Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-23T04:35:11.044Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ electron microscopy of ferroelectric domains

Published online by Cambridge University Press:  13 January 2015

Linze Li ,
Jacob R. Jokisaari  and
Xiaoqing Pan
Linze Li
Affiliation:
Department of Materials Science and Engineering, University of Michigan, USA; [email protected]
Jacob R. Jokisaari
Affiliation:
Department of Materials Science and Engineering, University of Michigan, USA; [email protected]
Xiaoqing Pan
Affiliation:
Department of Materials Science and Engineering, University of Michigan, USA; [email protected]
Get access

Abstract

This article reviews current progress in research in ferroelectric switching phenomena using in situ electron microscopy. We focus on state-of-the-art instrumentation, analytical methods, experimental procedures, and image contrast mechanisms. Particular emphasis is on ferroelectric domain and domain wall structures that determine ferroelectric behaviors. The applicability of in situ microscopy to studying a wide range of switching phenomena, such as domain nucleation, domain wall motion, and domain wall pinning by various types of defects, in ferroelectric thin films is demonstrated. The underlying physics of these dynamic processes is also discussed.

Keywords

transmission electron microscopyferroelectric
Type
Research Article
Information
MRS Bulletin , Volume 40 , Issue 1: Frontiers of in situ electron microscopy , January 2015 , pp. 53 - 61
Copyright
Copyright © Materials Research Society 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Scott, J.F., Science 315, 954 (2007).CrossRefGoogle Scholar
Kalinin, S.V., Morozovska, A.N., Chen, L.Q., Rodriguez, B.J., Rep. Prog. Phys. 73, 056502 (2010).CrossRefGoogle Scholar
Damjanovic, D., Rep. Prog. Phys. 61, 1267 (1998).CrossRefGoogle Scholar
von Hippel, A., Breckenridge, R.G., Chesley, F.G., Tisza, L., Ind. Eng. Chem. 38, 1097 (1946).CrossRefGoogle Scholar
Scott, J.F., Dearaujo, C.A.P., Science 246, 1400 (1989).CrossRefGoogle Scholar
Tsymbal, E.Y., Kohlstedt, H., Science 313, 181 (2006).CrossRefGoogle Scholar
Cho, Y., Hashimoto, S., Odagawa, N., Tanaka, K., Hiranaga, Y., Nanotechnology 17, S137 (2006).CrossRefGoogle Scholar
Garcia, V., Fusil, S., Bouzehouane, K., Enouz-Vedrenne, S., Mathur, N.D., Barthelemy, A., Bibes, M., Nature 460, 81 (2009).CrossRefGoogle Scholar
Garcia, V., Bibes, M., Bocher, L., Valencia, S., Kronast, F., Crassous, A., Moya, X., Enouz-Vedrenne, S., Gloter, A., Imhoff, D., Deranlot, C., Mathur, N.D., Fusil, S., Bouzehouane, K., Barthelemy, A., Science 327, 1106 (2010).CrossRefGoogle Scholar
Maksymovych, P., Jesse, S., Yu, P., Ramesh, R., Baddorf, A.P., Kalinin, S.V., Science 324, 1421 (2009).CrossRefGoogle Scholar
Gajek, M., Bibes, M., Fusil, S., Bouzehouane, K., Fontcuberta, J., Barthelemy, A.E., Fert, A., Nat. Mater. 6, 296 (2007).CrossRefGoogle Scholar
Choi, T., Lee, S., Choi, Y.J., Kiryukhin, V., Cheong, S.W., Science 324, 63 (2009).CrossRefGoogle Scholar
