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Applications of Electron Microscopy in Collaborative Industrial Research

Published online by Cambridge University Press:  29 November 2013

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The transmission electron microscope (TEM) is one of the most useful tools available to the materials scientist. Yet both the complexity and expense of the equipment, and the huge investment in time necessary to become proficient in specimen preparation and image acquisition and analysis, mean that it is difficult for most industrial institutions to maintain a state-of-the-art TEM facility. How can industry overcome this problem? One solution is to set up a collaboration with a university, an industrial partner, or a government research laboratory. Such collaborations can be extremely valuable to the company, which gains access to microscopes, specimen-preparation equipment and the expertise of professional microscopists, and to the research laboratory, which benefits from the industrial perspective and the private sector's proficiency in materials preparation and processing.

Such collaborations exist, and they can produce excellent results. In this article, we present three case studies in which successful collaboration has occurred between industry and one of the Department of Energy's scientific user facilities, the National Center for Electron Microscopy (NCEM-see sidebar). Our aim is not only to describe results that we hope will be of scientific interest but also to encourage industrial researchers to consider collaborations with institutes such as NCEM.

Type
Applications of Intermetallic Compounds
Copyright
Copyright © Materials Research Society 1996

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References

1.Binasch, G., Grimberg, P., Saurenbach, F., and Zinn, W., Phys. Rev. B 39 (1989) p. 4828.CrossRefGoogle Scholar
2.Baibich, M.N., Broto, J.M., Fert, A., Van Dau, F. Nguyen, Petroff, F., Etienne, P., Creuzet, G., Friederich, A., and Chazelas, J., Phys. Rev. Lett. 61 (1988) p. 2472.CrossRefGoogle Scholar
3.Parkin, S.S.P., Fan, S., More, N., and Roche, K.P., Phys. Rev. Lett. 64 (1990) p. 2304.CrossRefGoogle Scholar
4.Parkin, S.S.P., Phys. Rev. Lett. 67 (1991) p. 3598.CrossRefGoogle Scholar
5.Parkin, S.S.P., Farrow, R.F.C., Marks, R.F., Cebollada, A., Harp, G.R., and Savoy, R.J., Phys. Rev. Lett. 72 (1994) p. 3718.CrossRefGoogle Scholar
6.Thangaraj, N., Krishnan, K.M., Farrow, R.F.C., Marks, R.F., Cebollada, A., Parkin, S.S.P., presented at the International Colloquium on Magnetic Films and Surfaces, Dusseldorf, September 1994.Google Scholar
7.Thangaraj, N., Krishnan, K.M., and Farrow, R.F.C., Scripta Met. et Mater. 33 (1995) p. 1667.CrossRefGoogle Scholar
8.Aurivillius, B., Ark. Kemi 1 (54) (1949) p. 463.Google Scholar
9.Aurivillius, B., Ark. Kemi 1 (58) (1950) p. 499.Google Scholar
10.Aurivillius, B., Ark. Kemi 2 (37) (1950) p. 519.Google Scholar
11.Smolenskii, G.A., Isupov, V.A., and Agranovskaya, A.J., Fiz. Tverdogo Tela 1 (1959) p. 169 [translation: Sov. Phys. Solid State 1 (1959) p. 149].Google Scholar
12.Subbarao, E.C., J. Phys. Chem. Solids 23 (1962) p. 665.CrossRefGoogle Scholar
13.Brinker, C.J. and Scherer, G.W., Sol-gel Science: The Physics and Chemistry of Sol-Gel Processing (Academic Press, Inc., 1990).Google Scholar
14.McMillan, L.D., Huffman, M., Roberts, T.L., Scott, M.C., and De Araujo, C.A. Paz, Integr. Ferroel. 4 (1994) p. 319.CrossRefGoogle Scholar
15.Nakamura, S., Mukai, T., and Senoh, M., Appl. Phys. Lett. 64 (1994) p. 1687.CrossRefGoogle Scholar
16.Ponce, F.A., Major, J.S. Jr., Piano, W.E., and Welch, D.F., Appl. Phys. Lett. 65 (1994) p. 2302.CrossRefGoogle Scholar
17.Amano, H., Sawaki, N., Akasaki, I., and Toyoda, Y., Appl. Phys. Lett. 48 (1986) p. 353.CrossRefGoogle Scholar
18.Lester, S.D., Ponce, F.A., Craford, M.G., and Steigerwald, D.A., Appl. Phys. Lett. 66 (1995) p. 1249.CrossRefGoogle Scholar
19.Ponce, F.A., Northrup, J.E., Major, J.S. Jr., Piano, W.E., and Welch, D.F., unpublished manuscript.Google Scholar
20.Ponce, F.A., Fertitta, K.G., Holmes, A.L., Ciuba, F.J., and Dupuis, R.D., unpublished manuscript.Google Scholar
21.Ponce, F.A., Krusor, B.S., Major, J.S. Jr., Piano, W.E., and Welch, D.F., Appl. Phys. Lett. 67 (1995) p. 410.CrossRefGoogle Scholar
22.Ponce, F.A., van de Walle, C.G., and Northrup, J.E., Phys. Rev. B in press.Google Scholar