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Nonpolar/Semipolar GaN Technology for Violet, Blue, and Green Laser Diodes

Published online by Cambridge University Press:  31 January 2011

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Abstract

To achieve 520–532 nm green laser diodes (LDs), nonpolar and semipolar nitrides have attracted much attention because their usage leads to the elimination of the quantum-confined Stark effect and higher optical gains in this wavelength region. Since the breakthrough in the homoepitaxial growth technology for them, many nonpolar m -plane devices such as mW-class blue light-emitting diodes, violet 405 nm LDs, blue 460 nm LDs, and blue-green LDs beyond 490 nm have been announced. Advantages such as small blueshift and high slope efficiency (high output power to injected current ratio) have been confirmed for the first time in m -plane LDs beyond the blue region. On the other hand, the semipolar plane is also a candidate for green LDs. The pulsed operation of semipolar (1011) and (1122) violet LDs and lasing for a (1122) LD at 514 nm by optical pumping also have been reported. Such rapid progress in this research field will be reviewed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

1Nakamura, S., Senoh, M., Nagahama, S., Iwasa, N., Yamada, T., Matsushita, T., Kiyoku, H., Sugimoto, Y., Jpn. J. Appl. Phys. 35, L74 (1996).CrossRefGoogle Scholar
2Nakamura, S., Pearton, S., Fasol, G., The Blue Laser Diode, 2nd Edition (Springer-Verlag, Berlin, 2000).Google Scholar
3Martin, G., Botchkarev, A., Rockett, A., Morkoç, H., Appl. Phys. Lett. 68, 2541 (1996).Google Scholar
4Bernardini, F., Fiorentini, V., Vanderbilt, D., Phys. Rev. B 56, R10024 (1997).CrossRefGoogle Scholar
5Chichibu, S., Azuhata, T., Sota, T., Nakamura, S., Appl. Phys. Lett. 69, 4188 (1996).CrossRefGoogle Scholar
6Takeuchi, T., Sota, S., Katsuragawa, M., Komori, M., Takeuchi, H., Amano, H., Akasaki, I., Jpn. J. Appl. Phys. 36, L382 (1997).CrossRefGoogle Scholar
7Kojima, K., Funato, M., Kawakami, Y., Nagahama, S., Mukai, T., Braun, H., Schwarz, U.T., Appl. Phys. Lett. 89, 241127 (2006).Google Scholar
8Queren, D., Avramescu, A., Brüderl, G., Breidenassel, A., Schillgalies, M., Lutgen, S., Strauβ, U., Appl. Phys. Lett. 94, 081119 (2009).CrossRefGoogle Scholar
9Takeuchi, T., Amano, H., Akasaki, I., Jpn. J. Appl. Phys. 39, 413 (2000).CrossRefGoogle Scholar
10Craven, M.D., Lim, S.H., Wu, F., Speck, J.S., DenBaars, S.P., Appl. Phys. Lett. 81, 469 (2002).CrossRefGoogle Scholar
11Gardner, N.F., Kim, J.C., Wierer, J.J., Shen, Y.C., Krames, M.R., Appl. Phys. Lett. 86, 111101 (2005).CrossRefGoogle Scholar
12Haskell, B.A., Nakamura, S., DenBaars, S.P., Speck, J.S., Phys. Status Solidi B 244, 2847 (2007).CrossRefGoogle Scholar
13Chakraborty, A., Haskell, B.A., Keller, S., Speck, J.S., DenBaars, S.P., Nakamura, S., Mishra, U.K., Appl. Phys. Lett. 85, 5143 (2004).CrossRefGoogle Scholar
14Chakraborty, A., Haskell, B.A., Keller, H.S., Speck, J.S., DenBaars, S.P., Nakamura, S., Mishra, U.K., Jpn. J. Appl. Phys. 44, L173 (2005).CrossRefGoogle Scholar
15Funato, M., Ueda, M., Kawakami, Y., Narukawa, Y., Kosugi, T., Takahashi, M., Mukai, T., Jpn. J. Appl. Phys. 45, L659 (2006).CrossRefGoogle Scholar
16Okamoto, K., Ohta, H., Nakagawa, D., Sonobe, M., Ichihara, J., Takasu, H., Jpn. J. Appl. Phys. 45, L1197 (2006).CrossRefGoogle Scholar
