Hostname: page-component-78c5997874-fbnjt Total loading time: 0 Render date: 2024-11-05T06:40:28.484Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure and Fracture Resistance of Metal/Ceramic Interfaces

Published online by Cambridge University Press:  29 November 2013

A.G. Evans  and
M. Rühle
Get access

Extract

Metal-ceramic interfaces play an important, sometimes controlling, role in composites, multilayer substrates, capacitors, electron tubes, and automotive power sources. Often bonding and adhesion between the ceramic and metal are critical to the components' performance. Interface geometry and chemistry play a dominant role in determining the mechanical and electrical integrity of composites. Furthermore, unique properties may be developed from multilayer ceramic-metal structures.

Systematic studies of metal-ceramic interfaces started in the early 1960s. Such studies were directed toward identifying general rules that govern bonding and interface behavior both theoretically and experimentally, including the thermodynamics of interfacial reactions and crys-tallographic relationships, and toward evaluating atomistic structure at the interface. This article summarizes results concerning the interrelation between atomistic structure and the macroscopic fracture resistance of metal-ceramic interfaces. More details are published in a recent conference proceedings.

Determining atomistic structures of metal-ceramics interfaces is, in general, complicated since the two materials that have to be matched exhibit different atoms (ions) and possess different crystal symmetries, crystal structures, and lattice parameters. The adjacent lattices are not commensurate, the two different structures can be described as being just quasiperiodic. However, examples exist where the lattice mismatch is small, and both components possess the same lattice symmetry. Ag/MgO and Nb/Al2O3 interfaces are examples that serve as model systems for experimental studies as well as theoretical calculations. The interfaces can be formed either by diffusion-bonding, internal oxidation, or epitaxial film growth.

Type
Interfaces Part II
Information
MRS Bulletin , Volume 15 , Issue 10 , October 1990 , pp. 46 - 50
Copyright
Copyright © Materials Research Society 1990

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Metal-Ceramic Interfaces, edited by Rühle, M., Evans, A.G., Ashby, M.F., and Hirth, J.P. (Pergamon Press, Oxford, 1990).Google Scholar
2.Sutton, A.P., Phase Transitions 16/17 (1989) p. 563.CrossRefGoogle Scholar
3.Floriancic, M., Mader, W., Rühle, M. and Turwitt, M., J. de Physique 46 (1985) p. C4–129.Google Scholar
4.Mader, W., Z. Metallkunde 80 (1989) p. 139.Google Scholar
5.Flynn, C.P., in Ref. 1., p. 168.Google Scholar
6.Spence, J.C.H., Experimental High Resolution Electron Microscopy, 2nd edition (Oxford University Press, Oxford, 1988).Google Scholar
7.Mayer, J., Flynn, C.P., and Rühle, M., Ultramicroscopy 33 (1990) in press.CrossRefGoogle Scholar
8.Blöchl, P., Das, G.P., Fischmeister, H.F., and Schönberger, U., in Ref. 1, p. 9.Google Scholar
9.Mader, W. and Rühle, M., Acta Metall. 37 (1988) p. 253.Google Scholar
10.The Reactive Element Effect on High Temperature Oxidation–After Fifty Years, edited by King, W.E. (Trans Tech Publications, Aedermannsdorf, 1989).CrossRefGoogle Scholar
11.Burger, K. and Rühle, M., Ceram. Eng, Sci. Proc. 10 (1989) p. 1549.CrossRefGoogle Scholar
12.Backhaus-Ricoult, M., Ber. Bunsenges. Phys. Chem. 89 (1985) p. 1323.CrossRefGoogle Scholar
13.Trumble, K.P. and Rühle, M., in Ref. 1, p. 144.Google Scholar
14.Evans, A.G. and Hutchinson, J.W., Acta Metall. 37 (1989) p. 909.CrossRefGoogle Scholar
15.Derjaguim, B.J., Recent Advances in Adhesion (Gordon and Breach, New York, 1971) p. 513.Google Scholar
16.Nicholas, M., J. Mater. Sci. 3 (1968) p. 571.CrossRefGoogle Scholar
17.Charalambides, P.G., Lund, J., McMeeking, R.M., and Evans, A.G., J. Appl. Mech. 111 (1989) p. 77.CrossRefGoogle Scholar
18.Evans, A.G., Dalgleish, B.J., Charalambides, P.G., and Rühle, M., Met. Trans., in press.Google Scholar
19.Reimanis, I.E., Dalgleish, B.J., Brahy, M., Rühle, M., and Evans, A.G., Acta Metall., in press.Google Scholar
20.Dingley, D.J., Scanning Electron Microscopy (SEM Inc, A MF O‘Hare, 1984) p. 569.Google Scholar
21.Ungar, T., Mughrabi, H., Rönnpagel, D., and Wilkens, M., Acta Metall. 32 (1984) p. 334.CrossRefGoogle Scholar