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Structural dynamics probed by high-coherence electron pulses

Published online by Cambridge University Press:  10 July 2018

Armin Feist
Affiliation:
University of Göttingen, Germany; [email protected]
Gero Storeck
Affiliation:
Department of Physics, University of Göttingen, Germany; [email protected]
Sascha Schäfer
Affiliation:
University Oldenburg, Germany; [email protected]
Claus Ropers
Affiliation:
University of Göttingen, Germany; [email protected]
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Abstract

Ultrafast measurement technology provides essential contributions to our understanding of the properties and functions of solids and nanostructures. Atomic-scale vistas with ever-growing spatial and temporal resolution are offered by methods based on short pulses of x-rays and electrons. Time-resolved electron diffraction and microscopy are among the most powerful approaches to investigate nonequilibrium structural dynamics. In this article, we discuss recent advances in ultrafast electron imaging enabled by significant improvements in the coherence of pulsed electron beams. Specifically, we review the development and first application of ultrafast low-energy electron diffraction for the study of structural dynamics at surfaces, and discuss novel opportunities for ultrafast transmission electron microscopy facilitated by laser-triggered field-emission sources. These and further developments will render coherent electron beams an essential component in future ultrafast nanoscale imaging.

Type
Ultrafast Imaging of Materials Dynamics
Copyright
Copyright © Materials Research Society 2018 

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References

Bovensiepen, U., Petek, H., Wolf, M., Eds., Dynamics at Solid State Surfaces and Interfaces (Wiley-VCH, Weinheim, Germany, 2010), vol. 1.CrossRefGoogle Scholar
Miller, R.J.D., Annu. Rev. Phys. Chem. 65, 583 (2014).CrossRefGoogle Scholar
Zewail, A.H., Annu. Rev. Phys. Chem. 57, 65 (2006).CrossRefGoogle Scholar
Lindenberg, A.M., Larsson, J., Sokolowski-Tinten, K., Gaffney, K.J., Blome, C., Synnergren, O., Sheppard, J., Caleman, C., MacPhee, A.G., Weinstein, D., Lowney, D.P., Allison, T.K., Matthews, T., Falcone, R.W., Cavalieri, A.L., Fritz, D.M., Lee, S.H., Bucksbaum, P.H., Reis, D.A., Rudati, J., Fuoss, P.H., Kao, C.C., Siddons, D.P., Pahl, R., Als-Nielsen, J., Duesterer, S., Ischebeck, R., Schlarb, H., Schulte-Schrepping, H., Tschentscher, Th., Schneider, J., von der Linde, D., Hignette, O., Sette, F., Chapman, H.N., Lee, R.W., Hansen, T.N., Techert, S., Wark, J.S., Bergh, M., Huldt, G., van der Spoel, D., Timneanu, N., Hajdu, J., Akre, R.A., Bong, E., Krejcik, P., Arthur, J., Brennan, S., Luening, K., Hastings, J.B., Science 308, 392 (2005).CrossRefGoogle Scholar
Huber, M.A., Plankl, M., Eisele, M., Marvel, R.E., Sandner, F., Korn, T., Schüller, C., Haglund, R.F., Huber, R., Cocker, T.L., Nano Lett. 16, 1421 (2016).CrossRefGoogle Scholar
Kravtsov, V., Ulbricht, R., Atkin, J.M., Raschke, M.B., Nat. Nanotechnol. 11, 459 (2016).CrossRefGoogle Scholar
