Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-29T14:06:15.624Z Has data issue: false hasContentIssue false
  • English
  • Français

Multilayers: A Research Tool for Mechanical Property and Alloy Phase Stability Investigations

Published online by Cambridge University Press:  29 November 2013

A.F. Jankowski
Get access

Extract

The magic of multilayer structures — comprised of a regular repeating pattern of alternating layers that vary in thickness from less than 1 nm to more than several micrometers — is present today in nearly every facet of materials science.

A technological gamut of issues has been approached through the use of multilayer structures. Material systems have been routinely investigated, ranging from simple binary through complex quaternary and including nearly every element of the periodic table. Applications include thin-film semiconductor devices in the form of strained-layer superlattices; protective coatings for improved surface hardness and wear resistance of conventional alloys (tribology); and reflective and transmissive x-ray optical devices. Multilayer structures have also provided an experimental means to investigate the interdiffusion and stability of alloy phases; the relationship between the presence, lack, or variations of crystallinity with magnetism (and most recently superconductivity); and the role of interfaces in adhesion and elastic/plastic behavior.

Type
Technical Feature
Information
MRS Bulletin , Volume 12 , Issue 7 , November 1987 , pp. 80 - 83
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Schuller, I.K. and Homma, H., MRS BULLETIN 12 (3) (1987) p. 18.CrossRefGoogle Scholar
2.Hong, M., J. Metals 39 (6) (1987) p. 26.Google Scholar
3.Peercy, P.S. and Osbourn, G.C., J. Metals 39 (6) p. 14.Google Scholar
4.Barbee, T.W. Jr., in X-Ray Microscopy, edited by Schmahl, G. and Rudolph, D. (Springer Series in Optical Sciences, Vol. 43, Berlin, 1987) p. 144.CrossRefGoogle Scholar
5.Dresselhaus, M.S., MRS BULLETIN 12 (3) (1987) p. 24.CrossRefGoogle Scholar
6.Spaepen, F., Scripta Metall. 20 (1986) p. 441; A.M. Kadin and J.E. Keem, Scripta Metall. 20 (1986) p. 443; J.M. Gibson, Scripta Metall. 20 (1986) p. 451; A.L. Greer, Scripta Metall. 20 (1986) p. 457; G.B. Stephenson, Scripta Metall. 20 (1986) p. 465; T. Tsakalakos, Scripta Metall. 20 (1986) p. 471; and R.C. Cammarata, Scripta Metall. 20 (1986) p. 479.CrossRefGoogle Scholar
7.Baral, D., PhD thesis, Northwestern University, Evanston, 1983.Google Scholar
8.Bunshah, R.F., in Deposition Technologies for Films and Coatings (Noyes Publications, Park Ridge, 1982) p. 1.Google Scholar
9.Guinier, A., X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies (W.H. Freeman & Co., San Francisco, 1963) p. 279.Google Scholar
10.Cahn, J.W., Acta Metall. 10 (1962) p. 179.CrossRefGoogle Scholar
11.Tsakalakos, T., Phd thesis, Northwestern University, Evanston, 1977.Google Scholar
12.Jankowski, A.F., Phd thesis, Rutgers University, New Brunswick, 1984.Google Scholar
13.Speriosu, V.S., Nicolet, M-A., Picraux, S.T., and Biefeld, R.M., Appl. Phys. Lett. 45 (1984) p. 223.CrossRefGoogle Scholar
