Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-26T08:17:35.302Z Has data issue: false hasContentIssue false

Semiconductor quantum dot qubits

Published online by Cambridge University Press:  14 October 2013

M.A. Eriksson
Affiliation:
Department of Physics, University of Wisconsin–Madison; [email protected]
S.N. Coppersmith
Affiliation:
Department of Physics, University of Wisconsin–Madison; [email protected]
M.G. Lagally
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin–Madison; [email protected]
Get access

Abstract

A quantum information processor must perform accurate manipulations of many quantum degrees of freedom without introducing strong interactions with the environment that lead to the loss of quantum coherence. Spins in semiconductors have been shown to have long coherence times, so semiconducting quantum processors are feasible if the necessary manipulations can be performed without introducing excessive spin decoherence. To perform the necessary manipulations of single spins and to control the couplings between different spins, fine control of electronic energy levels and wave function overlaps is required. Electrically gated quantum dots have the promise of enabling such control, because the same gates that are used to define the quantum dot can be used to perform the necessary manipulations. This article describes recent progress toward the development of high-fidelity qubits using top-gate defined semiconductor quantum dots.

Type
Materials issues for quantum computation
Copyright
Copyright © Materials Research Society 2013 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Shor, P.W., SIAM J. Comput. 26, 1484 (1997).CrossRefGoogle Scholar
Feynman, R.P., Opt. News 11, 11 (1985).CrossRefGoogle Scholar
Monz, T., Schindler, P., Barreiro, J.T., Chwalla, M., Nigg, D., Coish, W.A., Harlander, M., Hänsel, W., Hennrich, M., Blatt, R., Phys. Rev. Lett. 106, 130506 (2011).CrossRefGoogle Scholar
Fowler, A.G., Mariantoni, M., Martinis, J.M., Cleland, A.N., Phys. Rev. A 86, 032324 (2012).CrossRefGoogle Scholar
Loss, D., DiVincenzo, D.P., Phys. Rev. A 57, 120 (1998).CrossRefGoogle Scholar
Vrijen, R., Yablonovitch, E., Wang, K., Jiang, H.W., Balandin, A., Roychowdhury, V., Mor, T., DiVincenzo, D., Phys. Rev. A, 62, 012306 (2000).CrossRefGoogle Scholar
Tahan, C., Friesen, M., Joynt, R., Phys. Rev. B 66, 035314 (2002).CrossRefGoogle Scholar
de Sousa, R, Das Sarma, S., Phys. Rev. B 67, 033301 (2003).CrossRefGoogle Scholar
Friesen, M., Rugheimer, P., Savage, D.E., Lagally, M.G., van der Weide, D.W., Joynt, R., Eriksson, M.A., Phys. Rev. B 67, 121301 (2003).CrossRefGoogle Scholar
Witzel, W., Das Sarma, S., Phys. Rev. B 74, 035322 (2006).CrossRefGoogle Scholar
Stephens, A.M., Fowler, A.G., Hollenberg, L.C.L., Quantum Inf. Comput. 8, 330 (2008).Google Scholar
Petta, J.R., Johnson, A.C., Taylor, J.M., Laird, E.A., Yacoby, A., Lukin, M.D., Marcus, C.M., Hanson, M.P., Gossard, A.C., Science 309, 2180 (2005).CrossRefGoogle Scholar
Koppens, F.H.L., Buizert, C., Tielrooij, K.J., Vink, I.T., Nowack, K.C., Meunier, T., Kouwenhoven, L.P., Vandersypen, L.M.K., Nature 442, 766 (2006).CrossRefGoogle Scholar
