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Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

Published online by Cambridge University Press:  10 July 2018

Enrico Pomarico ,
Ye-Jin Kim ,
F. Javier García de Abajo ,
Oh-Hoon Kwon ,
Fabrizio Carbone  and
Renske M. van der Veen
Enrico Pomarico
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland; [email protected]
Ye-Jin Kim
Affiliation:
Ulsan National Institute of Science and Technology, South Korea; [email protected]
F. Javier García de Abajo
Affiliation:
Institut de Ciències Fotòniques, Spain; [email protected]
Oh-Hoon Kwon
Affiliation:
Department of Chemistry, Ulsan National Institute of Science and Technology, South Korea; [email protected]
Fabrizio Carbone
Affiliation:
École Polytechnique Fédérale de Lausanne, Switzerland; [email protected]
Renske M. van der Veen
Affiliation:
Department of Chemistry, and Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, USA; [email protected]
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Abstract

In the quest for dynamic multimodal probing of a material’s structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.

Keywords

electron energy-loss spectroscopy (EELS)laser-induced reactionnanoscaleelectronic structureoptical properties
Type
Ultrafast Imaging of Materials Dynamics
Information
MRS Bulletin , Volume 43 , Issue 7: Ultrafast Imaging of Materials Dynamics , July 2018 , pp. 497 - 503
Copyright
Copyright © Materials Research Society 2018 

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