Chanthbouala, A., Garcia, V., Cherifi, R.O., Bouzehouane, K., Fusil, S., Moya, X., Xavier, S., Yamada, H., Deranlot, C., Mathur, N.D., Bibes, M., Barthelemy, A., Grollier, J., Nat. Mater. 11, 860 (2012).CrossRefGoogle Scholar
Li, D.B., Zhao, M.H., Garra, J., Kolpak, A.M., Rappe, A.M., Bonnell, D.A., Vohs, J.M., Nat. Mater. 7, 473 (2008).CrossRefGoogle Scholar
Zheng, H., Wang, J., Lofland, S.E., Ma, Z., Mohaddes-Ardabili, L., Zhao, T., Salamanca-Riba, L., Shinde, S.R., Ogale, S.B., Bai, F., Viehland, D., Jia, Y., Schlom, D.G., Wuttig, M., Roytburd, A., Ramesh, R., Science 303, 661 (2004).CrossRefGoogle Scholar
Chu, Y.H., Martin, L.W., Holcomb, M.B., Gajek, M., Han, S.J., He, Q., Balke, N., Yang, C.H., Lee, D., Hu, W., Zhan, Q., Yang, P.L., Fraile-Rodriguez, A., Scholl, A., Wang, S.X., Ramesh, R., Nat. Mater. 7, 678 (2008).CrossRefGoogle Scholar
Ghidini, M., Pellicelli, R., Prieto, J.L., Moya, X., Soussi, J., Briscoe, J., Dunn, S., Mathur, N.D., Nat. Commun. 4, 1453 (2013).CrossRefGoogle Scholar
Evans, D.M., Schilling, A., Kumar, A., Sanchez, D., Ortega, N., Arredondo, M., Katiyar, R.S., Gregg, J.M., Scott, J.F., Nat. Commun. 4, 1534 (2013).CrossRefGoogle Scholar
Jesse, S., Rodriguez, B.J., Choudhury, S., Baddorf, A.P., Vrejoiu, I., Hesse, D., Alexe, M., Eliseev, E.A., Morozovska, A.N., Zhang, J., Chen, L.Q., Kalinin, S.V., Nat. Mater. 7, 209 (2008).CrossRefGoogle Scholar
Brazier, M., Mansour, S., McElfresh, M., Appl. Phys. Lett. 74, 4032 (1999).CrossRefGoogle Scholar
Dawber, M., Rabe, K.M., Scott, J.F., Rev. Mod. Phys. 77, 1083 (2005).CrossRefGoogle Scholar
De Araujo, C.A.P., Cuchiaro, J.D., McMillan, L.D., Scott, M.C., Scott, J.F., Nature 374, 627 (1995).CrossRefGoogle Scholar
Pertsev, N.A., Koukhar, V.G., Phys. Rev. Lett. 84, 3722 (2000).CrossRefGoogle Scholar
Lohse, O., Grossmann, M., Boettger, U., Bolten, D., Waser, R., J. Appl. Phys. 89, 2332 (2001).CrossRefGoogle Scholar
Gruverman, A., Tanaka, M., J. Appl. Phys. 89, 1836 (2001).CrossRefGoogle Scholar
Ganpule, C.S., Roytburd, A.L., Nagarajan, V., Hill, B.K., Ogale, S.B., Williams, E.D., Ramesh, R., Scott, J.F., Phys. Rev. B: Condens. Matter 65, 014101 (2002).CrossRefGoogle Scholar
Guo, H.Y., Xu, J.B., Wilson, I.H., Xie, Z., Luo, E.Z., Hong, S.B., Yan, H., Appl. Phys. Lett. 81, 715 (2002).CrossRefGoogle Scholar
Kang, B.S., Kim, D.J., Jo, J.Y., Noh, T.W., Yoon, J.-G., Song, T.K., Lee, Y.K., Lee, J.K., Shin, S., Park, Y.S., Appl. Phys. Lett. 84, 3127 (2004).CrossRefGoogle Scholar
Kim, D.J., Jo, J.Y., Kim, Y.S., Chang, Y.J., Lee, J.S., Yoon, J.-G., Song, T.K., Noh, T.W., Phys. Rev. Lett. 95, 237602 (2005).CrossRefGoogle Scholar
Lou, X.J., Zhang, M., Redfern, S.A.T., Scott, J.F., Phys. Rev. Lett. 97, 177601 (2006).CrossRefGoogle Scholar
Jo, J.Y., Kim, D.J., Kim, Y.S., Choe, S.B., Song, T.K., Yoon, J.-G., Noh, T.W., Phys. Rev. Lett. 97, 247602 (2006).CrossRefGoogle Scholar
Grigoriev, A., Do, D.H., Kim, D.M., Eom, C.B., Adams, B., Dufresne, E.M., Evans, P.G., Phys. Rev. Lett. 96, 187601 (2006).CrossRefGoogle Scholar
