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Synchrotron-based x-ray absorption spectroscopy for energy materials

Published online by Cambridge University Press:  08 June 2016

Xiaosong Liu  and
Tsu-Chien Weng
Xiaosong Liu
Affiliation:
State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China; [email protected]
Tsu-Chien Weng
Affiliation:
Center for High Pressure Science & Technology Advanced Research, China; [email protected]
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Abstract

X-ray absorption spectroscopy (XAS) is a widely used characterization technique to explore the local geometric and electronic structures of materials with element specificity. XAS measurements are performed at synchrotron radiation sources that provide brilliant, tunable, and monochromatic energy photons. The advantages of XAS include good elemental, chemical, and orbital sensitivities, which all stem from inherent electron excitation and transition processes. XAS is categorized into soft (<2000 eV) and hard (>5000 eV) x-ray regimes, based on the incident photon energy. Soft x-rays can probe the K-edges of low-Z (atomic number) elements, including Li, C, N, O, and F, and the L-edges of 3d transition metals, whose K-edge is within the hard x-ray regime. All of these elements are essential components of energy materials. This article introduces the principle of XAS and reviews some recent applications in energy storage and energy conversion, illustrating the capabilities of XAS to investigate the fundamental properties of materials from the points of view of atomic and electronic structures, which play crucial roles in understanding the reaction mechanisms in high-performance devices.

Keywords

x-ray absorption spectroscopyelectronic structureenergy storagecatalyticsurface reaction
Type
Research Article
Information
MRS Bulletin , Volume 41 , Issue 6: Synchrotron Radiation Research in Materials Science , June 2016 , pp. 466 - 472
Copyright
Copyright © Materials Research Society 2016 

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