17Chichibu, S.F., Yamaguchi, H., Zhao, L., Kubota, M., Okamoto, K., Ohta, H., Appl. Phys. Lett. 92, 091912 (2008); erratum 93, 129901 (2008).CrossRefGoogle Scholar
18Tyagi, A., Zhong, H., Fellows, N.N., Iza, M., Speck, J.S., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 46, L129 (2007).CrossRefGoogle Scholar
19Iso, K., Yamada, H., Hirasawa, H., Fellows, N., Saito, M., Fujito, K., DenBaars, S.P., Speck, J.S., Nakamura, S., Jpn. J. Appl. Phys. 46, L960 (2007).CrossRefGoogle Scholar
20Okamoto, K., Ohta, H., Chichibu, S.F., Ichihara, J., Takasu, H., Jpn. J. Appl. Phys. 46, L187 (2007).CrossRefGoogle Scholar
21Schmidt, M.C., Kim, K.C., Farrell, R.M., Feezell, D.F., Cohen, D.A., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 46, L190 (2007).Google Scholar
22Feezell, D.F., Schmidt, M.C., Farrell, R.M., Kim, K.C., Saito, M., Fujito, K., Cohen, D.A., Speck, J.S., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 46, L284 (2007).Google Scholar
23Farrell, R.M., Feezell, D.F., Schmidt, M.C., Haeger, D.A., Kelchner, K.M., Iso, K., Yamada, H., Saito, M., Fujito, K., Cohen, D.A., Speck, J.S., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 46, L761 (2007).CrossRefGoogle Scholar
24Tyagi, A., Zhong, H., Chung, R.B., Feezell, D.F., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Jpn. J. Appl. Phys. 46, L444 (2007).Google Scholar
25Asamizu, H., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Appl. Phys. Express 1, 091102 (2008).CrossRefGoogle Scholar
26Masui, H., Chakraborty, A., Haskell, B.A., Mishra, U.K., Speck, J.S., Nakamura, S., DenBaars, S.P., Jpn. J. Appl. Phys. 44, L1329 (2005).CrossRefGoogle Scholar
27Nakagawa, S., Tsujimura, H., Okamoto, K., Kubota, M., Ohta, H., Appl. Phys. Lett. 91, 171110 (2007).CrossRefGoogle Scholar
28Ghosh, S., Waltrereit, P., Brandt, O., Grahn, H.T., Ploog, K.H., Phys. Rev. B 65, 075202 (2002).CrossRefGoogle Scholar
29Onuma, T., Okatomo, K., Ohta, H., Chichibu, S.F., Appl. Phys. Lett. 93, 091112–1 (2008).Google Scholar
30Park, S.H., Ahn, D., Appl. Phys. Lett. 90, 013505 (2007).CrossRefGoogle Scholar
31Park, S.H., Ahn, D., IEEE J. Quantum Electron. 43, 1175 (2007).Google Scholar
32Yamaguchi, A., Phys. Status Solidi C 5, 2329 (2008).CrossRefGoogle Scholar
33Okamoto, K., Tanaka, T., Kubota, M., Ohta, H., Jpn. J. Appl. Phys. 46, L820 (2007).Google Scholar
34Kubota, M., Okamoto, K., Tanaka, T., Ohta, H., Appl. Phys. Express 1, 011102 (2008).CrossRefGoogle Scholar
35Tsuda, Y., Ohta, M., Vaccaro, P.O., Ito, S., Hirukawa, S., Kawaguchi, Y., Fujishiro, Y., Takahira, Y., Ueda, Y., Takakura, T., Yuasa, T., Appl. Phys. Express 1, 011104 (2008).CrossRefGoogle Scholar
36Kubota, M., Okamoto, K., Tanaka, T., Ohta, H., Appl. Phys. Lett. 92, 011920 (2008).CrossRefGoogle Scholar
37Okamoto, K., Tanaka, T., Kubota, M., Appl. Phys. Express 1, 072201 (2008).Google Scholar
38Tyagi, A., Lin, Y.D., Cohen, D.A., Saito, M., Fujito, K., Speck, J.S., DenBaars, S.P., Nakamura, S., Appl. Phys. Express 1, 091103 (2008).CrossRefGoogle Scholar
39Chichibu, S.F., Uedono, A., Onuma, T., Haskell, B.A., Chakraborty, A., Koyama, T., Fini, P.T., Keller, S., DenBaars, S.P., Speck, J.S., Mishra, U.K., Nakamura, S., Yamaguchi, S., Kamiyama, S., Amano, H., Akasaki, I., Han, J., Sota, T., Nat. Mater. 5, 810 (2006).CrossRefGoogle Scholar
40Okamoto, K., Kashiwagi, J., Tanaka, T., Kubota, M., Appl. Phys Lett. 94, 071105 (2009).CrossRefGoogle Scholar
41Nagaham, S., Yanamoto, T., Sano, M., Mukai, T., Appl. Phys. Lett. 79 1948 (2001).CrossRefGoogle Scholar