Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-05T19:51:13.521Z Has data issue: false hasContentIssue false
  • English
  • Français

Defects in High Tc Cuprate Superconductors

Published online by Cambridge University Press:  29 November 2013

Yimei Zhu ,
J. Tafto  and
M. Suenaga
Get access

Extract

Characterization of microstructural defects in high critical temperature oxide superconductors has been very valuable in gaining an understanding of their phase transformations and insight into the relationship between defects and some superconducting properties such as critical current densities Jc. For this purpose, transmission electron microscopy (TEM) techniques have been proved powerful. In this article we will briefly summarize typical defects in the perovskite-based layered oxides, i.e., [La(1−x)(Ba,Sr)x]2CuO4, YBa2Cu3O7−δ, and (Bi,Pb)2Sr2Can−1Cun−O4+2n+δ. Then we will discuss the nature of defects in YBa2Cu3O7−δ in detail since this oxide has been most extensively studied. Among the many varieties of microstructural defects in YBa2Cu3O7−δ, we will emphasize only those we consider most important. An account of the field before 1990 is given in an excellent review by Beyers and Shaw and a more recent review of the structure of the grain boundaries in YBa2Cu3O7−δ by Babcock.

Since the types and the nature of the defects depend greatly on the crystal structure of the materials, the basic structures of the three oxides are shown in Figures la to 1c: (a) [La1−x(Sr,Ba)x]2CuO4, (2:1:4), (b) YBa2Cu3O7 (1:2:3:), and (c) Bi2Sr2CaCu2O8 (2:2:1:2). (The structure of Tl cuprates are very similar to the Bicuprate and will not be discussed here.)