Li, Y.W., Li, F.X., Scr. Mater. 67, 601 (2012).CrossRefGoogle Scholar
Jiang, Y.J., Fang, D.N., Mater. Lett. 61, 5047 (2007).CrossRefGoogle Scholar
Zhao, T., Scholl, A., Zavaliche, F., Lee, K., Barry, M., Doran, A., Cruz, M.P., Chu, Y.H., Ederer, C., Spaldin, N.A., Das, R.R., Kim, D.M., Baek, S.H., Eom, C.B., Ramesh, R., Nat. Mater. 5, 823 (2006).CrossRefGoogle Scholar
Gruverman, A., Kalinin, S.V., J. Mater. Sci. 41, 107 (2006).CrossRefGoogle Scholar
Bonnell, D.A., Kalinin, S.V., Kholkin, A.L., Gruverman, A., MRS Bull. 34, 648 (2009).CrossRefGoogle Scholar
Balke, N., Bdikin, I., Kalinin, S.V., Kholkin, A.L., J. Am. Ceram. Soc. 92, 1629 (2009).CrossRefGoogle Scholar
Nelson, C.T., Gao, P., Jokisaari, J.R., Heikes, C., Adamo, C., Melville, A., Baek, S.H., Folkman, C.M., Winchester, B., Gu, Y.J., Liu, Y.M., Zhang, K., Wang, E.G., Li, J.Y., Chen, L.Q., Eom, C.B., Schlom, D.G., Pan, X.Q., Science 334, 968 (2011).CrossRefGoogle Scholar
Nelson, C.T., Winchester, B., Zhang, Y., Kim, S.J., Melville, A., Adamo, C., Folkman, C.M., Baek, S.H., Eom, C.B., Schlom, D.G., Chen, L.Q., Pan, X.Q., Nano Lett. 11, 828 (2011).CrossRefGoogle Scholar
Gao, P., Nelson, C.T., Jokisaari, J.R., Zhang, Y., Baek, S.H., Bark, C.W., Wang, E., Liu, Y.M., Li, J.Y., Eom, C.B., Pan, X.Q., Adv. Mater. 24, 1106 (2012).CrossRefGoogle Scholar
Lee, J.K., Shin, G.Y., Song, K., Choi, W.S., Shin, Y.A., Park, S.Y., Britson, J., Cao, Y., Chen, L.Q., Lee, H.N., Oh, S.H., Acta Mater. 61, 6765 (2013).CrossRefGoogle Scholar
Gao, P., Nelson, C.T., Jokisaari, J.R., Baek, S.H., Bark, C.W., Zhang, Y., Wang, E.G., Schlom, D.G., Eom, C.B., Pan, X.Q., Nat. Commun. 2, 591 (2011).CrossRefGoogle Scholar
Winkler, C.R., Damodaran, A.R., Karthik, J., Martin, L.W., Taheri, M.L., Micron 43, 1121 (2012).CrossRefGoogle Scholar
Gao, P., Britson, J., Jokisaari, J.R., Nelson, C.T., Baek, S.H., Wang, Y., Eom, C.B., Chen, L.Q., Pan, X., Nat. Commun. 4, 2791 (2013).CrossRefGoogle Scholar
Chang, H., Kalinin, S.V., Yang, S., Yu, P., Bhattacharya, S., Wu, P.P., Balke, N., Jesse, S., Chen, L.Q., Ramesh, R., Pennycook, S.J., Borisevich, A.Y., J. Appl. Phys. 110, 052014 (2011).CrossRefGoogle Scholar
Schlom, D.G., Chen, L.Q., Eom, C.B., Rabe, K.M., Streiffer, S.K., Triscone, J.M., Annu. Rev. Mater. Res. 37, 589 (2007).CrossRefGoogle Scholar
Schlom, D.G., Chen, L.Q., Pan, X.Q., Schmehl, A., Zurbuchen, M.A., J. Am. Ceram. Soc. 91, 2429 (2008).CrossRefGoogle Scholar
Wang, J., Neaton, J.B., Zheng, H., Nagarajan, V., Ogale, S.B., Liu, B., Viehland, D., Vaithyanathan, V., Schlom, D.G., Waghmare, U.V., Spaldin, N.A., Rabe, K.M., Wuttig, M., Ramesh, R., Science 299, 1719 (2003).CrossRefGoogle Scholar
Bark, C.W., Felker, D.A., Wang, Y., Zhang, Y., Jang, H.W., Folkman, C.M., Park, J.W., Baek, S.H., Zhou, H., Fong, D.D., Pan, X.Q., Tsymbal, E.Y., Rzchowski, M.S., Eom, C.B., Proc. Natl. Acad. Sci. U.S.A. 108, 4720 (2011).CrossRefGoogle Scholar