Simmons, C.B., Prance, J.R., Van Bael, B.J., Koh, T.S., Shi, Z., Savage, D.E., Lagally, M.G., Joynt, R., Friesen, M., Coppersmith, S.N., Eriksson, M.A., Phys. Rev. Lett. 106, 156804 (2011).CrossRefGoogle Scholar
Maune, B.M., Borselli, M.G., Huang, B., Ladd, T.D., Deelman, P.W., Holabird, K.S., Kiselev, A.A., Alvarado-Rodriguez, I., Ross, R.S., Schmitz, A.E., Sokolich, M., Watson, C.A., Gyure, M.F., Hunter, A.T., Nature 481, 344 (2012).CrossRefGoogle Scholar
Shulman, M.D., Dial, O.E., Harvey, S.P., Bluhm, H., Umansky, V., Yacoby, A., Science 336, 202 (2012).CrossRefGoogle Scholar
Shi, Z., Simmons, C.B., Ward, D.R., Prance, J.R., Mohr, R.T., Koh, T.S., Gamble, J.K., Wu, X., Savage, D.E., Lagally, M.G., Friesen, M., Coppersmith, S.N., Eriksson, M.A., Phys. Rev. B 88, 075416 (2013).CrossRefGoogle Scholar
Hanson, R., Kouwenhoven, L.P., Petta, J.R., Tarucha, S., Vandersypen, L.M.K., Rev. Mod. Phys. 79, 1217 (2007).CrossRefGoogle Scholar
Nowack, K.C., Koppens, F.H.L., Nazarov, Y.V., Vandersypen, L.M.K., Science 318, 1430 (2007).CrossRefGoogle Scholar
Pioro-Ladrière, M., Obata, T., Tokura, Y., Shin, Y.-S., Kubo, T., Yoshida, K., Taniyama, T., Tarucha, S., Nat. Phys. 4, 776 (2008).CrossRefGoogle Scholar
Nowack, K.C., Shafiei, M., Laforest, M., Prawiroatmodjo, G.E.D.K., Schreiber, L.R., Reichl, C., Wegscheider, W., Vandersypen, L.M.K., Science 333, 1269 (2011).CrossRefGoogle Scholar
Kane, B., Nature 393, 133 (1998).CrossRefGoogle Scholar
Pla, J.J., Tan, K.Y., Dehollain, J.P., Lim, W.H., Morton, J.J.L., Jamieson, D.N., Dzurak, A.S., Morello, A., Nature 489, 541 (2012).CrossRefGoogle Scholar
Fuechsle, M., Miwa, J.A., Mahapatra, S., Ryu, H., Lee, S., Warschkow, O., Hollenberg, L.C.L., Klimeck, G., Simmons, M.Y., Nat. Nanotechnol. 7, 242 (2012).CrossRefGoogle Scholar
Zwanenburg, F.A., Dzurak, A.S., Morello, A., Simmons, M.Y., Hollenberg, L.C.L., Klimeck, G., Rogge, S., Coppersmith, S.N., Eriksson, M.A., Rev. Mod. Phys. 85, 961 (2013).CrossRefGoogle Scholar
Störmer, H.L., Dingle, R., Gossard, A.C., Wiegmann, W., Sturge, M.D., Solid State Commun. 29, 705 (1979).CrossRefGoogle Scholar
Mooney, P., Mater. Sci. Eng., R 17, 105 (1996).CrossRefGoogle Scholar
Schäffler, F., Semicond. Sci. Technol. 12, 1515 (1997).CrossRefGoogle Scholar
Lu, T.M., Tsui, D.C., Lee, C.-H., Liu, C.W., Appl. Phys. Lett. 94, 182102 (2009).CrossRefGoogle Scholar
Field, M., Smith, C.G., Pepper, M., Ritchie, D.A., Frost, J.E.F., Jones, G.A.C., Hasko, D.G., Phys. Rev. Lett. 70, 1311 (1993).CrossRefGoogle Scholar
Taubert, D., Pioro-Ladrière, M., Schroeer, D., Harbusch, D., Sachrajda, A.S., Ludwig, S., Phys. Rev. Lett. 100, 176805 (2008).CrossRefGoogle Scholar
DiVincenzo, D.P., Bacon, D., Kempe, J., Burkard, G., Whaley, K.B., Nature 408, 339 (2000).CrossRefGoogle Scholar
Levy, J., Phys. Rev. Lett. 89, 147902 (2002).CrossRefGoogle Scholar
Shi, Z., Simmons, C.B., Prance, J.R., Gamble, J.K., Koh, T.S., Shim, Y.-P., Hu, X., Savage, D.E., Lagally, M.G., Eriksson, M.A., Friesen, M., Coppersmith, S.N., Phys. Rev. Lett. 108, 140503 (2012).CrossRefGoogle Scholar
Koh, T.S., Gamble, J.K., Friesen, M., Eriksson, M.A., Coppersmith, S.N., Phys. Rev. Lett. 109, 250503 (2012).CrossRefGoogle Scholar
Ciorga, M., Sachrajda, A.S., Hawrylak, P., Gould, C., Zawadzki, P., Jullian, S., Feng, Y., Wasilweski, Z., Phys. Rev. B 61, 16315 (2000).CrossRefGoogle Scholar