Wagner, M., Fei, Z., McLeod, A.S., Rodin, A.S., Bao, W., Iwinski, E.G., Zhao, Z., Goldflam, M., Liu, M., Dominguez, G., Thiemens, M., Fogler, M.M., Castro Neto, A.H., Lau, C.N., Amarie, S., Keilmann, F., Basov, D.N., Nano Lett. 14, 894 (2014).CrossRefGoogle Scholar
Terada, Y., Yoshida, S., Takeuchi, O., Shigekawa, H., Nat. Photonics 4, 869 (2010).CrossRefGoogle Scholar
Cocker, T.L., Jelic, V., Gupta, M., Molesky, S.J., Burgess, J.A.J., Reyes, G.D.L., Titova, L.V., Tsui, Y.Y., Freeman, M.R., Hegmann, F.A., Nat. Photonics 7, 620 (2013).CrossRefGoogle Scholar
Cocker, T.L., Peller, D., Yu, P., Repp, J., Huber, R., Nature 539, 263 (2016).CrossRefGoogle Scholar
Quinonez, E., Handali, J., Barwick, B., Rev. Sci. Instrum. 84, 103710 (2013).CrossRefGoogle Scholar
Müller, M., Paarmann, A., Ernstorfer, R., Nat. Commun. 5, 5292 (2014).CrossRefGoogle Scholar
Vogelsang, J., Robin, J., Nagy, B.J., Dombi, P., Rosenkranz, D., Schiek, M., Groß, P., Lienau, C., Nano Lett. 15, 4685 (2015).CrossRefGoogle Scholar
Gaffney, K.J., Chapman, H.N., Science 316, 1444 (2007).CrossRefGoogle Scholar
Sandberg, R.L., Song, C., Wachulak, P.W., Raymondson, D.A., Paul, A., Amirbekian, B., Lee, E., Sakdinawat, A.E., La-O-Vorakiat, C., Marconi, M.C., Menoni, C.S., Murnane, M.M., Rocca, J.J., Kapteyn, H.C., Miao, J., Proc. Natl. Acad. Sci. U.S.A. 105, 24 (2008).CrossRefGoogle Scholar
Kfir, O., Zayko, S., Nolte, C., Sivis, M., Möller, M., Hebler, B., Arekapudi, S.S.P.K., Steil, D., Schäfer, S., Albrecht, M., Cohen, O., Mathias, S., Ropers, C., Sci. Adv. 3, eaao4641 (2017).CrossRefGoogle Scholar
Miller, R.J.D., Science 343, 1108 (2014).CrossRefGoogle Scholar
Zewail, A.H., Science 328, 187 (2010).CrossRefGoogle Scholar
Musumeci, P., Moody, J.T., Scoby, C.M., Gutierrez, M.S., Bender, H.A., Wilcox, N.S., Rev. Sci. Instrum. 81, 13306 (2010).CrossRefGoogle Scholar
Lahme, S., Kealhofer, C., Krausz, F., Baum, P., Struct. Dyn. 1, 34303 (2014).CrossRefGoogle Scholar
Gulde, M., Schweda, S., Storeck, G., Maiti, M., Yu, H.K., Wodtke, A.M., Schafer, S., Ropers, C., Science 345, 200 (2014).CrossRefGoogle Scholar
Weathersby, S.P., Brown, G., Centurion, M., Chase, T.F., Coffee, R., Corbett, J., Eichner, J.P., Frisch, J.C., Fry, A.R., Gühr, M., Hartmann, N., Hast, C., Hettel, R., Jobe, R.K., Jongewaard, E.N., Lewandowski, J.R., Li, R.K., Lindenberg, A.M., Makasyuk, I., May, J.E., McCormick, D., Nguyen, M.N., Reid, A.H., Shen, X., Sokolowski-Tinten, K., Vecchione, T., Vetter, S.L., Wu, J., Yang, J., Dürr, H.A., Wang, X.J., Rev. Sci. Instrum. 86, 73702 (2015).CrossRefGoogle Scholar
Manz, S., Casandruc, A., Zhang, D., Zhong, Y., Loch, R.A., Marx, A., Hasegawa, T., Liu, L.C., Bayesteh, S., Delsim-Hashemi, H., Hoffmann, M., Felber, M., Hachmann, M., Mayet, F., Hirscht, J., Keskin, S., Hada, M., Epp, S.W., Flöttmann, K., Miller, R.J.D., Faraday Discuss. 177, 467 (2015).CrossRefGoogle Scholar
Liang, W., Schäfer, S., Zewail, A.H., Chem. Phys. Lett. 542, 1 (2012).CrossRefGoogle Scholar
Hanisch-Blicharski, A., Janzen, A., Krenzer, B., Wall, S., Klasing, F., Kalus, A., Frigge, T., Kammler, M., Horn-von Hoegen, M., Ultramicroscopy 127, 2 (2013).CrossRefGoogle Scholar
