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Observation of Vortices in Superconductors

Published online by Cambridge University Press:  29 November 2013

J.E. Bonevich ,
K. Harada ,
T. Matsuda  and
A. Tonomura
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Extract

Electron holography was originally proposed as a means of improving the resolution of the transmission electron microscope (TEM). And within the last decade dramatic improvements in coherent field-emission electron sources, coupled with TEM instrumentation, have allowed the promise of holography to come to fruition. These improvements in TEM resolution notwithstanding, it has been the application of holography techniques and coherent-beam imaging to the investigation of magnetic and electric fields that has sparked the interest of materials scientists. Electron holography is a unique tool for probing phenomena in the microscopic world because all the information about the object is contained in the hologram (both the electron wave's amplitude and phase), whereas conventional microscopy records only the intensity. It is in this sensitivity to the phase that materials scientists can observe the true potential of electron holography.

Electromagnetic phenomena in a wide range of materials systems have been observed via electron holography; domain structures in magnetic particles and electric fields in p-n junctions are just two examples. Furthermore, fundamental physical properties, such as the existence of the vector potential predicted by Aharonov-Bohm (the AB effect), have been conclusively demonstrated by electron holography. For more information, interested readers are referred to several reviews of electron holography.

Type
Materials Science in the Electron Microscope
Information
MRS Bulletin , Volume 19 , Issue 6 , June 1994 , pp. 47 - 50
Copyright
Copyright © Materials Research Society 1994

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References

1.Tonomura, A., Matsuda, T., Endo, J., Todokoro, H., and Komoda, T., J. Electr. Microsc. 28 (1979) p. 1.Google Scholar
2.Tonomura, A., Matsuda, T., Endo, J., Arii, T., and Mihama, K., Phys. Rev. B 34 (1986) p. 3997.CrossRefGoogle Scholar
3.Frabboni, S., Matteucci, G., and Pozzi, G., Ultramicroscopy 23 (1987) p. 29.CrossRefGoogle Scholar
4.Aharonov, Y. and Bohm, D., Phys. Rev. 115 (1959) p. 485.CrossRefGoogle Scholar
5.Tonomura, A., Osakabe, N., Matsuda, T., Kawasaki, K., Endo, J., Yano, S., and Yamada, H., Phys. Rev. Lett. 56 (1986) p. 792.CrossRefGoogle Scholar
6.Tonomura, A., Electron Holography (Springer, Heidelberg, 1993).CrossRefGoogle Scholar
7.Missiroli, G.E., Pozzi, G., and Valdrè, U., J. Phys. E. 14 (1981) p. 649.CrossRefGoogle Scholar
8.Harada, K., Matsuda, T., Bonevich, J., Igarashi, M., Kondo, S., Pozzi, G., and Kawabe, U., and Tonomura, A., Nature 360 (1992) p. 51.CrossRefGoogle Scholar
9.Bonevich, J.E., Harada, K., Kasai, H., Matsuda, T., Yoshida, T., Pozzi, G., and Tonomura, A., Phys. Rev. Lett. 70 (1993) p. 2952.CrossRefGoogle Scholar
10.Harada, K., Kasai, H., Matsuda, T., Bonevich, J., Yoshida, T., Kawabe, U., and Tonomura, A., Phys. Rev. Lett. 71 (1993) p. 3371.CrossRefGoogle Scholar
11.Müller, K.A., Takashige, M., and Bednorz, J.G., Phys. Rev. Lett. 58 (1987) p. 1143.CrossRefGoogle Scholar
12.Yeshurun, Y. and Malozemoff, A.P., Phys. Rev. Lett. 60 (1988) p. 2022.CrossRefGoogle Scholar
13.Nelson, D.R., Phys. Rev. Lett. 60 (1988) p. 1973.CrossRefGoogle Scholar
14.Kawasaki, T., Matsuda, T., Endo, J., and Tonomura, A., Jpn. J. Appl. Phys. 29 (1990) p. L508.CrossRefGoogle Scholar
15.Migliori, A., Pozzi, G., and Tonomura, A., Ultramicroscopy 49 (1993) p. 87.CrossRefGoogle Scholar
16.Bonevich, J.E., Harada, K., Kasai, H., Matsuda, T., Yoshida, T., Pozzi, G., and Tonomura, A., Phys. Rev. B 49 (1994) p. 6800.CrossRefGoogle Scholar