Hostname: page-component-cd9895bd7-gvvz8 Total loading time: 0 Render date: 2024-12-25T14:46:38.709Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface science for improved ion traps

Published online by Cambridge University Press:  14 October 2013

D.A. Hite ,
Y. Colombe ,
A.C. Wilson ,
D.T.C. Allcock ,
D. Leibfried ,
D.J. Wineland  and
D.P. Pappas
D.A. Hite
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
Y. Colombe
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
A.C. Wilson
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
D.T.C. Allcock
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
D. Leibfried
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
D.J. Wineland
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
D.P. Pappas
Affiliation:
National Institute of Standards and Technology, Colorado; [email protected]
Get access

Abstract

Trapped ions are sensitive to electric-field noise from trap-electrode surfaces. This noise has been an obstacle to progress in trapped-ion quantum information processing (QIP) experiments for more than a decade. It causes motional heating of the ions, and thus quantum-state decoherence. This heating is anomalous because it is not easily explained by typical technical-noise sources. Experimental evidence of its dependence on ion-electrode distance, frequency, and electrode temperature points to the surface, rather than the bulk, of the trap electrodes as the origin. In this article, we review experimental efforts and models to help identify and reduce or eliminate the source of the anomalous heating. Recent progress to reduce the heating with in situ cleaning indicates that it may not be a fundamental limit to trapped-ion QIP. Moreover, the extreme sensitivity of trapped ions to electric-field noise may potentially be used as a new tool in surface science.

Keywords

AuAuger electron spectroscopy (AES)ion-solid interactionssputtering
Type
Materials issues for quantum computation
Information
MRS Bulletin , Volume 38 , Issue 10: Materials issues for quantum computation , October 2013 , pp. 826 - 833
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Cirac, J.I., Zoller, P., Phys. Rev. Lett. 74, 4091 (1995).CrossRefGoogle Scholar
Blatt, R., Wineland, D.J., Nature 453, 1008 (2008).CrossRefGoogle Scholar
Blatt, R., Roos, C.F., Nat. Phys. 8, 277 (2012).CrossRefGoogle Scholar
Monroe, C., Kim, J., Science 339, 1164 (2013).CrossRefGoogle Scholar
DiVincenzo, D.P., Fortschr. Phys. 48, 771 (2000).3.0.CO;2-E>CrossRefGoogle Scholar
Wineland, D.J., Monroe, C., Itano, W.M., Leibfried, D., King, B.E., Meekhof, D.M., J. Res. Nat. Inst. Stand. Technol. 103, 259 (1998).CrossRefGoogle Scholar
Preskill, J., Proc. R. Soc. London, Ser. A 454, 385 (1998).CrossRefGoogle Scholar
Sørensen, A., Mølmer, K., Phys. Rev. A 62, 022311 (2000).CrossRefGoogle Scholar
Knill, E., Nature 463, 441 (2010).CrossRefGoogle Scholar