Frigge, T., Hafke, B., Witte, T., Krenzer, B., Streubühr, C., Samad Syed, A., Mikšić Trontl, V., Avigo, I., Zhou, P., Ligges, M., von der Linde, D., Bovensiepen, U., Horn-von Hoegen, M., Wippermann, S., Lücke, A., Sanna, S., Gerstmann, U., Schmidt, W.G., Nature 544, 207 (2017).CrossRefGoogle Scholar
Vogelgesang, S., Storeck, G., Horstmann, J.G., Diekmann, T., Sivis, M., Schramm, S., Rossnagel, K., Schäfer, S., Ropers, C., Nat. Phys. 14, 184 (2018).CrossRefGoogle Scholar
Dömer, H., Bostanjoglo, O., Rev. Sci. Instrum. 74, 4369 (2003).CrossRefGoogle Scholar
Kim, J.S., LaGrange, T., Reed, B.W., Taheri, M.L., Armstrong, M.R., King, W.E., Browning, N.D., Campbell, G.H., Science 321, 1472 (2008).CrossRefGoogle Scholar
Yang, D.-S., Mohammed, O.F., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 107, 14993 (2010).CrossRefGoogle Scholar
Sun, J., Melnikov, V.A., Khan, J.I., Mohammed, O.F., J. Phys. Chem. Lett. 6, 3884 (2015).CrossRefGoogle Scholar
Van Oudheusden, T., De Jong, E.F., van der Geer, S.B., Op ’t Root, W.P.E.M., Luiten, O.J., Siwick, B.J., J. Appl. Phys. 102, 93501 (2007).CrossRefGoogle Scholar
Sciaini, G., Miller, R.J.D., Rep. Prog. Phys. 74, 96101 (2011).CrossRefGoogle Scholar
Chatelain, R.P., Morrison, V.R., Godbout, C., Siwick, B.J., Appl. Phys. Lett. 101, 81901 (2012).CrossRefGoogle Scholar
Gerbig, C., Senftleben, A., Morgenstern, S., Sarpe, C., Baumert, T., New J. Phys. 17, 43050 (2015).CrossRefGoogle Scholar
Waldecker, L., Bertoni, R., Ernstorfer, R., J. Appl. Phys. 117, 44903 (2015).CrossRefGoogle Scholar
Daoud, H., Floettmann, K., Miller, R.J.D., Struct. Dyn. 4, 044016 (2017).CrossRefGoogle Scholar
Reiser, M., Theory and Design of Charged Particle Beams, Wiley Series in Beam Physics and Accelerator Technology (Wiley, Weinheim, Germany, 2008).CrossRefGoogle Scholar
Dowell, D.H., Schmerge, J.F., Phys. Rev. Spec. Top. Accel. Beams 12, 74201 (2009).CrossRefGoogle Scholar
Kuwahara, M., Nambo, Y., Aoki, K., Sameshima, K., Jin, X., Ujihara, T., Asano, H., Saitoh, K., Takeda, Y., Tanaka, N., Appl. Phys. Lett. 109, 13108 (2016).CrossRefGoogle Scholar
Kasmi, L., Kreier, D., Bradler, M., Riedle, E., Baum, P., New J. Phys. 17, 33008 (2015).CrossRefGoogle Scholar
Merano, M., Collin, S., Renucci, P., Gatri, M., Sonderegger, S., Crottini, A., Ganière, J.D., Deveaud, B., Rev. Sci. Instrum. 76, 85108 (2005).CrossRefGoogle Scholar
Ropers, C., Solli, D.R., Schulz, C.P., Lienau, C., Elsaesser, T., Phys. Rev. Lett. 98, 43907 (2007).CrossRefGoogle Scholar
Barwick, B., Corder, C., Strohaber, J., Chandler-Smith, N., Uiterwaal, C., Batelaan, H., New J. Phys. 9, 142 (2007).CrossRefGoogle Scholar
Hommelhoff, P., Sortais, Y., Aghajani-Talesh, A., Kasevich, M.A., Phys. Rev. Lett. 96, 77401 (2006).CrossRefGoogle Scholar
Bormann, R., Gulde, M., Weismann, A., Yalunin, S.V., Ropers, C., Phys. Rev. Lett. 105, 147601 (2010).CrossRefGoogle Scholar
Herink, G., Solli, D.R., Gulde, M., Ropers, C., Nature 483, 190 (2012).CrossRefGoogle Scholar
Ehberger, D., Hammer, J., Eisele, M., Krüger, M., Noe, J., Högele, A., Hommelhoff, P., Phys. Rev. Lett. 114, 227601 (2015).CrossRefGoogle Scholar
Feist, A., Bach, N., Rubiano da Silva, N., Danz, T., Möller, M., Priebe, K.E., Domröse, T., Gatzmann, J.G., Rost, S., Schauss, J., Strauch, S., Bormann, R., Sivis, M., Schäfer, S., Ropers, C., Ultramicroscopy 176, 63 (2017).CrossRefGoogle Scholar