Adamo, C., Ke, X., Wang, H.Q., Xin, H.L., Heeg, T., Hawley, M.E., Zander, W., Schubert, J., Schiffer, P., Muller, D.A., Maritato, L., Schlom, D.G., Appl. Phys. Lett. 95, 112504 (2009).CrossRefGoogle Scholar
Infante, I.C., Lisenkov, S., Dupe, B., Bibes, M., Fusil, S., Jacquet, E., Geneste, G., Petit, S., Courtial, A., Juraszek, J., Bellaiche, L., Barthelemy, A., Dkhil, B., Phys. Rev. Lett. 105, 057601 (2010).CrossRefGoogle Scholar
Bea, H., Dupe, B., Fusil, S., Mattana, R., Jacquet, E., Warot-Fonrose, B., Wilhelm, F., Rogalev, A., Petit, S., Cros, V., Anane, A., Petroff, F., Bouzehouane, K., Geneste, G., Dkhil, B., Lisenkov, S., Ponomareva, I., Bellaiche, L., Bibes, M., Barthelemy, A., Phys. Rev. Lett. 102, 217603 (2009).CrossRefGoogle Scholar
Zeches, R.J., Rossell, M.D., Zhang, J.X., Hatt, A.J., He, Q., Yang, C.H., Kumar, A., Wang, C.H., Melville, A., Adamo, C., Sheng, G., Chu, Y.H., Ihlefeld, J.F., Erni, R., Ederer, C., Gopalan, V., Chen, L.Q., Schlom, D.G., Spaldin, N.A., Martin, L.W., Ramesh, R., Science 326, 977 (2009).CrossRefGoogle Scholar
Nagarajan, V., Roytburd, A., Stanishevsky, A., Prasertchoung, S., Zhao, T., Chen, L., Melngailis, J., Auciello, O., Ramesh, R., Nat. Mater. 2, 43 (2003).CrossRefGoogle Scholar
Nagarajan, V., Prasertchoung, S., Zhao, T., Zheng, H., Ouyang, J., Ramesh, R., Tian, W., Pan, X.Q., Kim, D.M., Eom, C.B., Kohlstedt, H., Waser, R., Appl. Phys. Lett. 84, 5225 (2004).CrossRefGoogle Scholar
Das, R.R., Kim, D.M., Baek, S.H., Eom, C.B., Zavaliche, F., Yang, S.Y., Ramesh, R., Chen, Y.B., Pan, X.Q., Ke, X., Rzchowski, M.S., Streiffer, S.K., Appl. Phys. Lett. 88, 242904 (2006).CrossRefGoogle Scholar
Catalan, G., Scott, J.F., Adv. Mater. 21, 2463 (2009).CrossRefGoogle Scholar
Zavaliche, F., Yang, S.Y., Zhao, T., Chu, Y.H., Cruz, M.P., Eom, C.B., Ramesh, R., Phase Transit. 79, 991 (2006).CrossRefGoogle Scholar
Kubel, F., Schmid, H., Acta Crystallogr. B 46, 698 (1990).CrossRefGoogle Scholar
Yamamoto, N., Yagi, K., Honjo, G., Phys. Status Solidi A 62, 657 (1980).CrossRefGoogle Scholar
Snoeck, E., Normand, L., Thorel, A., Roucau, C., Phase Transit. 46, 77 (1994).CrossRefGoogle Scholar
Randall, C.A., Barber, D.J., Whatmore, R.W., J. Microsc. 145, 275 (1987).Google Scholar
Tan, X.L., He, H., Shang, J.K., J. Mater. Res. 20, 1641 (2005).CrossRefGoogle Scholar
He, H., Tan, X., Phys. Rev. B: Condens. Matter 72, 024102 (2005).CrossRefGoogle Scholar
Qu, W., Zhao, X., Tan, X., J. Appl. Phys. 102, 084101 (2007).CrossRefGoogle Scholar
Sato, Y., Hirayama, T., Ikuhara, Y., Phys. Rev. Lett. 107, 187601 (2011).CrossRefGoogle Scholar
Winkler, C.R., Jablonski, M.L., Damodaran, A.R., Jambunathan, K., Martin, L.W., Taheri, M.L., J. Appl. Phys. 112, 052013 (2012).CrossRefGoogle Scholar
Zhang, J.X., Xiang, B., He, Q., Seidel, J., Zeches, R.J., Yu, P., Yang, S.Y., Wang, C.H., Chu, Y.H., Martin, L.W., Minor, A.M., Ramesh, R., Nat. Nanotechnol. 6, 97 (2011).Google Scholar
Gao, P., Britson, J., Nelson, C.T., Jokisaari, J.R., Duan, C., Trassin, M., Baek, S.H., Guo, H., Li, L.Z., Wang, Y.R., Chu, Y.H., Minor, A.M., Eom, C.B., Ramesh, R., Chen, L.Q., Pan, X.Q., Nat. Commun. 5, 3801 (2014).CrossRefGoogle Scholar