Turchette, Q.A., Kielpinski, D., King, B.E., Leibfried, D., Meekhof, D.M., Myatt, C.J., Rowe, M.A., Sackett, C.A., Wood, C.S., Itano, W.M., Monroe, C., Wineland, D.J., Phys. Rev. A. 61 063418 (2000).CrossRefGoogle Scholar
Safavi-Naini, A., Rabl, P., Weck, P.F., Sadeghpour, H.R., Phys. Rev. A 84, 023412 (2011).CrossRefGoogle Scholar
Daniilidis, N., Narayanan, S., Möller, S.A., Clark, R., Lee, T.E., Leek, P.J., Wallraff, A., Schulz, St., Schmidt-Kaler, F., Häffner, H., New J. Phys. 13, 013032 (2011).CrossRefGoogle Scholar
Diedrich, F., Bergquist, J.C., Itano, W.M., Wineland, D.J., Phys. Rev. Lett. 62, 403 (1989).CrossRefGoogle Scholar
Monroe, C., Meekhof, D.M., King, B.E., Itano, W.M., Wineland, D.J., Phys. Rev. Lett. 75, 4714 (1995).CrossRefGoogle Scholar
van der Ziel, A., Adv. Electron. El. Phys. 49, 225 (1979).CrossRefGoogle Scholar
Timm, G.W., van der Ziel, A., Physica 32, 1333 (1966).CrossRefGoogle Scholar
Kleint, Ch., Surf. Sci. 200, 472 (1988).CrossRefGoogle Scholar
Gomer, R., Rep. Prog. Phys. 53, 917 (1990).CrossRefGoogle Scholar
Gesley, M.A., Swanson, L.W., Phys. Rev. B 32, 7703 (1985).CrossRefGoogle Scholar
Gesley, M., Swanson, L., Phys. Rev. A 37, 4879 (1988).CrossRefGoogle Scholar
Safavi-Naini, A., Kim, E., Weck, P.F., Rabl, P., Sadeghpour, H.R., Phys. Rev. A 87, 023421 (2013).CrossRefGoogle Scholar
Faoro, L., Ioffe, L.B., Phys. Rev. Lett. 96, 047001 (2006).CrossRefGoogle Scholar
Pendry, J.B., Kirkman, P.D., Castano, E., Phys. Rev. Lett. 57, 2983 (1986).CrossRefGoogle Scholar
Benia, H.M., Myrach, P., Gonchar, A., Risse, T., Nilius, N., Freund, H.J., Phys. Rev. B 81, 241415 (2010).CrossRefGoogle Scholar
Seidelin, S., Chiaverini, J., Reichle, R., Bollinger, J.J., Leibfried, D., Britton, J., Wesenberg, J.H., Blakestad, R.B., Epstein, R.J., Hume, D.B., Itano, W.M., Jost, J.D., Langer, C., Ozeri, R., Shiga, N., Wineland, D.J., Phys. Rev. Lett. 96, 253003 (2006).CrossRefGoogle Scholar
Maiwald, R., Leibfried, D., Britton, J., Bergquist, J.C., Leuchs, G., Wineland, D.J., Nat. Phys. 5, 551 (2009); C.L. Arrington et al., Rev. Sci. Instrum. 84, 085001 (2013).CrossRefGoogle Scholar
DeVoe, R., Kurtsiefer, C., Phys. Rev. A 65, 063407 (2002).CrossRefGoogle Scholar
Leibrandt, D.R., Labaziewicz, J., Clark, R.J., Chuang, I.L., Epstein, R.J., Ospelkaus, C., Wesenberg, J.H., Bollinger, J.H., Leibfried, D., Wineland, D., Stick, D., Sterk, J., Monroe, C., Pai, C.-S., Low, Y., Frahm, R., Slusher, R.E., Quantum Inf. Comput. 9, 901 (2009).Google Scholar
Britton, J., Leibfried, D., Beall, J.A., Blakestad, R.B., Wesenberg, J.H., Wineland, D.J., Appl. Phys. Lett. 95, 173102 (2009).CrossRefGoogle Scholar
Stick, D., Fortier, K.M., Haltli, R., Highstrete, C., Moehring, D.L., Tigges, C., Blain, M.G., Physics (2010) (available at http://arxiv.org/abs/1008.0990v2).Google Scholar
