Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-22T21:21:55.500Z Has data issue: false hasContentIssue false
  • English
  • Français

Relations Between Basic Nuclear Data and Single-Event Upsets Phenomena

Published online by Cambridge University Press:  31 January 2011

Jan Blomgren ,
Bo Granbom ,
Thomas Granlund  and
Nils Olsson
Get access

Abstract

This article approaches single-event upset (SEU) problems from the standpoint of experimental nuclear physics, with a focus on certain neutron experiments and neutron data essential for SEU studies. A review is given of some research programs, both basic and applied, that are strongly motivated by SEU applications. Some specific examples are presented from the The (short for Theodor) Svedberg Laboratory (TSL) in Uppsala, Sweden: First, using the quasi-monoenergetic neutron beam, SEU cross sections (of chips) are measured over the neutron energy range of 20–150 MeV. Data from the same technology generation, in general, can be fitted into a simple curve. Second, the particle origins of SEUs are discussed from the framework of neutron–nucleus spallation reactions.

Keywords

microelectronicsnuclear datasingle-event upsets
Type
Research Article
Information
MRS Bulletin , Volume 28 , Issue 2: Single-Event Upsets in Microelectronics , February 2003 , pp. 121 - 125
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.IBM J. Res. Develop. 40 (1) (1996).Google Scholar
2.Olsen, J., Becher, P.E., Fynbo, P.B., Raaby, P., and Schultz, J., IEEE Trans. Nucl. Sci. 40 (1993) p. 74.CrossRefGoogle Scholar
3.Taber, A. and Normand, E., IEEE Trans. Nucl. Sci. 40 (1993) p. 120.CrossRefGoogle Scholar
4.Normand, E., Oberg, D.L., Wert, J.L., Ness, J.D., Majewski, P.P., Wender, S.A., and Gavron, A., IEEE Trans. Nucl. Sci. 41 (1994) p. 2203.CrossRefGoogle Scholar
5.Gossett, C.A., Hughlock, B.W., Katoozi, M., LaRue, G.S., and Wender, S.A., IEEE Trans. Nucl. Sci. 40 (1993) p. 1845.CrossRefGoogle Scholar
6.Normand, E., Oberg, D.L., Wert, J.L., Majewski, P.P., Woffinden, G.A., Satoh, S., Sasaki, K., Tverskoy, M.G., Miroshkin, V.V., Goleminov, N., Wender, S.A., and Gavron, A., IEEE Trans. Nucl. Sci. 42 (1995) p. 1815.CrossRefGoogle Scholar
7.Sims, A.J., Dyer, C.S., Peerless, C.L., Johansson, K., Pettersson, H., and Farren, J.E., IEEE Trans. Nucl. Sci. 41 (1994) p. 2361.CrossRefGoogle Scholar
8.Tang, H.H.K., IBM J. Res. Develop. 40 (1996) p. 91.CrossRefGoogle Scholar
9.Ziegler, J.F., IBM J. Res. Develop. 40 (1996) p. 19.CrossRefGoogle Scholar
10.Normand, E. and Baker, T.J., IEEE Trans. Nucl. Sci. 40 (1993) p. 1484.CrossRefGoogle Scholar
11.Tang, H.H.K., Srinivasan, G.R., and Azziz, N., Phys. Rev. C 42 (1990) p. 1598.CrossRefGoogle Scholar
12.Romero, J.L., Tang, H.H.K., Morrissey, D.J., Fauerbach, M., Pfaff, R., Powell, C.F., Sherrill, B.M., Brady, F.P., Cebra, D.A., Chance, J., Kintner, J.C., and Osborne, J.H., in Proc. 14th Int. Conf. on Application of Acclerators in Research and Industry, Vol. 392, edited by Duggan, J.L. and Morgan, I.L. (American Institute of Physics, College Park, MD, 1997) p. 655.Google Scholar
13.Johansson, K., Dyreklev, P., Granbom, B., Olsson, N., Blomgren, J., and Renberg, P.-U., IEEE Trans. Nucl. Sci. 45 (1998) p. 2519.CrossRefGoogle Scholar
14.Condé, H., Hultqvist, S., Olsson, N., Rönnqvist, T., Zorro, R., Blomgren, J., Tibell, G., HÅkansson, A., Jonsson, O., Lindholm, A., Nilsson, L., Renberg, P.-U., Brockstedt, A., Ekström, P., Österlund, M., Brady, F.P., and Szeflinski, Z., Nucl. Instrum. Methods Phys. Res., Sect. A 292 (1990) p. 121.CrossRefGoogle Scholar
15.Klug, J., Blomgren, J., Atac, A., Bergenwall, B., Dangtip, S., Elmgren, K., Johansson, C., Olsson, N., Pomp, S., Prokofiev, A., Rahm, J., Tippawan, U., Jonsson, O., Nilsson, L., Renberg, P.-U., Nadel Turonski, P., Ringbom, A., Oberstedt, A., Tovesson, F., Blideanu, V., Le Brun, C., Lecolley, J.-F., Lecolley, F.-R., Louvel, M., Marie, N., Schweitzer, C., Varignon, C., Eudes, Ph., Haddad, F., Kerveno, M., Kirchner, T., Lebrun, C., Stuttgé, L., Slypen, I., Smirnov, A., Michel, R., Neumann, S., and Herpers, U., Nucl. Instrum. Methods A 489 (2002) p. 282.CrossRefGoogle Scholar
16.Dangtip, S., Atac, A., Bergenwall, B., Blomgren, J., Elmgren, K., Johansson, C., Klug, J., Olsson, N., Alm Carlsson, G., Söderberg, J., Jonsson, O., Nilsson, L., Renberg, P.-U., Nadel Turonski, P., Le Brun, C., Lecolley, F.-R., Lecolley, J.-F., Varignon, C., Eudes, Ph., Haddad, F., Kerveno, M., Kirchner, T., and Lebrun, C., Nucl. Instrum. Methods A 452 (2000) p. 484.CrossRefGoogle Scholar
17.Tippawan, U. (private communication).Google Scholar
18.Sanderson, C. and Dyer, C. (private communication).Google Scholar
19.Srinivasan, G.R., Tang, H.K., and Murley, P.C., IEEE Trans. Nucl. Sci. 41 (1994) p. 2063.CrossRefGoogle Scholar
20.Ziegler, J.F. and Lanford, W.A., Science 206 (1979) p. 776.CrossRefGoogle Scholar
21.Ziegler, J.F., Biersack, J.P., and Littmark, U., The Stopping and Range of Ions in Solids (Perga-mon Press, New York, 1985).Google Scholar
22.Chadwick, M.B., Barschall, H.H., Caswell, R.S., DeLuca, P.M. Jr, Hale, G.M., Jones, D.T.L., Mac Farlane, R.E., Meulders, J.P., Schuhmacher, H., Schrewe, U.J., Wambersie, A., and Young, P.G., Med. Phys. 26 (1999) p. 974; Nuclear Data for Neutron and Proton Radiotherapy and for Radiation Protection, ICRU Report 63 (International Commission on Radiation Units and Measurements, Bethesda, MD, 2000).CrossRefGoogle Scholar
23.Edmonds, L.D., IEEE Trans-Nucli Sci. 38 (2) (1991) p. 828.CrossRefGoogle Scholar
24.Murin, Y. (private communication).Google Scholar