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Single-atom dynamics in scanning transmission electron microscopy

Published online by Cambridge University Press:  08 September 2017

Rohan Mishra ,
Ryo Ishikawa ,
Andrew R. Lupini  and
Stephen J. Pennycook
Rohan Mishra
Affiliation:
Department of Mechanical Engineering and Materials Science; and Institute of Materials Science and Engineering, Washington University, USA; [email protected]
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Japan; [email protected]
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, USA; [email protected]
Stephen J. Pennycook
Affiliation:
Department of Materials Science and Engineering, National University of Singapore, Singapore; The University of Tennessee, USA; and Vanderbilt University, USA; [email protected]; or [email protected]
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Abstract

The correction of aberrations in the scanning transmission electron microscope (STEM) has simultaneously improved both spatial and temporal resolution, making it possible to capture the dynamics of single atoms inside materials, and resulting in new insights into the dynamic behavior of materials. In this article, we describe the different beam–matter interactions that lead to atomic excitations by transferring energy and momentum. We review recent examples of sequential STEM imaging to demonstrate the dynamic behavior of single atoms both within materials, at dislocations, at grain and interface boundaries, and on surfaces. We also discuss the effects of such dynamic behavior on material properties. We end with a summary of ongoing instrumental and algorithm developments that we anticipate will improve the temporal resolution significantly, allowing unprecedented insights into the dynamic behavior of materials at the atomic scale.

Keywords

diffusionphase transformationdislocationsgrain boundaries
Type
Research Article
Information
MRS Bulletin , Volume 42 , Issue 9: Single Atom Fabrication with Beams and Probes , September 2017 , pp. 644 - 652
Copyright
Copyright © Materials Research Society 2017 

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