Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T05:21:45.676Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoscale mapping of plasmons, photons, and excitons

Published online by Cambridge University Press:  13 January 2012

Mathieu Kociak  and
Javier García de Abajo
Mathieu Kociak
Affiliation:
Laboratoire de Physique des Solides, Bâtiment 510, CNRS/UMR8502, Université Paris; [email protected]
Javier García de Abajo
Affiliation:
IQFR-CSIC, Serrano 119, 28006Madrid, Spain; [email protected]
Get access

Abstract

The possibility has recently been reported of using spatially resolved electron energy loss spectroscopy and cathodoluminescence in scanning (transmission) electron microscopes to probe optical excitations—plasmons, photons, excitons—at a scale that could not have been considered only a few years ago. This allows these excitations to be studied at the relevant scale for the characterization of novel materials with potential applications in nanophotonics and nanoplasmonics. This review aims at describing the state-of-the art experimental and theoretical techniques of this emerging field and its major uses and applications.

Keywords

Electron energy loss spectroscopy (EELS)scanning transmission electron microscopy (STEM)luminescence, optical properties
Type
Research Article
Information
MRS Bulletin , Volume 37 , Issue 1: Spectroscopic imaging in electron microscopy , January 2012 , pp. 39 - 46
Copyright
Copyright © Materials Research Society 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Batson, P.E., Phys. Rev. Lett. 49, 936 (1982).CrossRefGoogle Scholar
2.Ouyang, F., Batson, P.E., Isaacson, M., Phys. Rev. B 46, 15421 (1992).CrossRefGoogle Scholar
3.Khan, I.R., Cunningham, D., Lazar, S., Graham, D., Smith, W.E., McComb, D.W., Faraday Discuss. 132, 171 (2006).CrossRefGoogle Scholar
4.Yamamoto, N., Araya, K., de Abajo, F.J.G., Phys. Rev. B 64, 205419 (2001).CrossRefGoogle Scholar
5.Pennycock, S.J., Howie, A., Philos. Mag. A 41, 809 (1979).CrossRefGoogle Scholar
6.Strunk, H.P., Albrecht, M., Scheel, H., J. Microsc. (Oxford) 224, 79 (2006).CrossRefGoogle Scholar
7.Jahn, U., Ristic, J., Calleja, E., Appl. Phys. Lett. 90, 161117 (2007).CrossRefGoogle Scholar
8.Nelayah, J., Stéphan, O., Kociak, M., Garcia de Abajo, F.J., Henrard, L., Pastoriza-Santos, I., Liz-Marzan, L.M., Colliex, C., Microsc. Microanal. 13, 144 (2007).CrossRefGoogle Scholar
9.Bosman, M., Keast, V.J., Watanabe, M., Maaroof, A.I., Cortie, M.B., Nanotechnology 18, 165505 (2007).CrossRefGoogle Scholar
10.Zagonel, L.F., Mazzucco, S., Tencé, M., March, K., Bernard, R., Laslier, B., Jacopin, G., Tchernycheva, M., Rigutti, L., Julien, F.H., Somguang, R., Kociak, M., Nano Lett. 11, 568 (2011).CrossRefGoogle Scholar
11.Garcia de Abajo, F.J., Rev. Mod. Phys. 82, 209 (2010).CrossRefGoogle Scholar
12.Kociak, M., Stéphan, O., Walls, M.G., Colliex, C., Spatially Resolved EELS: The Spectrum-Imaging Technique and Its Applications (Springer, NY, 2011), C. 4, p. 163.Google Scholar
13.Colliex, C., J. Electron Microsc. 60, S161 (2011).Google Scholar
14.Jeanguillaume, C., Colliex, C., Ultramicroscopy 28, 252 (1989).CrossRefGoogle Scholar
15.Egerton, R., Electron Energy Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986).Google Scholar
16.Nelayah, J., Gu, J., Sigle, W., Koch, C.T., Pastoriza-Santos, I., Liz-Marzan, L.M., van Aken, P.A., Opt. Lett. 34, 1003 (2009).CrossRefGoogle Scholar
17.Schaffer, B., Grogger, W., Kothleitner, G., Hofer, F., Ultramicroscopy 110, 1087 (2010).CrossRefGoogle Scholar
18.Schaffer, B., Kothleitner, G., Grogger, W., Ultramicroscopy 106, 1129 (2006).CrossRefGoogle Scholar
19.Vesseur, E.J.R., de Waele, R., Kuttge, M., Polman, A., Nano Lett. 7, 2843 (2007).CrossRefGoogle Scholar
20.Ferrell, T.L., Echenique, P.M., Phys. Rev. Lett. 55, 1526 (1985).CrossRefGoogle Scholar