Merrill, J.T., Volin, C., Landgren, D., Amini, J.M., Wright, K., Doret, S.C., Pai, C.-S., Hayden, H., Killian, T., Faircloth, D., Brown, K.R., Harter, A.W., Slusher, R.E., New J. Phys. 13, 103005 (2011).CrossRefGoogle Scholar
Barrett, M.D., Chiaverini, J., Schaetz, T., Britton, J., Itano, W.M., Jost, J.D., Knill, E., Langer, C., Leibfried, D., Ozeri, R., Wineland, D.J., Nature 429, 737 (2004).CrossRefGoogle Scholar
Blakestad, R.B., Ospelkaus, C., VanDevender, A.P., Wesenberg, J.H., Biercuk, M.J., Leibfried, D., Wineland, D.J., Phys. Rev. A 84, 032314 (2011).CrossRefGoogle Scholar
Cetina, M.Grier, A., Campbell, J., Chuang, I., Vuletic, V., Phys. Rev. A 76, 041401 (2007).CrossRefGoogle Scholar
Sage, J.M., Kerman, A.J., Chiaverini, J., Phys. Rev. A 86, 013417 (2012).CrossRefGoogle Scholar
Deslauriers, L., Olmschenk, S., Stick, D., Hensinger, W.K., Sterk, J., Monroe, C.Phys. Rev. Lett. 97, 103007 (2006).CrossRefGoogle Scholar
Labaziewicz, J.Ge, Y.F., Antoli, P., Leibrandt, D., Brown, K.R., Chuang, I.L., Phys. Rev. Lett. 100, 013001 (2008).CrossRefGoogle Scholar
Labaziewicz, J., Ge, Y.F., Leibrandt, D., Wang, S.X., Shewmon, R., Chuang, I.L., Phys. Rev. Lett. 101, 180602 (2008).CrossRefGoogle Scholar
Wang, S.X., Ge, Y.F., Labaziewicz, J., Dauler, E., Berggren, K., Chuang, I.L., Appl. Phys. Lett. 97, 244102 (2010).CrossRefGoogle Scholar
Brown, K.R., Ospelkaus, C., Colombe, Y., Wilson, A.C., Leibfried, D., Wineland, D.J., Nature 471, 196 (2011).CrossRefGoogle Scholar
Hammer, B., Nørskov, J.K., Nature 376, 238 (1995).CrossRefGoogle Scholar
Hansson, G.V., Flodström, S.A., Phys. Rev. B 18, 1572 (1978).CrossRefGoogle Scholar
Lin, T.-S., Chung, Y.-W., Superlattices Microstruct. 4, 709 (1988).CrossRefGoogle Scholar
Chaigneau, M., Picardi, G., Ossikovski, R., Surf. Sci. 604, 701 (2010).CrossRefGoogle Scholar
Boller, K., Haelbich, R.P., Hogrefe, H., Jark, W., Kunz, C., Nucl. Instrum. Methods 208, 273 (1983).CrossRefGoogle Scholar
Krim, J., Thin Solid Films 137, 297 (1986).CrossRefGoogle Scholar
Clausing, R.E., Emerson, L.C., Heatherly, L., Colchin, R.J., Twichell, J.C., J. Vac. Sci. Technol. 13, 437 (1976).CrossRefGoogle Scholar
Hite, D.A., Colombe, Y., Wilson, A.C., Brown, K.R., Warring, U., Jördens, R., Jost, J.D., McKay, K.S., Pappas, D.P., Leibfried, D., Wineland, D.J., Phys. Rev. Lett. 109, 103001 (2012).CrossRefGoogle Scholar
Krozer, A., Rodahl, M., J. Vac. Sci. Technol., A 15, 1704 (1997).CrossRefGoogle Scholar
Delaporte, Ph., Oltra, R., in Recent Advances in Laser Processing of Materials (European Materials Research Society Series), Perriere, J., Millon, E., Fogarassy, E., Eds. (Elsevier, Amsterdam, 2006), pp. 411–440.Google Scholar
Viswanathan, R., Hussia, I., J. Opt. Soc. B 3, 796 (1986).CrossRefGoogle Scholar
Park, H.K., Grigoropoulos, C.P., Leung, W.P., Tam, A.C., IEEE Trans. Compon. Packag. Manuf. Technol. Part A 17, 631 (1994).CrossRefGoogle Scholar
