Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Plank, H
Gspan, C
Dienstleder, M
Kothleitner, G
and
Hofer, F
2008.
The influence of beam defocus on volume growth rates for electron beam induced platinum deposition.
Nanotechnology,
Vol. 19,
Issue. 48,
p.
485302.
Gnaser, Hubert
Reuscher, Bernhard
and
Brodyanski, Alexander
2008.
Focused ion beam implantation of Ga in nanocrystalline diamond: Fluence-dependent retention and sputtering.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 266,
Issue. 8,
p.
1666.
Gnaser, Hubert
Brodyanski, Alexander
and
Reuscher, Bernhard
2008.
Focused ion beam implantation of Ga in Si and Ge: fluence‐dependent retention and surface morphology.
Surface and Interface Analysis,
Vol. 40,
Issue. 11,
p.
1415.
Hambe, M
Wicks, S
Gregg, J M
and
Nagarajan, V
2008.
Creation of damage-free ferroelectric nanostructures via focused ion beam milling.
Nanotechnology,
Vol. 19,
Issue. 17,
p.
175302.
Lekstrom, M
McLachlan, M A
Husain, S
McComb, D W
and
Shollock, B A
2008.
Using the in situ lift-out technique to prepare TEM specimens on a single-beam FIB instrument.
Journal of Physics: Conference Series,
Vol. 126,
Issue. ,
p.
012028.
Vesseur, E. J. R.
de Waele, R.
Lezec, H. J.
Atwater, H. A.
García de Abajo, F. J.
and
Polman, A.
2008.
Surface plasmon polariton modes in a single-crystal Au nanoresonator fabricated using focused-ion-beam milling.
Applied Physics Letters,
Vol. 92,
Issue. 8,
Fu, Jing
Joshi, Sanjay B.
and
Catchmark, Jeffrey M.
2008.
Sputtering rate of micromilling on water ice with focused ion beam in a cryogenic environment.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 26,
Issue. 3,
p.
422.
Brunner, S.
Tharian, P.J.
Simmler, H.
and
Ghazi Wakili, K.
2008.
Focused ion beam (FIB) etching to investigate aluminium-coated polymer laminates subjected to heat and moisture loads.
Surface and Coatings Technology,
Vol. 202,
Issue. 24,
p.
6054.
Utke, Ivo
Hoffmann, Patrik
and
Melngailis, John
2008.
Gas-assisted focused electron beam and ion beam processing and fabrication.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 26,
Issue. 4,
p.
1197.
Stickler, Daniel
Frömter, Robert
Li, Wei
Kobs, André
and
Oepen, Hans Peter
2008.
Integrated setup for the fabrication and measurement of magnetoresistive nanoconstrictions in ultrahigh vacuum.
Review of Scientific Instruments,
Vol. 79,
Issue. 10,
Sun, K.
Wang, L.M.
and
Ewing, R.C.
2008.
Fabrication of nano-/micro-patterns on iron phosphate glass surfaces by focused energetic beams.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 266,
Issue. 12-13,
p.
3133.
Chiaramonti, A.N.
Thompson, L.J.
Egelhoff, W.F.
Kabius, B.C.
and
Petford-Long, A.K.
2008.
In situ TEM studies of local transport and structure in nanoscale multilayer films.
Ultramicroscopy,
Vol. 108,
Issue. 12,
p.
1529.
Frimmer, Martin
Sun, Jie
Maximov, Ivan
and
Xu, H. Q.
2008.
Transport properties of three-terminal ballistic junctions realized by focused ion beam enhanced etching in InGaAs/InP.
Applied Physics Letters,
Vol. 93,
Issue. 13,
Wei, Qiangmin
Li, Weixing
Sun, Kai
Lian, Jie
and
Wang, Lumin
2008.
Morphological instability of Cu nanolines induced by Ga+-ion bombardment: In situ scanning electron microscopy and theoretical model.
Journal of Applied Physics,
Vol. 103,
Issue. 7,
Fu, Jing
Joshi, Sanjay B
and
Catchmark, Jeffrey M
2008.
A study of angular effects in focused ion beam milling of water ice.
Journal of Micromechanics and Microengineering,
Vol. 18,
Issue. 9,
p.
095010.
Isakov, D. V.
Zhang, Y.
Balk, L. J.
and
Phang, J. C. H.
2009.
Optical near-field probe with embedded gallium scattering center.
Applied Physics Letters,
Vol. 94,
Issue. 25,
Munroe, P.R.
2009.
The application of focused ion beam microscopy in the material sciences.
Materials Characterization,
Vol. 60,
Issue. 1,
p.
2.
SCOTT, K.
and
RITCHIE, N.W.M.
2009.
Analysis of 3D elemental mapping artefacts in biological specimens using Monte Carlo simulation.
Journal of Microscopy,
Vol. 233,
Issue. 2,
p.
331.
Lu, Yun-Hao
Shi, Lei
Zhang, Chun
and
Feng, Yuan-Ping
2009.
Electric-field control of magnetic states, charge transfer, and patterning of adatoms on graphene: First-principles density functional theory calculations.
Physical Review B,
Vol. 80,
Issue. 23,
Kiener, D.
Durst, K.
Rester, M.
and
Minor, A. M.
2009.
Revealing deformation mechanisms with nanoindentation.
JOM,
Vol. 61,
Issue. 3,
p.
14.