Houdellier, F., Caruso, G.M., Weber, S., Kociak, M., Arbouet, A., Ultramicroscopy 186, 128 (2018).CrossRefGoogle Scholar
Paarmann, A., Gulde, M., Müller, M., Schäfer, S., Schweda, S., Maiti, M., Xu, C., Hohage, T., Schenk, F., Ropers, C., Ernstorfer, R., J. Appl. Phys. 112, 113109 (2012).CrossRefGoogle Scholar
Bormann, R., Strauch, S., Schäfer, S., Ropers, C., J. Appl. Phys. 118, 173105 (2015).CrossRefGoogle Scholar
Schröder, B., Sivis, M., Bormann, R., Schäfer, S., Ropers, C., Appl. Phys. Lett. 107, 231105 (2015).CrossRefGoogle Scholar
Hasan, M.Z., Kane, C.L., Rev. Mod. Phys. 82, 3045 (2010).CrossRefGoogle Scholar
Ichimiya, A., Cohen, P.I., Reflection High-Energy Electron Diffraction, Springer Series in Surface Sciences (Cambridge University Press, Cambridge, 2004).CrossRefGoogle Scholar
Van Hove, M.A., Weinberg, W.H., Chan, C.-M., Low-Energy Electron Diffraction, Springer Series in Surface Sciences (Springer-Verlag, Berlin, 1986).CrossRefGoogle Scholar
Storeck, G., Vogelgesang, S., Sivis, M., Schäfer, S., Ropers, C., Struct. Dyn. 4, 44024 (2017).CrossRefGoogle Scholar
Spijkerman, A., de Boer, J.L., Meetsma, A., Wiegers, G.A., van Smaalen, S., Phys. Rev. B Condens. Matter 56, 13757 (1997).CrossRefGoogle Scholar
Rossnagel, K., J. Phys. Condens. Matter 23, 213001 (2011).CrossRefGoogle Scholar
Stojchevska, L., Vaskivskyi, I., Mertelj, T., Kusar, P., Svetin, D., Brazovskii, S., Mihailovic, D., Science 344, 177 (2014).CrossRefGoogle Scholar
Perfetti, L., Loukakos, P.A., Lisowski, M., Bovensiepen, U., Berger, H., Biermann, S., Cornaglia, P.S., Georges, A., Wolf, M., Phys. Rev. Lett. 97, 67402 (2006).CrossRefGoogle Scholar
Hellmann, S., Sohrt, C., Beye, M., Rohwer, T., Sorgenfrei, F., Marczynski-Bühlow, M., Kalläne, M., Redlin, H., Hennies, F., Bauer, M., Föhlisch, A., Kipp, L., Wurth, W., Rossnagel, K., New J. Phys. 14, 13062 (2012).CrossRefGoogle Scholar
Petersen, J.C., Kaiser, S., Dean, N., Simoncig, A., Liu, H.Y., Cavalieri, A.L., Cacho, C., Turcu, I.C.E., Springate, E., Frassetto, F., Poletto, L., Dhesi, S.S., Berger, H., Cavalleri, A., Phys. Rev. Lett. 107, 177402 (2011).CrossRefGoogle Scholar
Ligges, M., Avigo, I., Golež, D., Strand, H., Beyazit, Y., Hanff, K., Diekmann, F., Stojchevska, L., Kalläne, M., Zhou, P., Rossnagel, K., Eckstein, M., Werner, P., Bovensiepen, U., Phys. Rev. Lett. 120, 166401 (2018).CrossRefGoogle Scholar
Eichberger, M., Schäfer, H., Krumova, M., Beyer, M., Demsar, J., Berger, H., Moriena, G., Sciaini, G., Miller, R.J.D., Nature 468, 799 (2010).CrossRefGoogle Scholar
Haupt, K., Eichberger, M., Erasmus, N., Rohwer, A., Demsar, J., Rossnagel, K., Schwoerer, H., Phys. Rev. Lett. 116, 16402 (2016).CrossRefGoogle Scholar
Laulhé, C., Huber, T., Lantz, G., Ferrer, A., Mariager, S.O., Grübel, S., Rittmann, J., Johnson, J.A., Esposito, V., Lübcke, A., Huber, L., Kubli, M., Savoini, M., Jacques, V.L.R., Cario, L., Corraze, B., Janod, E., Ingold, G., Beaud, P., Johnson, S.L., Ravy, S., Phys. Rev. Lett. 118, 247401 (2017).CrossRefGoogle Scholar
McMillan, W.L., Phys. Rev. B Condens. Matter 12, 1187 (1975).CrossRefGoogle Scholar
Wimmer, L., Herink, G., Solli, D.R., Yalunin, S.V., Echternkamp, K.E., Ropers, C., Nat. Phys. 10, 432 (2014).CrossRefGoogle Scholar