Chen, Y.B., Katz, M.B., Pan, X.Q., Das, R.R., Kim, D.M., Baek, S.H., Eom, C.B., Appl. Phys. Lett. 90, 072907 (2007).CrossRefGoogle Scholar
Folkman, C.M., Baek, S.H., Jang, H.W., Eom, C.B., Nelson, C.T., Pan, X.Q., Li, Y.L., Chen, L.Q., Kumar, A., Gopalan, V., Streiffer, S.K., Appl. Phys. Lett. 94, 251911 (2009).CrossRefGoogle Scholar
Jang, H.W., Ortiz, D., Baek, S.H., Folkman, C.M., Das, R.R., Shafer, P., Chen, Y., Nelson, C.T., Pan, X., Ramesh, R., Eom, C.B., Adv. Mater. 21, 817 (2009).CrossRefGoogle Scholar
Li, L.Z., Gao, P., Nelson, C.T., Jokisaari, J.R., Zhang, Y., Kim, S.J., Melville, A., Adamo, C., Schlom, D.G., Pan, X.Q., Nano Lett. 13, 5218 (2013).CrossRefGoogle Scholar
Polking, M.J., Han, M.G., Yourdkhani, A., Petkov, V., Kisielowski, C.F., Volkov, V.V., Zhu, Y.M., Caruntu, G., Alivisatos, A.P., Ramesh, R., Nat. Mater. 11, 700 (2012).CrossRefGoogle Scholar
Lubk, A., Rossell, M.D., Seidel, J., He, Q., Yang, S.Y., Chu, Y.H., Ramesh, R., Hytch, M.J., Snoeck, E., Phys. Rev. Lett. 109, 047601 (2012).CrossRefGoogle Scholar
Lubk, A., Rossell, M.D., Seidel, J., Chu, Y.H., Ramesh, R., Hytch, M.J., Snoeck, E., Nano Lett. 13, 1410 (2013).CrossRefGoogle Scholar
Landauer, R., J. Appl. Phys. 28, 227 (1957).CrossRefGoogle Scholar
Merz, W.J., Phys. Rev. 95, 690 (1954).CrossRefGoogle Scholar
Lee, D., Baek, S.H., Kim, T.H., Yoon, J.-G., Folkman, C.M., Eom, C.B., Noh, T.W., Phys. Rev. B: Condens. Matter 84, 125305 (2011).CrossRefGoogle Scholar
Mannhart, J., Schlom, D.G., Science 327, 1607 (2010).CrossRefGoogle Scholar
Okatan, M.B., Misirlioglu, I.B., Alpay, S.P., Phys. Rev. B: Condens. Matter 82, 094115 (2010).CrossRefGoogle Scholar
Tagantsev, A.K., Gerra, G., J. Appl. Phys. 100, 051607 (2006).CrossRefGoogle Scholar
Miller, R.C., Weinreich, G., Phys. Rev. 117, 1460 (1960).CrossRefGoogle Scholar
Shin, Y.H., Grinberg, I., Chen, I.W., Rappe, A.M., Nature 449, 881 (2007).CrossRefGoogle Scholar
Balke, N., Gajek, M., Tagantsev, A.K., Martin, L.W., Chu, Y.H., Ramesh, R., Kalinin, S.V., Adv. Funct. Mater. 20, 3466 (2010).CrossRefGoogle Scholar
Sze, S.M., Coleman, D.J., Loya, A., Solid State Electron. 14, 1209 (1971).CrossRefGoogle Scholar
Hartmann, A.J., Neilson, M., Lamb, R.N., Watanabe, K., Scott, J.F., Appl. Phys. A 70, 239 (2000).CrossRefGoogle Scholar
Muller, E.W., J. Appl. Phys. 26, 732 (1955).CrossRefGoogle Scholar
Clark, S.J., Robertson, J., Appl. Phys. Lett. 90, 132903 (2007).CrossRefGoogle Scholar
Scott, J.F., Dawber, M., Appl. Phys. Lett. 76, 3801 (2000).CrossRefGoogle Scholar
Schlom, D.G., Chen, L.-Q., Fennie, C.J., Gopalan, V., Muller, D.A., Pan, X., Ramesh, R., Uecker, R., MRS Bull. 39, 118 (2014).CrossRefGoogle Scholar
Krieger, J.H., J. Appl. Phys. 105, 061629 (2009).CrossRefGoogle Scholar
Grinberg, I., West, D.V., Torres, M., Gou, G., Stein, D.M., Wu, L., Chen, G., Gallo, E.M., Akbashev, A.R., Davies, P.K., Spanier, J.E., Rappe, A.M., Nature 503, 509 (2013).CrossRefGoogle Scholar