Type
Point Defects Part I
Information
MRS Bulletin , Volume 16 , Issue 11 , November 1991 , pp. 54 - 59
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Beyers, R. and Shaw, T.M., Solid State Physics 42, edited by Ehrenreich, H. and Turnbull, D., (Academic Press, New York, 1989) p. 135.Google Scholar
2.Babcock, S.E., in Proc. ASM Symp. on Structures/Properties Relationships for Interfaces (tobe published).Google Scholar
3.Tafto, J., Suenaga, M., and Sabatini, R.L., Appl. Phys. Lett. 52 (1988) p. 667.CrossRefGoogle Scholar
4.Zandbergen, H.W., Gronsky, R., Wang, K., and. Thomas, G., Nature 331 (1988) p. 596.CrossRefGoogle Scholar
5.Matsui, Y., Takekawa, S., Nozaki, H., Umezono, A., Takayama-Muromachi, E., and Horiuchi, S., Jpn. J. Appl. Phys. 27 (1988) p. L1241.CrossRefGoogle Scholar
6.Eibl, O., Physica C 168 (1990) p. 249.CrossRefGoogle Scholar
7.Axe, J.D., Moudden, H., Hohlwein, D., Cox, D.E., Mohanty, K.M., Moodenbaugh, A.R., and Xu, Y., Phys, Rev. Lett. 62 (1989) p. 2751.CrossRefGoogle Scholar
8.Sugiyama, M., Suyama, R., and Kubo, H., Jpn. J. Appl. Phys. 26 (1987) p. L1635; T. Onozuka, M. Omori; M. Hirabayashi, and Y. Syono, Jpn. J. Appl. Phys. 26 (1987) p. L1714.CrossRefGoogle Scholar
9.You, H., Axe, J.D., Kan, X.B., Moss, S.C., Liu, J.Z., and Lam, D.J., Phys. Rev. B 37 (1988) p. 2301.CrossRefGoogle Scholar
10.Eibl, O., Physica C 168 (1990) p. 239.CrossRefGoogle Scholar
11.Tomita, M., Hayashi, T., Takaoka, H., Ishii, Y., Enomoto, Y., and Murakami, T., Jpn. J. Appl. Phys. 27 (1988) p. L636.CrossRefGoogle Scholar
12.Ramesh, R., Hwang, D., Ravi, T.S., Inam, A., Barner, J.B., Nazar, L., Chan, S.W., Chen, C.Y., Dutta, B., Venkatesan, T., and Wu, X.D., Appl. Phys. Lett. 56 (1990) p. 2243.CrossRefGoogle Scholar
13.Norton, M. Grant and Barry Carter, C., in Proc. XIIth Intl. Congr. for Elect. Microscopy, (San Francisco, 1990) Vol. 4, p. 8.Google Scholar
14.Marshall, A.F., Barton, R.W., Char, K., Kapitulnik, A., Oh, B., Hammond, R.H., and Laderman, S.S., Phys. Rev. B 37 (1988) p. 9353.CrossRefGoogle Scholar
15.Cava, R.J., Batlogg, B., van Dover, R.B., Murphy, D.W., Sunshine, S., Siegrist, T., Remeika, J.P., Rietman, E.A., Zahurak, S.M., and Espinosa, G.P., Phys. Rev. Lett. 58 (1987) p. 1676.CrossRefGoogle Scholar
16.Jorgensen, J.D., Beno, M.A., Hinks, D.G., Soderholm, L., Volin, K.J., Hitterman, R.L., Grace, J.D., Schuller, Ivan K., Segre, C.U., Zhang, K., and Klufish, M.S., Phys. Rev. B 36 (1987) p. 3608.CrossRefGoogle Scholar
17.Bakker, H., Westerveld, J.P.A., LoCasscio, D.W.R., and Welch, D.O., Physica C 157 (1989) p. 25.CrossRefGoogle Scholar
18.de Fontaine, D., Willie, L.T., and Moss, S.C., Phys. Rev. B 36 (1987) p. 5709 and series of papers follows this.CrossRefGoogle Scholar
19.Khachaturyan, A.G., Semenovskaya, S.V., and Morris, J.W., Phys. Rev. B 37 (1988) p. 2243.CrossRefGoogle Scholar
20.Kikuchi, R. and Choi, J.S., Physica C 160 (1989) p. 347.CrossRefGoogle Scholar
21.Shi, D., Capone, D.W. II, Goretta, K.C., Zhang, K., and Goudey, G.T., J. Appl. Phys. 63 (1988) p. 5411; R.J. Cava, A.W. Heway, E.A. Heway, B. Batlogg, M. Marezio, K.M. Rabe, J.J. Krajewski, W.F. Peck Jr., and L.W. Rupp Jr., Physica C 165 (1990) p. 419.CrossRefGoogle Scholar
