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Atomic resolution electron tomography

Published online by Cambridge University Press:  07 July 2016

Sara Bals ,
Bart Goris ,
Annick De Backer ,
Sandra Van Aert  and
Gustaaf Van Tendeloo
Sara Bals
Affiliation:
Electron Microscopy for Materials Research Laboratory, University of Antwerp, Belgium; [email protected]
Bart Goris
Affiliation:
Electron Microscopy for Materials Research Laboratory, University of Antwerp, Belgium; [email protected]
Annick De Backer
Affiliation:
Electron Microscopy for Materials Research Laboratory, University of Antwerp, Belgium; [email protected]
Sandra Van Aert
Affiliation:
Electron Microscopy for Materials Research Laboratory, University of Antwerp, Belgium; [email protected]
Gustaaf Van Tendeloo
Affiliation:
Electron Microscopy for Materials Research Laboratory, University of Antwerp, Belgium; [email protected]
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Abstract

Over the last two decades, three-dimensional (3D) imaging by transmission electron microscopy or “electron tomography” has evolved into a powerful tool to investigate a variety of nanomaterials in different fields, such as life sciences, chemistry, solid-state physics, and materials science. Most of these results were obtained with nanometer-scale resolution, but different approaches have recently pushed the resolution to the atomic level. Such information is a prerequisite to understand the specific relationship between the atomic structure and the physicochemical properties of (nano)materials. We provide an overview of the latest progress in the field of atomic-resolution electron tomography. Different imaging and reconstruction approaches are presented, and state-of-the-art results are discussed. This article demonstrates the power and importance of electron tomography with atomic-scale resolution.

Keywords

transmission electron microscopy (TEM)nanostructurecrystallographic structuredefects
Type
Research Article
Information
MRS Bulletin , Volume 41 , Issue 7: Advanced Tomography Techniques for Materials Applications , July 2016 , pp. 525 - 530
Copyright
Copyright © Materials Research Society 2016 

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