Simmons, C.B., Thalakulam, M., Shaji, N., Klein, L.J., Qin, H., Blick, R., Savage, D.E., Lagally, M.G., Coppersmith, S.N., Eriksson, M.A., Appl. Phys. Lett. 91, 213103 (2007).CrossRefGoogle Scholar
Medford, J., Beil, J., Taylor, J.M., Rashba, E.I., Lu, H., Gossard, A.C., Marcus, C.M., Phys. Rev. Lett. 111, 050501 (2013).CrossRefGoogle Scholar
Schoelkopf, R.J., Wahlgren, P., Kozhevnikov, A.A., Delsing, P., Prober, D.E., Science 280, 1238 (1998).CrossRefGoogle Scholar
Reilly, D.J., Marcus, C.M., Hanson, M.P., Gossard, A.C., Appl. Phys. Lett. 91, 162101 (2007).CrossRefGoogle Scholar
Angus, S.J., Ferguson, A.J., Dzurak, A.S., Clark, R.G., Appl. Phys. Lett. 92, 112103 (2008).CrossRefGoogle Scholar
Gurrieri, T.M., Carroll, M.S., Lilly, M.P., Levy, J.E., “CMOS Integrated Single Electron Transistor Electrometry (CMOS-SET) Circuit Design for Nanosecond Quantum-Bit Read-out,” NANO’08—8th IEEE Conference on Nanotechnology, 2008.CrossRefGoogle Scholar
Ward, D.R., Savage, D.E., Lagally, M.G., Coppersmith, S.N., Eriksson, M.A., Appl. Phys. Lett. 102, 213107 (2013).CrossRefGoogle Scholar
Hanson, R., Witkamp, B., Vandersypen, L.M.K., Willems van Beveren, L.H., Elzerman, J.M., Kouwenhoven, L.P., Phys. Rev. Lett. 91, 196802 (2003).CrossRefGoogle Scholar
Elzerman, J.M., Hanson, R., Willems van Beveren, L.H., Witkamp, B., Vandersypen, L.M.K., Kouwenhoven, L.P., Nature 430, 431 (2004).CrossRefGoogle Scholar
Amasha, S., Maclean, K., Radu, I.P., Zumbühl, D.M., Kastner, M.A., Hanson, M.P., Gossard, A.C., Phys. Rev. Lett. 100, 046803 (2008).CrossRefGoogle Scholar
Johnson, A.C., Petta, J.R., Taylor, J.M., Yacoby, A., Lukin, M.D., Marcus, C.M., Hanson, M.P., Gossard, A.C., Nature 435, 925 (2005).CrossRefGoogle Scholar
Ono, K., Austing, D.G., Tokura, Y., Tarucha, S., Science 297, 1313 (2002).CrossRefGoogle Scholar
Lai, K., Pan, W., Tsui, D.C., Lyon, S., Mühlberger, M., Schäffler, F., Phys. Rev. Lett. 96, 076805 (2006).CrossRefGoogle Scholar
Goswami, S., Slinker, K.A., Friesen, M., McGuire, L.M., Truitt, J.L., Tahan, C., Klein, L.J., Chu, J.O., Mooney, P.M., van der Weide, D.W., Joynt, R., Coppersmith, S.N., Eriksson, M.A., Nat. Phys. 3, 41 (2007).CrossRefGoogle Scholar
Friesen, M., Coppersmith, S.N., Phys. Rev. B 81, 115324 (2010).CrossRefGoogle Scholar
Jiang, Z., Kharche, N., Boykin, T., Klimeck, G., Appl. Phys. Lett. 100, 103502 (2012).CrossRefGoogle Scholar
Shaji, N., Simmons, C.B., Thalakulam, M., Klein, L.J., Qin, H., Luo, H., Savage, D.E., Lagally, M.G., Rimberg, A.J., Joynt, R., Friesen, M., Blick, R.H., Coppersmith, S.N., Eriksson, M.A., Nat. Phys. 4, 540 (2008).CrossRefGoogle Scholar
Liu, H.W., Fujisawa, T., Ono, Y., Inokawa, H., Fujiwara, A., Takashina, K., Hirayama, Y., Phys. Rev. B 77, 073310 (2008).CrossRefGoogle Scholar
Lai, N.S., Lim, W.H., Yang, C.H., Zwanenburg, F.A., Coish, W.A., Qassemi, F., Morello, A., Dzurak, A.S., Sci. Rep. 1, 110 (2011).CrossRefGoogle Scholar
Shi, Z., Simmons, C.B., Prance, J.R., Gamble, J.K., Friesen, M., Savage, D.E., Lagally, M.G., Coppersmith, S.N., Eriksson, M.A., Appl. Phys. Lett. 99, 233108 (2011).CrossRefGoogle Scholar
Borselli, M.G., Eng, K., Croke, E.T., Maune, B.M., Huang, B., Ross, R.S., Kiselev, A.A., Deelman, P.W., Alvarado-Rodriguez, I., Schmitz, A.E., Sokolich, M., Holabird, K.S., Hazard, R.M., Gyure, M.F., Hunter, A.T., Appl. Phys. Lett. 99, 063109 (2011).CrossRefGoogle Scholar
