Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Ishimaru, Manabu
M. Dickerson, Robert
and
E. Sickafus, Kurt
1999.
Microstructural and Compositional Characterization of SiC-On-Insulator Structures.
Microscopy and Microanalysis,
Vol. 5,
Issue. S2,
p.
770.
Chen, M.
Chen, J.
Zheng, W.
Li, L.
Mou, H.C.
Lin, Z.X.
Yu, Y.H.
and
Wang, X.
2000.
Energy dependence of low dose SIMOX wafers.
p.
277.
Jing Chen
Meng Chen
Yuehui Yu
Zhihong Zheng
and
Xi Wang
2000.
Synthesis of SOI material using low energy water ion implantation.
p.
261.
Marotti, R.E.
Rondoni, A.
Quagliata, E.
and
Dalchiele, E.A.
2000.
Porous Silicon Growth by Lateral Anodization.
physica status solidi (b),
Vol. 220,
Issue. 1,
p.
319.
Ohzono, Takuya
and
Fujihira, Masamichi
2000.
Molecular dynamics simulations of friction between an ordered organic monolayer and a rigid slider with an atomic-scale protuberance.
Physical Review B,
Vol. 62,
Issue. 24,
p.
17055.
Ishimaru, Manabu
Dickerson, Robert M
and
Sickafus, Kurt E
2000.
Ion beam synthesis of buried oxide layers in silicon carbide.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 166-167,
Issue. ,
p.
390.
Domenicucci, A.
Murphy, R.
Sadanna, D.
and
Klepeis, S.
2000.
Non Destructive Determination of the Threading Dislocation Density of Smooth Simox Substrates using Atomic Force Microscopy.
Microscopy and Microanalysis,
Vol. 6,
Issue. S2,
p.
1088.
Orobtchouk, Régis
Layadi, Abdelhalim
Gualous, Hamid
Pascal, Daniel
Koster, Alain
and
Laval, Suzanne
2000.
High-efficiency light coupling in a submicrometric silicon-on-insulator waveguide.
Applied Optics,
Vol. 39,
Issue. 31,
p.
5773.
Ferrieu, F
Ribot, P
and
Regolini, J.L
2000.
Spectroscopic ellipsometry of SixGe1−x/Si: a tool for composition and profile analysis in strained heterostructures used in the microelectronics industry.
Thin Solid Films,
Vol. 373,
Issue. 1-2,
p.
211.
Rivera, A
de Nijs, J.M.M
Balk, P
van Veen, A
Schut, H
and
Alkemade, P.F.A
2000.
Oxygen-related defects in the top silicon layer of SIMOX; the effect of thermal treatments.
Materials Science and Engineering: B,
Vol. 73,
Issue. 1-3,
p.
77.
Losert, W.
Géminard, J.-C.
Nasuno, S.
and
Gollub, J. P.
2000.
Mechanisms for slow strengthening in granular materials.
Physical Review E,
Vol. 61,
Issue. 4,
p.
4060.
Corish, J.
and
Morton-blake, D. A.
2000.
A Molecular Dynamics Investigation of Chain Conformational Changes In Compressed Bilayers.
Molecular Simulation,
Vol. 25,
Issue. 6,
p.
339.
Soller, Brian J.
and
Hall, Dennis G.
2001.
Energy transfer at optical frequencies to silicon-based waveguiding structures.
Journal of the Optical Society of America A,
Vol. 18,
Issue. 10,
p.
2577.
Landru, N.
Pascal, D.
and
Koster, A.
2001.
Modelling of two-dimensional grating couplers on silicon-on-insulator waveguides using beam propagation method.
Optics Communications,
Vol. 196,
Issue. 1-6,
p.
139.
Wang, Xi
Chen, Meng
Chen, Jing
and
Zheng, Wang
2001.
Novel approaches for low cost fabrication of SOI.
Current Applied Physics,
Vol. 1,
Issue. 2-3,
p.
225.
Takeuchi, Tsunehiro
Onogi, Tomohide
Banno, Eiichi
and
Mizutani, Uichiro
2001.
Direct Evidence of the Hume-Rothery Stabilization Mechanism in Al-Mn-Fe-Si Mackay-Type 1/1-Cubic Approximants.
MATERIALS TRANSACTIONS,
Vol. 42,
Issue. 6,
p.
933.
Bergmann, Ralf B.
Berge, Christopher
Rinke, Titus J.
and
Werner, Jürgen H.
2001.
Monocrystalline Si Films from Transfer Processes for Thin Film Devices.
MRS Proceedings,
Vol. 685,
Issue. ,
Mulcahy, C.
Biswas, S.
Kelly, I.
Kirkwood, D.
and
Collart, E.
2002.
The distribution of boron and arsenic in SOI wafers implementing SIMS.
p.
1.
Emsley, M.K.
Dosunmu, O.
and
Unlu, M.S.
2002.
Silicon substrates with buried distributed Bragg reflectors for resonant cavity-enhanced optoelectronics.
IEEE Journal of Selected Topics in Quantum Electronics,
Vol. 8,
Issue. 4,
p.
948.
Mil’vidsky, M. G.
2002.
Semiconductor silicon at the threshold of twenty-first century.
Crystallography Reports,
Vol. 47,
Issue. S1,
p.
S3.