14.Bunshah, R.F., Movchan, B.A., Doerr, H.J.et al., Thin Solid Films 72 (1980) p. 261; R.F. Bunshah, B.A. Movchan, H.J. Doerr et al., Thin Solid Films 96 (1982) p. 59; R.F. Bunshah, B.A. Movchan, H.J. Doerr et al., Thin Solid Films 97 (1982) p. 215; R.F. Bunshah, B.A. Movchan, H.J. Doerr et al., Thin Solid Films 107 (1983) p. 345; R.F. Bunshah, B.A. Movchan, H.J. Doerr et al., Thin Solid Films 112 (1984) p. 227.CrossRefGoogle Scholar
15.Yang, W.M.C., Tsakalakos, T., and Hilliard, J.E., J. Appl. Phys. 43 (1977) p. 876; T. Tsakalakos, Thin Solid Films 75 (1981) p. 293.CrossRefGoogle Scholar
16.Henein, G.E. and Hilliard, J.E., J. Appl. Phys. 54 (1983) p. 728.CrossRefGoogle Scholar
17.Tsakalakos, T. and Jankowski, A.F., Ann. Rev. Mater. Sci. 16 (1986) p. 293.CrossRefGoogle Scholar
18.Jankowski, A.F. and Tsakalakos, T., J. Appl. Phys. 57 (1985) p. 1835.CrossRefGoogle Scholar
19.Lehoczky, S.L., J. Appl. Phys. 49 (1978) p. 5479.CrossRefGoogle Scholar
20.Baral, D., Ketterson, J.B., and Hilliard, J.E., in Modulated Structure Materials, edited by Tsakalakos, T. (Nijhoff Publishing Co., Dordrecht, 1984) NATO-ASI, Series E Vol. 83, p. 465.CrossRefGoogle Scholar
21.Testardi, L.R., Willens, R.H., Krause, J.T., McWhan, D.B., and Nakahara, S., J. Appl. Phys. 52 (1981) p. 510.CrossRefGoogle Scholar
22.Petersen, K.E. and Guarnieri, C.R., J. Appl. Phys. 50 (1979) p. 6761.CrossRefGoogle Scholar
23.Doerner, M.F. and Nix, W.D., J. Mater. Res. 1 (1986) p. 601.CrossRefGoogle Scholar
24.Helmersson, U., Todorova, S., Markest, L., Barnett, S., Sundgren, J.E., and Greene, J.E., Thin Solid Films (in press).Google Scholar
25.Matthews, J.W. and Blakeslee, A.E., J. of Cryst. Growth 27 (1974) p. 118; J.W. Matthews and A.E. Blakeslee, J. of Cryst. Growth 29 (1975) p. 273; J.W. Matthews and A.E. Blakeslee, J. of Cryst. Growth 32 (1976) p. 265; A.E. Blakeslee and C.F. Aliotta, J. Res. Dev. 14 (1970) p. 6867.Google Scholar
26.Gourley, P.L., Drummond, T.J., and Doyle, B.L., Appl. Phys. Lett. 49 (1986) p. 1101.CrossRefGoogle Scholar
27.Koehler, J.S., Phys. Rev. B 2 (1970) p. 547.CrossRefGoogle Scholar
28.Khachaturyan, A.G., Theory of Structural Transformations in Solids (Wiley, New York, 1983).Google Scholar
29.Jankowski, A.F. and Tsakalakos, T., in Alloy Phase Stability, edited by Gonis, A. and Stocks, G.M., NATO-ASI, Greece, 1987 (to be published).Google Scholar
30.DuMond, J.W.M. and Youtz, J.P., J. Appl. Phys. 11 (1940) p. 357.CrossRefGoogle Scholar
31.Poerschke, R., Wagner, W., and Wollenberger, H., J. Phys. F 16 (1986) p. 421.CrossRefGoogle Scholar
32.Gust, W., Wachtel, E., Frühauf, B., and Predel, B., in Phase Transformations in Solids, edited by Tsakalakos, T. (Mater. Res. Soc. Symp. Proc. 21, Elsevier, New York, 1984) p. 461.Google Scholar
33.Moama, K., Sutor, H., and Oikowa, H., Nippon Kinz. Gakk. 28 (1964) p. 188.Google Scholar
34.Cook, H.E. and Hilliard, J.E., Appl. Phys. Lett. 8 (1966) p. 24; J. Appl. Phys. 40 (1969) p. 2191; E. Philofsky and J.E. Hilliard, J. Appl. Phys. 40 (1969) p. 2198; W.M. Paulson and J.E. Hilliard, J. Appl. Phys. 40 (1969) 48 (1977) p. 2117; T. Tsakalakos, Thin Solid Films 86 (1981) p. 79.CrossRefGoogle Scholar
35.Cahn, J.W., Acta Metall. 9 (1961) p. 795.CrossRefGoogle Scholar
36.Barbee, T.W. Jr., in Physics, Fabrication and Applications of Multilayered Structures, NATO-ASI, France, 1987 (to be published).Google Scholar