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Expert Vision Systems in Archaeometry

Published online by Cambridge University Press:  29 November 2013

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Extract

In the analysis of object or material form and structure, especially micro-structure, correlations of material properties with their microstructure, and of structures with their production history and function, are at the heart of much of artifact and fossil analysis in archaeometry. Presently, a great deal of such examination of archaeomaterials is either:

∎ qualitative, descriptive and anecdotal, comparing “representative” specimens to illustrate the differences of mean, typical, or normative structures, and forms; or

∎ limited to measurement of parameters which oversimplify the structure or are easily measured by hand, e.g., length, width, and thickness.

These do not differentiate shape variation or describe irregular shapes effectively. Hand measurements, even simple ones, are often difficult to derive on microstructures or on irregular macroscopic-sized objects and normally involve too few data points for statistical interpretation. Images of tesselated mosaics and multiphase microstructures in materials such as metals or ceramics are often chaotic and irregular in form, size variation and distribution of elements, inclusions and phases. Because of this, they are difficult to quantify precisely or accurately. Moreover, analysis is often limited more by the need to minimize destruction to an irreplacable artifact or art object than by a method's ability to generate significant data. Sample size is often held at the minimum threshold of significance or adequacy. Thus, any method which enhances the quality and quantity of such data should be welcome in archaeometric research.

Type
Microscopic Analysis in Archaeology
Copyright
Copyright © Materials Research Society 1989

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References

1.McLaren, M.G. and Ott, W.R., in Processing of Crystalline Ceramics, edited by Palmour, H. III, Davis, R.F., and Hare, T.M. (Mater. Sci. Res. 11, Plenum Press, New York, 1978) p. 114.Google Scholar
2.Russ, J.C. and Rovner, I., Phytolith. News. 4 (1987) p. 1216.Google Scholar
3.Pratt, W.K., Digital image Processing (Wiley, New York, 1978); A. Rosenfeld and A.C. Kak, Digital Picture Processing (Academic Press, New York, 1982).Google Scholar
4.Russ, J.C., and Russ, J.Ch., J. Micro. 135 (1984) p. 89.CrossRefGoogle Scholar
5.Russ, J.C. and Russ, J. Ch., Microbeam Anal. 161 (1984).Google Scholar
6.Serra, J., Image Analysis and Mathematical Morphology (Academic Press, New York, 1982); A.G. Fabbri, Image Processing of Geological Data (Van Nostrand Reinhold, New York, 1984).Google Scholar
7.Jernot, J.P., These de Doctorat es-Science, Université de Caen (1982); J.Ch. Russ and J.C. Russ, “Automatic Editing of Binary Images for Feature Isolation and Measurement,” Microbeam Anal. 505 (in press); “An Improved Convex Segmentation Algorithm,” “Automatic Discrimination of Binary Images,” J. Micro. (in press).Google Scholar
8.Underwood, E.E., Quantitative Stereology (Addison Wesley, Reading, MA, 1970); E.R. Weibel, Stereological Methods, Vol. I & II (Academic Press, New York, 1979); J.C. Russ, Practical Stereology (Plenum Press, New York, 1986).Google Scholar
9.Rhines, F.N., Microstruclology: Behavior and Microstructure of Materials, edited by Dr.Riederer-Verlag, (Stuttgart, 1986); F.N. Rhines and R.T. DeHoff, “The Basis of Microstructology,” in Proc. International Conference on Stereology, (University of Florida, Gainesville, 1986).Google Scholar
10.Mandelbrot, B.B., The Fractal Geometry of Nature (Freeman, New York, 1983).CrossRefGoogle Scholar
11.Haralick, R.M., Shanmugam, K., and Dinstein, I., “Textural Features for Image Classification,” IEEE Trans. Syst. Man. Cyber. SMC-3 (1973) p. 610; J.C. Russ and J.Ch. Russ, Microbeam Anal. 509 (1986).CrossRefGoogle Scholar