Kealhofer, C., Schneider, W., Ehberger, D., Ryabov, A., Krausz, F., Baum, P., Science 352, 429 (2016).CrossRefGoogle Scholar
Flannigan, D.J., Zewail, A.H., Acc. Chem. Res. 45, 1828 (2012).CrossRefGoogle Scholar
Piazza, L., Masiel, D.J., LaGrange, T., Reed, B.W., Barwick, B., Carbone, F., Chem. Phys. 423, 79 (2013).CrossRefGoogle Scholar
Feist, A., Echternkamp, K.E., Schauss, J., Yalunin, S.V., Schäfer, S., Ropers, C., Nature 521, 200 (2015).CrossRefGoogle Scholar
Kieft, E., Schliep, K.B., Suri, P.K., Flannigan, D.J., Struct. Dyn. 2, 51101 (2015).CrossRefGoogle Scholar
Cao, G., Sun, S., Li, Z., Tian, H., Yang, H., Li, J., Sci. Rep. 5, 8404 (2015).CrossRefGoogle Scholar
Bücker, K., Picher, M., Crégut, O., LaGrange, T., Reed, B.W., Park, S.T., Masiel, D.J., Banhart, F., Ultramicroscopy 171, 8 (2016).CrossRefGoogle Scholar
Lee, Y.M., Kim, Y.J., Kim, Y.-J., Kwon, O.-H., Struct. Dyn. 4, 44023 (2017).CrossRefGoogle Scholar
Ji, S., Piazza, L., Cao, G., Park, S.T., Reed, B.W., Masiel, D.J., Weissenrieder, J., Struct. Dyn. 4, 54303 (2017).CrossRefGoogle Scholar
Verhoeven, W., van Rens, J.F.M., Kieft, E.R., Mutsaers, P.H.A., Luiten, O.J., Ultramicroscopy 188, 85 (2018).CrossRefGoogle Scholar
Tonomura, A., Electron Holography, 2nd ed., Springer Series in Optical Sciences (Springer, Berlin, 1999).CrossRefGoogle Scholar
Midgley, P.A., Dunin-Borkowski, R.E., Nat. Mater. 8, 271 (2009).CrossRefGoogle Scholar
Verbeeck, J., Tian, H., Schattschneider, P., Nature 467, 301 (2010).CrossRefGoogle Scholar
Zuo, J.M., Spence, J.C.H., Advanced Transmission Electron Microscopy (Springer-Verlag, New York, 2017).CrossRefGoogle Scholar
Cook, B., Bronsgeest, M., Hagen, K., Kruit, P., Ultramicroscopy 109, 403 (2009).CrossRefGoogle Scholar
Armani, D.K., Kippenberg, T.J., Spillane, S.M., Vahala, K.J., Nature 421, 925 (2003).CrossRefGoogle Scholar
Eichenfield, M., Chan, J., Camacho, R.M., Vahala, K.J., Painter, O., Nature 462, 78 (2009).CrossRefGoogle Scholar
Aspelmeyer, M., Kippenberg, T.J., Marquardt, F., Rev. Mod. Phys. 86, 1391 (2014).CrossRefGoogle Scholar
Maldovan, M., Nature 503, 209 (2013).CrossRefGoogle Scholar
Volz, S., Ordonez-Miranda, J., Shchepetov, A., Prunnila, M., Ahopelto, J., Pezeril, T., Vaudel, G., Gusev, V., Ruello, P., Weig, E.M., Schubert, M., Hettich, M., Grossman, M., Dekorsy, T., Alzina, F., Graczykowski, B., Chavez-Angel, E., Sebastian Reparaz, J., Wagner, M.R., Sotomayor-Torres, C.M., Xiong, S., Neogi, S., Donadio, D., Eur. Phys. J. B 89, 15 (2016).CrossRefGoogle Scholar
Barwick, B., Park, H.S., Kwon, O., Baskin, J.S., Zewail, A.H., Science 322, 1227 (2008).CrossRefGoogle Scholar
Yurtsever, A., Zewail, A.H., Proc. Natl. Acad. Sci. U.S.A. 108, 3152 (2011).CrossRefGoogle Scholar
Cremons, D.R., Plemmons, D.A., Flannigan, D.J., Nat. Commun. 7, 11230 (2016).CrossRefGoogle Scholar
Feist, A., Rubiano da Silva, N., Liang, W., Ropers, C., Schäfer, S., Struct. Dyn. 5, 14302 (2018).CrossRefGoogle Scholar
Echternkamp, K.E., Feist, A., Schäfer, S., Ropers, C., Nat. Phys. 12, 1000 (2016).CrossRefGoogle Scholar
Priebe, K.E., Rathje, C., Yalunin, S.V., Hohage, T., Feist, A., Schäfer, S., Ropers, C., Nat. Photonics 11, 793 (2017).CrossRefGoogle Scholar