Prance, J.R., Shi, Z., Simmons, C.B., Savage, D.E., Lagally, M.G., Schreiber, L.R., Vandersypen, L.M.K., Friesen, M., Joynt, R., Coppersmith, S.N., Eriksson, M.A., Phys. Rev. Lett. 108, 046808 (2012).CrossRefGoogle Scholar
Yang, C.H., Rossi, A., Ruskov, R., Lai, N.S., Mohiyaddin, F.A., Lee, S., Tahan, C., Klimeck, G., Morello, A., Dzurak, A.S., Nat. Commun. 4, 2069 (2013).CrossRefGoogle Scholar
Nakamura, Y., Pashkin, Y.A., Tsai, J.S., Nature 398, 786 (1999).CrossRefGoogle Scholar
Petta, J.R., Johnson, A.C., Marcus, C.M., Hanson, M.P., Gossard, A.C., Phys. Rev. Lett. 93, 186802 (2004).CrossRefGoogle Scholar
Vion, D., Aassime, A., Cottet, A., Joyez, P., Pothier, H., Urbina, C., Esteve, D., Devoret, M.H., Science 296, 886 (2002).CrossRefGoogle Scholar
Petersson, K.D., Petta, J.R., Lu, H., Gossard, A.C., Phys. Rev. Lett. 105, 246804 (2010).CrossRefGoogle Scholar
Dial, O.E., Shulman, M.D., Harvey, S.P., Bluhm, H., Umansky, V., Yacoby, A., Phys. Rev. Lett. 110, 146804 (2013).CrossRefGoogle Scholar
Bluhm, H., Foletti, S., Neder, I., Rudner, M., Mahalu, D., Umansky, V., Yacoby, A., Nat. Phys. 7, 109 (2010).CrossRefGoogle Scholar
Bluhm, H., Foletti, S., Mahalu, D., Umansky, V., Yacoby, A., Phys. Rev. Lett. 105, 216803 (2010).CrossRefGoogle Scholar
Assali, L.V.C., Petrilli, H.M., Capaz, R.B., Koiller, B., Hu, X., Das Sarma, S., Phys. Rev. B 83, 165301 (2011).CrossRefGoogle Scholar
Büch, H., Mahapatra, S., Rahman, R., Morello, A., Simmons, M.Y., Nat. Commun. 4, 2017 (2013).CrossRefGoogle Scholar
Hu, Y., Churchill, H.O., Reilly, D.J., Xiang, J., Lieber, C.M., Marcus, C.M., Nat. Nanotechnol. 2, 622 (2007).CrossRefGoogle Scholar
Hu, Y., Kuemmeth, F., Lieber, C.M., Marcus, C.M., Nat. Nanotechnol. 7, 47 (2012).CrossRefGoogle Scholar
Maier, F., Kloeffel, C., Loss, D., Phys. Rev. B 87, 161305 (2013).CrossRefGoogle Scholar
Soykal, O.O., Ruskov, R., Tahan, C., Phys. Rev. Lett. 107, 235502 (2011).CrossRefGoogle Scholar
Nadj-Perge, S., Frolov, S.M., Bakkers, E.P.A.M., Kouwenhoven, L.P., Nature 468, 1084 (2010).CrossRefGoogle Scholar
Takakura, T., Pioro-Ladrière, M., Obata, T., Shin, Y.-S., Brunner, R., Yoshida, K., Taniyama, T., Tarucha, S., Appl. Phys. Lett. 97, 212104 (2010).CrossRefGoogle Scholar
Laird, E.A., Taylor, J.M., Divincenzo, D.P., Marcus, C.M., Hanson, M.P., Gossard, A.C., Phys. Rev. B 82, 075403 (2010).CrossRefGoogle Scholar
Granger, G., Gaudreau, L., Kam, A., Pioro-Ladrière, M., Studenikin, S.A., Wasilewski, Z.R., Zawadzki, P., Sachrajda, A.S., Phys. Rev. B 82, 075304 (2010).CrossRefGoogle Scholar
Gaudreau, L., Granger, G., Kam, A., Aers, G.C., Studenikin, S.A., Zawadzki, P., Pioro-Ladrière, M., Wasilewski, Z.R., Sachrajda, A.S., Nat. Phys. 8, 54 (2011).CrossRefGoogle Scholar
Klein, L.J., Lewis, K.L.M., Slinker, K.A., Goswami, S., van der Weide, D.W., Blick, R.H., Mooney, P.M., Chu, J.O., Coppersmith, S.N., Friesen, M., Eriksson, M.A., J. Appl. Phys. 99, 023509 (2006).CrossRefGoogle Scholar
Scott, S.A., Lagally, M.G., J. Phys. D. 40, 75 (2007).CrossRefGoogle Scholar
Paskiewicz, D.M., Tanto, B., Savage, D.E., Lagally, M.G., ACS Nano 5, 5814 (2011).CrossRefGoogle Scholar