Raman Measurements in Silicon Nanowires Reveal the Diameter Dependence of Phonon Confinement

Tao Xu

doi:10.1557/mrs2005.88

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Raman Measurements in Silicon Nanowires Reveal the Diameter Dependence of Phonon Confinement

Published online by Cambridge University Press: 31 January 2011

Tao Xu

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Type: Research/Researchers
Information: MRS Bulletin , Volume 30 , Issue 4: Advances in Silicon Carbide Electronics , April 2005 , pp. 266 - 267

DOI: https://doi.org/10.1557/mrs2005.88 [Opens in a new window]
Copyright: Copyright © Materials Research Society 2005

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Raman Measurements in Silicon Nanowires Reveal the Diameter Dependence of Phonon Confinement

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