21.Kociak, M., Stéphan, O., Henrard, L., Charbois, V., Rothschild, A., Tenne, R., Colliex, C., Phys. Rev. Lett. 8707, 075501 (2001).CrossRefGoogle Scholar
22.Taverna, D., Kociak, M., Charbois, V., Henrard, L., Stéphan, O., Colliex, C., J. Electron. Spectrosc. Relat. Phenom. 129, 293 (2003).CrossRefGoogle Scholar
23.de Abajo, F.J.G., Pattantyus-Abraham, A.G., Zabala, N., Rivacoba, A., Wolf, M.O., Echenique, P.M., Phys. Rev. Lett. 91, 143902 (2003).CrossRefGoogle Scholar
24.Arenal, R., Stéphan, O., Kociak, M., Taverna, D., Loiseau, A., Colliex, C., Phys. Rev. Lett. 95, 127601 (2005).CrossRefGoogle Scholar
25.García de Abajo, F.J., Aizpurua, J., Phys. Rev. B 56, 15873 (1997).CrossRefGoogle Scholar
26.Henrard, L., Lambin, P., J. Phys. B: At. Mol. Opt. Phys. 29, 5127 (1996).CrossRefGoogle Scholar
27.Garcia de Abajo, F.J., Kociak, M., New J. Phys. 10, 073035 (2008).CrossRefGoogle Scholar
28.Kuttge, M., Vesseur, E.J.R., Polman, A., Appl. Phys. Lett. 94, 183104 (2009).CrossRefGoogle Scholar
29.Garcia de Abajo, F.J., Kociak, M., Phys. Rev. Lett. 100, 106804 (2008).CrossRefGoogle Scholar
30.Boudarham, G., PhD thesis, Université Pierre et Marie Curie‒Paris VI (2011).Google Scholar
31.Garcia de Abajo, F.J., Howie, A., Phys. Rev. Lett. 80, 5180 (1998).CrossRefGoogle Scholar
32.Geuquet, N., Henrard, L., Ultramicroscopy 110, 1075 (2010).CrossRefGoogle Scholar
33.Rossouw, D., Couillard, M., Vickery, J., Kumacheva, E., Botton, G.A., Nano Lett. 11, 1499 (2011).CrossRefGoogle Scholar
34.Gu, L., Sigle, W., Koch, C.T., Ögüt, B., van Aken, P.A., Talebi, N., Vogelgesang, R., Mu, J.L., Wen, X.G., Mao, J., Phys. Rev. B 83, 195433 (2011).CrossRefGoogle Scholar
35.Novotny, L., van Hulst, N., Nat. Photonics 5, 83 (2011).CrossRefGoogle Scholar
36.Dorfmüller, J., Vogelgesang, R., Weitz, R., Rockstuhl, C., Etrich, C., Pertsch, T., Lederer, F., Kern, K., Nano Lett. 9, 2372 (2009).CrossRefGoogle Scholar
37.Nelayah, J., Kociak, M., Stéphan, O., Geuquet, N., Henrard, L., de Abajo, F.J.G., Pastoriza-Santos, I., Liz-Marzan, L.M., Colliex, C., Nano Lett. 10, 902 (2010).CrossRefGoogle Scholar
38.Dolling, G., Wegener, M., Soukoulis, C.M., Linden, S., Opt. Lett. 32, 53 (2007).CrossRefGoogle Scholar
39.Boudarham, G., Feth, N., Myroshnychenko, V., Linden, S., García de Abajo, J., Wegener, M., Kociak, M., Phys. Rev. Lett. 105, 255501 (2010).CrossRefGoogle Scholar
40.Koh, A.L., Fernandez-Dominguez, A.I., McComb, D.W., Maier, S.A., Yang, J.K.W., Nano Lett. 11, 1323 (2011).CrossRefGoogle Scholar
41.Zuo, J., Kim, M., O’Keeffe, M., Spence, J., Nature 401, 49 (1999).CrossRefGoogle Scholar
42.Lemay, S.G., Janssen, J.W., van den Hout, M., Mooij, M., Bronikowski, M.J., Willis, P.A., Smalley, R.E., Kouwenhoven, L.P., Dekker, C., Nature 412, 617 (2001).CrossRefGoogle Scholar
43.Chu, M., Myroshnychenko, V., Chen, C., Deng, J., Mou, C., Garcia de Abajo, F., Nano Lett. 9, 399 (2009).CrossRefGoogle Scholar
44.Mazzucco, S., Stéphan, O., Colliex, C., Pastoriza-Santos, I., Liz-Marzan, L.M., Garcia de Abajo, F.J., Kociak, M., Eur. Phys. J. Appl. Phys. 54, 33512 (2011).CrossRefGoogle Scholar
45.Hao, F., Nehl, C.L., Hafner, J.H., Nordlander, P., Nano Lett. 7, 729 (2007).CrossRefGoogle Scholar
46.Rodriguez-Lorenzo, L., Alvarez-Puebla, R.A., Pastoriza-Santos, I., Mazzucco, S., Stéphan, O., Kociak, M., Liz-Marzan, L.M., de Abajo, F.J.G., J. Am. Chem. Soc. 131, 4616 (2009).CrossRefGoogle Scholar
47.Takeuchi, K., Yamamoto, N., Opt. Express 19, 12365 (2011).CrossRefGoogle Scholar
48.Cha, J., Yu, Z., Smith, E., Couillard, M., Fan, S., Muller, D., Phys. Rev. B 81, 113102 (2010).CrossRefGoogle Scholar
49.Gu, L., Sigle, W., Koch, C.T., Nelayah, J., Srot, V., van Aken, P.A., Ultramicroscopy 109, 1164 (2009).CrossRefGoogle Scholar
50.Couillard, M., Kociak, M., Stéphan, O., Botton, G.A., Colliex, C., Phys. Rev. B 76, 165131 (2007).CrossRefGoogle Scholar
51.Barwick, B., Flannigan, D.J., Zewail, A.H., Nature 462, 902 (2009).CrossRefGoogle Scholar