22.Reyes-Gasga, I., Krekels, T., Van Tendeloo, G., van Landuyt, J., Amelinckx, S., Bruggink, W.H.M., and Verweij, H., Physica C 159 (1989) p. 831.CrossRefGoogle Scholar
23.Beyers, R., Ahn, B.T., Gorman, G., Lee, V. Y., Parkin, S.S.P., Ramirez, M.L., Roche, K.P., Vazquez, J.E., Gür, T.M., and Huggins, R.A., Nature 340 (1989) p. 619.CrossRefGoogle Scholar
24.Ceder, G., Asta, M., and de Fontaine, D., Physica C 177 (1991) p. 106; N.H. Anderson, B. Lebech, and H.F. Poulsen, J. Less Common Metals 164-165 (1990) p. 124.CrossRefGoogle Scholar
25.Welch, D.O., unpublished result, as referred in Ref. 38.Google Scholar
26.Roitburd, A.L., Sov. Phys. Solid State 10 (1969) p. 2870.Google Scholar
27.Chandrasekhar, N., Welch, D.O., and Suenaga, M., presented at MRS Fall Meeting, Boston, MA, 1989 (unpublished).Google Scholar
28.Chumbley, L.S., Verhoeven, J.D., Kim, M.R., Cornelius, A.L., and Kramer, M.J., IEEE Trans. Magn. 25 (1989) p. 2337.CrossRefGoogle Scholar
29.Roy, T. and Mitchell, T.E., Philos. Mag. A 63 (1991) p. 225.CrossRefGoogle Scholar
30.Streiffer, S.K., Zielinski, E.M., Lairson, B.M., and Bravman, J.C., Appl. Phys. Lett. 58 (1991) p. 2171.CrossRefGoogle Scholar
31.Baetzold, R.C., Phys. Rev. B 38 (11) (1988) p. 304.CrossRefGoogle Scholar
32.Baumgart, P., Blumenröder, S., Erle, A., Hillebrands, B., Splittgerber, P., Güntherodt, G., and Schmidt, H., Physica C 162–164 (1989) p. 1073.CrossRefGoogle Scholar
33.Zhu, Y., Suenaga, M., Xu, Y., Sabatini, R.L., and Moodenbaugh, A.R., Appl. Phys. Lett. 54 (1989) p. 374.CrossRefGoogle Scholar
34.Zhu, Y., Suenaga, M., and Xu, Y., Philos. Mag. Lett. 60 (1989) p. 51; Y. Zhu, M. Suenaga, and Y. Xu, J. Mater. Res. 5 (1990) p. 1380.CrossRefGoogle Scholar
35.Zhu, Y., Suenaga, M., Tafto, J., and Welch, D.O., Phys. Rev. B 44 (1991), p. 2871.CrossRefGoogle Scholar
36.Zhu, Y., Suenaga, M., and Moodenbaugh, A.R., Philos. Mag. Lett. 62 (1990) p. 51; Y. Zhu, M. Suenaga, and A.R. Moodenbaugh, Ultramicroscopy 37 (1991) p. 341; Y. Zhu, M. Suenaga, and J. Tafto, Philos. Mag. Lett. 64 (1991) p. 29.CrossRefGoogle Scholar
37.Iijima, S., Ichihashi, T., Kubo, Y., and Tabuchi, T., Jpn. J. Appl. Phys. 26 (1987) p. L1790.CrossRefGoogle Scholar
38.Xu, Y., Suenaga, M., Tafto, J., Sabatini, R.L., and Moodenbaugh, A.R., Phys. Rev. B 39 (1989) p. 6667; P. Skjerpe, A. Olsen, J. Tafto, M. Suenaga, Y. Zhu, and A.R. Moodenbaugh, Philos. Mag. (to be published).CrossRefGoogle Scholar
39.Schmahl, W.W., Putnis, A., Salje, E., Freeman, P., Graeme-Baber, A., Jones, R., Singh, K.K., Blunt, J., Edwards, P.P., Loram, J., and Mirza, K., Philos. Mag. Lett. 60 (1990) p. 241.CrossRefGoogle Scholar
40.Kreckels, T., van Tendeloo, G., Broddin, D., Amelinckx, S., Tanner, L., Menbod, M., Vanlathem, E., and Deltour, R., Physica C 173 (1991) p. 361.CrossRefGoogle Scholar
41.Robertson, I.M. and Wayman, C.M., Philos. Mag. A 48 (1983) p. 421.CrossRefGoogle Scholar
42.van Tendeloo, G. and Amelinckx, S., J. Elect. Micros. Tech. 8 (1988) p. 285.CrossRefGoogle Scholar
43.Moodenbaugh, A.R., Yang, C.Y., Zhu, Y., Sabatini, R.L., Fischer, D.A., Xu, Y., and Suenaga, M., Phys. Rev. B (1991) (to be published).Google Scholar
