Wavelength Multiplexing of Microsphere Resonators Used to Characterize Nanolayers

Steven Trohalaki

doi:10.1557/mrs2005.83

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Wavelength Multiplexing of Microsphere Resonators Used to Characterize Nanolayers

Published online by Cambridge University Press: 31 January 2011

Steven Trohalaki

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Type: Research/Researchers
Information: MRS Bulletin , Volume 30 , Issue 4: Advances in Silicon Carbide Electronics , April 2005 , pp. 264 - 265

DOI: https://doi.org/10.1557/mrs2005.83 [Opens in a new window]
Copyright: Copyright © Materials Research Society 2005

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Wavelength Multiplexing of Microsphere Resonators Used to Characterize Nanolayers

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