on a copper (Cu)-coated Si substrate. Moreover, the temperature dependence of photoluminescence peak intensities showed lower density of the nonradiative recombination center in β-FeSi2 grains on Au-coated Si substrates than that of β-FeSi2 film on Cu-coated Si. Au was not detected in β-FeSi2 grains by STEM-EDX observation, while Cu was observed in the grains and grain boundaries of β-FeSi2 and rolled as non-radiative recombination center.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Borisenko, V. ed., Semiconducting Silicides (Springer-Verlag, Berlin, 2000).Google Scholar
2. Ojima, K., Yamatsugu, H., Wen, C., Sudoh, M. and Yamada, K., Thin Solid Films 381, 267 (2001).Google Scholar
3. Suemasu, T., Takakura, K., Li, C., Ozawa, Y., Kumagai, Y. and Hasegawa, F., Thin Solid Films, 461, 209 (2004).Google Scholar
4. Hunt, T. D., Reeson, K. J., Homewood, K. P., Teon, S. W., Gwilliam, R. M. and Sealy, B. J., Nucl. Instrum. Met. Phys. Res. B 84, 168 (1994).Google Scholar
5. Katsumata, H., Makita, Y., Kobayashi, N., Shibata, H., Hasegawa, M., Akenov, I., Kimura, S., Obara, A. and Uekusa, S., J. Appl. Phys. 80, 5995 (1996).Google Scholar
6. Maeda, Y., Terai, Y. and Itakura, M., Optical Materials 27, 920 (2004).Google Scholar
7. Akiyama, K., Kaneko, S., Terai, Y., Maeda, Y. and Funakubo, H., Jpn. J. Appl. Phys. 44, L303 (2005).Google Scholar
8. Maeda, Y., Terai, Y. and Itakura, M., Jpn. J. Appl. Phys. 44, 2502 (2004).Google Scholar
9. Akiyama, K., Kaneko, S., Funakubo, H. and Itakura, M., Appl. Phys. Lett. 91, 071903 (2007).Google Scholar
10. Akiyama, K., Itakura, M., Kaneko, S., Funakubo, H. and Maeda, Y., Thin Solid Films 515, 8144 (2007).Google Scholar
11. Hansen, M. and Anderko, K., Constitution of Binary Alloys, second ed. (McGraw-Hill, New York, 1985).Google Scholar
12. Hunt, T. D., Reeson, K. J., Gwilliam, R. M., Homewood, K. P., Wilson, R. J. and Sealy, B. J., J. Lumin. 57, 25 (1993).Google Scholar
13. Martinelli, L., Grilli, E., Migas, D. B., Miglio, L., Marabelli, F., Soci, C., Geddo, M., Grimaldi, M. G. and Spinella, C., Phys. Rev. B 66, 085320 (2002).Google Scholar
14. Maeda, Y., Terai, Y., Itakura, M. and Kuwano, N., Thin Solid Films 461, 160 (2004).Google Scholar
15. Pankove, J. I., Optical Process in Semiconductor (Prentice-Hall, Englewood Cliffs, NJ, 1971).Google Scholar
16. Maeda, Y. and Terai, Y., Extended Abstracts of The 52nd Spring Meet. Jpn. Soc. Appl. Phys. Related Soc., 31p-YC-10 (2005).Google Scholar