Allcock, D.T.C., Guidoni, L., Harty, T.P., Ballance, C.J., Blain, M.G., Steane, A.M., Lucas, D.M., New J. Phys. 13, 123023 (2011).CrossRefGoogle Scholar
Kautek, W., Krüger, J., Proc. SPIE 2207, 600 (1994).CrossRefGoogle Scholar
After submission of this article, similar analyses and results have been reported byDaniilidis, N., Gerber, S., Bolloten, G., Ramm, M., Ransford, A., Ulin-Avila, E., Talukdar, I., Häffner, H., Physics (2013) (available at arXiv 1307.7194v1).Google Scholar
Rosenband, T., Hume, D.B., Schmidt, P.O., Chou, C.W., Brusch, A., Lorini, L., Oskay, W.H., Drullinger, R.E., Fortier, T.M., Stalnaker, J.E., Diddams, S.A., Swann, W.C., Newbury, N.R., Itano, W.M., Wineland, D.J., Bergquist, J.C., Science 319, 1808 (2008).CrossRefGoogle Scholar
Yang, Y.T., Callegari, C., Feng, X.L., Roukes, M.L., Nano Lett. 11, 1753 (2011).CrossRefGoogle Scholar
Robertson, N.A, Blackwood, J.R., Buchman, S., Byer, R.L., Camp, J., Gill, D., Hanson, J., Williams, S., Zhou, P., Class. Quantum Grav. 23, 2665 (2006).CrossRefGoogle Scholar
Reasenberg, R.D., Patla, B.R., Phillips, J.D., Thapa, R., Class. Quantum Grav. 29, 184013 (2012).CrossRefGoogle Scholar
Sushkov, A.O., Kim, W.J., Dalvit, D.A.R., Lamoreaux, S.K., Nat. Phys. 7, 230 (2011).CrossRefGoogle Scholar
Behunin, R.O., Zeng, Y., Dalvit, D.A.R., Reynaud, S., Phys. Rev. A 86, 052509 (2012).CrossRefGoogle Scholar
Roos, Ch., Zeiger, Th., Rohde, H., Nägerl, H.C., Eschner, J., Leibfried, D., Schmidt-Kaler, F., Blatt, R., Phys. Rev. Lett. 83, 4713 (1999).CrossRefGoogle Scholar
Tamm, Chr., Engelke, D., Bühner, V., Phys. Rev. A 61, 053405 (2000).CrossRefGoogle Scholar
Deslauriers, L., Haljan, P.C., Lee, P.J., Brickman, K.-A., Blinov, B.B., Madsen, M.J., Monroe, C., Phys. Rev. A 70, 043408 (2004).CrossRefGoogle Scholar
Stick, D., Hensinger, W.K., Olmschenk, S., Madsen, M.J., Schwab, K., Monroe, C., Nat. Phys. 2, 36 (2006).CrossRefGoogle Scholar
Epstein, R.J., Seidelin, S., Leibfried, D., Wesenberg, J.H., Bollinger, J.J., Amini, J.M., Blakestad, R.B., Britton, J., Home, J.P., Itano, W.M., Jost, J.D., Knill, E., Langer, C., Ozeri, R., Shiga, N., Wineland, D.J., Phys. Rev. A 76, 033411 (2007).CrossRefGoogle Scholar
Lucas, D.M., Keitch, B.C., Home, J.P., Imreh, G., McDonnell, M.J., Stacey, D.N., Szwer, D.J., Steane, A.M., Quantum Phys. (2007) (available at arxiv/pdf/0710/0710.4421v1.pdf).Google Scholar
Benhelm, J., Kirchmair, G., Roos, C.F., Blatt, R., Phys. Rev. A 77, 062306 (2008).CrossRefGoogle Scholar
Schulz, S.A., Poschinger, U., Ziesel, F., Schmidt-Kaler, F., New J. Phys. 10, 045007 (2008).CrossRefGoogle Scholar
Allcock, D.T.C., Sherman, J.A., Curtis, M.J., Imreh, G., Burrell, A.H., Szwer, D.J., Stacey, D.N., Steane, A.M., Lucas, D.M., New J. Phys. 12, 053026 (2010).CrossRefGoogle Scholar
Warring, U., Ospelkaus, C., Colombe, Y., Brown, K.R., Amini, J.M., Carsjens, M., Leibfried, D., Wineland, D.J., Phys. Rev. A 87, 013437 (2013).CrossRefGoogle Scholar