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Materials Analysis with High Energy Ion Beams Part II: Channeling and Other Techniques

Published online by Cambridge University Press:  29 November 2013

H-J. Gossmann  and
L.C. Feldman
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Abstract

This article discusses uses of high energy ion beam scattering for materials analysis, including channeling, particle induced x-ray emission (PIXE), and nuclear reaction analysis (NRA). These additional capabilities used in conjunction with RBS equipment provide capabilities for crystalline defect studies and light element detection.

Type
Materials Microanalysis
Information
MRS Bulletin , Volume 12 , Issue 6 , September 1987 , pp. 30 - 34
Copyright
Copyright © Materials Research Society 1987

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References

1.Lindhard, J., Mat. Fys. Medd. Dan. Vid. Selsk. 34 (1965) p. 1.Google Scholar
2.Barrett, J.H., Phys. Rev. B 3 (1971) p. 1527.CrossRefGoogle Scholar
3.Davies, J.A., Denhartog, J., Eriksson, L., and Mayer, J.W., Can. J. Phys. 45 (1967) p. 4053.CrossRefGoogle Scholar
4.Csepregi, L., Mayer, J.W., and Sigmon, T.W., Appl. Phys. Lett. 29 (1976) p. 92.CrossRefGoogle Scholar
5.Feldman, L.C., Augustiniak, W.M., and Merz, J.L., Radiat. Eff. 6 (1970) p. 293.CrossRefGoogle Scholar
6.Andersen, J.U., Chechenin, N.G., and Hua, Zhang Zu, Appl. Phys. Lett. 39 (1981) p. 758.CrossRefGoogle Scholar
7.Bhattacharya, R.S., Pronko, P.P., and Ling, S.C., Appl. Phys. Lett. 42 (1983) p. 880; R.S. Bhattacharya, A.K. Rai, Y.K. Yeo, P.P. Pronko, and Y.S. Park, Nucl. Instrum. Methods 209/210 (1983) p. 637.CrossRefGoogle Scholar
8.Fiory, A.T., Bean, J.C., Feldman, L.C., and Robinson, I.K., J. Appl. Phys. 56 (1984) p. 1227.CrossRefGoogle Scholar
9.Gossmann, H-J., Feldman, L.C., and Gibson, W.M., Surf. Sci. 155 (1985) p. 413; H-J. Gossmann and L.C. Feldman, Phys. Rev. B 6 (1985) p. 32; H-J. Gossmann, Surf. Sci. 179 (1987) p. 453.CrossRefGoogle Scholar
10.der Veen, J.F. van, Surf. Sci. Rep. 5/6 (1985) p. 199.CrossRefGoogle Scholar
11.Turkenburg, W.C., Soszka, W., Saris, F.W., Kersten, H.H., and Colenbrander, B.G., Nucl. Instrum. Methods 132 (1976) p. 587.CrossRefGoogle Scholar
12.Hietel, B., Schulz, F., and Wittmaack, K., Nucl. Instrum. Method Phys. Res. B15 (1986) p. 608; C. Boni, G.M. Braga Marcazzan, E. Caruso, E. Cereda, and P. Pedaelli, Nucl. Instrum. Method Phys. Res., p. 382.CrossRefGoogle Scholar
13.Williams, E.T. and Punyasena, L.W., IEEE Trans. Nucl. Sci. NS-30 (1983) p. 1294.CrossRefGoogle Scholar
14.Przybylowicz, W., Szymczyk, S., and Kajfosz, J., Nucl. Instrum. Methods Phys. Res. B15 (1986) p. 573.CrossRefGoogle Scholar
15.Bird, J.R., Duerden, P., Clayton, E., Wilson, D.J., and Fink, D., Nucl. Instrum. Methods Phys. Res. B15 (1986) p. 651.CrossRefGoogle Scholar
16.Hall, G.S. and Navon, E., Nucl. Instrum. Methods Phys. Res. B15 (1986) p. 629.CrossRefGoogle Scholar
17.Sen, P. and Mehta, G.K., IEEE Trans. Nucl. Sci. NS-30 (1983) p. 1302.CrossRefGoogle Scholar
18.Feldman, L.C. and Picraux, S.T., in Ion Beam Handbook for Material Analysis, edited by Mayer, J.W. and Rimini, E. (Academic Press, New York, 1964) p. 109.Google Scholar