44.Bordet, P., Hodeau, J.H., Strobel, P., Marezio, M., and Santoro, A., Solid State Comm. 66 (1988) p. 435.CrossRefGoogle Scholar
45.Banngärtel, G. and Bennemann, K.H., Phys. Rev. B 40 (1989) p. 6711.CrossRefGoogle Scholar
46.Yang, C.Y., Heald, S.M., Tranquada, J.M., Xu, Y., Wang, Y.L., Moodenbaugh, A.R., Welch, D.O., and Suenaga, M., Phys. Rev. B 39 (1989) p. 6681; C.Y. Yang, A.R. Moodenbaugh, Y.L. Wang, Y. Xu, S.M. Heald, D.O. Welch, and M. Suenaga, Phys. Rev.B 42 (1990) p. 2231.CrossRefGoogle Scholar
47.Dunlap, B.D., Jorgensen, J.D., Segre, C., Dwight, A.E., Matykiewicz, J.L., Lee, H., Peng, W., and Kimball, C.W., Physica C 158 (1989) p. 397.CrossRefGoogle Scholar
48.Jiang, X., Wochner, P., Moss, S.C., Zxchack, P. (preprint).Google Scholar
49.Cai, Z. (unpublished).Google Scholar
50.Semenovskaya, S. and Khachaturyan, A.G. (preprint).Google Scholar
51.Chen, C.H., Werder, D.J., Schneemeyer, L.F., Gallagher, P.K., Waszczak, J.V., Phys. Rev. B 38 (1988) p. 2888.CrossRefGoogle Scholar
52.Zhu, Y., Moodenbaugh, A.R., Suenaga, M., and Tafto, J., Physica C 167 (1990) p. 363.CrossRefGoogle Scholar
53.de Fontaine, D., Ceder, G., and Asta, M., Nature 343 (1990) p. 544.CrossRefGoogle Scholar
54.Khachaturyan, A.G. and Morris, J.W. Jr., Phys. Rev. Lett. 61 (1988) p. 215.CrossRefGoogle Scholar
55.Werder, D.J., Chen, C.H., Cava, R.J., and Batlogg, B., Phys. Rev. B 38 (1988) p. 5130.CrossRefGoogle Scholar
56.Tetenbaum, M., Tani, B., Czech, B., and Blander, M., Physica C 158 (1989) p. 371.Google Scholar
57.Yi, Z., Ashworth, S., Beduz, C., and Sourlock, R.G., IEEE Trans. Magn. MAG27 (1990) p. 1506.Google Scholar
58.Orehotsky, J., Wiesmann, H., Moodenbaugh, A.R., Suenaga, M., Wang, H.G., and Herman, H., IEEE Trans. Magn. MAG27 (1990) p. 914.Google Scholar
59.Babcock, S.E., Cai, X.Y., Kaiser, D.L., and Larbalestier, D.C., Nature 347 (1990) p. 167.CrossRefGoogle Scholar
60.Smith, D.A., Chisholm, M.F., and Clabes, J., Appl. Phys. Lett. 53 (1988) p. 2344.CrossRefGoogle Scholar
61.Chan, S.W., Hwang, D.M., Ramesh, R., Sampere, S.M., Nazar, L., Gerhardt, R., and Pruna, P., in AIP Conf. Proc. No. 200: High Temp. Supercond. Thin Films, edited by Stockbaur, R. (Am. Inst. Phys., New York, 1990) p. 172.CrossRefGoogle Scholar
62.Shin, D.H., Silcox, J., Russek, S.E., Lathrop, D.K., Moeckly, B., and Buhrman, R.A., Appl. Phys. Lett. 57 (1990) p. 508.CrossRefGoogle Scholar
63.Babcock, S.E. and Larbalestier, D.C., J. Mater. Res. 5 (1990) p. 919.CrossRefGoogle Scholar
64.Singh, A., Chandrasekhar, N., and King, A.H., Acta. Crystl. B46 (1990) p. 117.CrossRefGoogle Scholar
65.Grimmer, H. and Warrington, D.H., Acta. Crystl. A43 (1987) p. 232.CrossRefGoogle Scholar
66.Zhu, Y., Zhang, H., Wang, H.G., and Suenaga, M., J. Mater. Res. 6, 12 (1991) p. 1.CrossRefGoogle Scholar
67.Chisholm, M.F. and Smith, D.A., Philos. Mag. A59 (1989) p. 181.CrossRefGoogle Scholar
68.Gao, Y., Bai, G., Lam, D.J., and Merkle, K.L., Physica C 173 (1991) p. 487.CrossRefGoogle Scholar
69.Kroeger, D.M., Choudhury, A., Brynestad, J., Williams, R.K., Padgest, R.A., and Coghlan, W.A., J. Appl. Phys. 64 (1988) p. 331.CrossRefGoogle Scholar
70.Babcock, S.E. and Larbalestier, D.C., Appl. Phys. Lett. 55 (1989) p. 393.CrossRefGoogle Scholar